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X pert pro

Manufactured by Philips
Sourced in Netherlands, United Kingdom, United States, Japan, Germany

The X'Pert Pro is a versatile laboratory equipment designed for X-ray diffraction analysis. It provides accurate and reliable data on the structural properties of various materials, including crystalline solids, powders, and thin films. The core function of the X'Pert Pro is to perform X-ray diffraction measurements and provide detailed information about the atomic and molecular structure of the analyzed samples.

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160 protocols using x pert pro

1

Characterization of Biogenic ZnO Nanoparticles

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The crystalline nature of the ZnO-NPs synthesized by cyanobacterium species was detected by X-ray diffraction (XRD, X’Pert Pro Philips, Dandong, China) at the following operation system: CuKα radiation, the 2θ angle was in a range from 0° to 90°, λ = 1.540 Å (Eindhoven, Netherlands). The voltage and current were adjusted to 40 kV and 30 mA, respectively. The average nanoparticle size was calculated using the following the Debye–Scherrer Equation (1) [32 (link)], shown below: D = 0.9λ/βCosθ     
where D is the average nanoparticle size and 0.9 is the Scherrer’s constant. λ, β, and θ are the X-ray wavelength, Full-Width Half Maximum, and the Bragg’s angle, respectively.
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2

Multimodal Nanomaterial Characterization

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Fourier transform infrared (FT-IR) spectroscopy was conducted using KBr pellets using Thermo scientific SMART OMNI TRANSMISSIO Nicolt- Is10. The spectra were collected over a range of 400–4000 cm−1. Ultra violet and visible spectrophotometry, Shimadzu 160 spectrometer, has been used using absorption wavelengths to show the type of graft in the studied species and the measurements were taken within the wavelength range of 190–790 nm. Czechia scanning electron microscope was used to examine the SiW9Ba@SrFe12O19@CS nanoparticles to obtain FE-SEM images. Additionally, elemental mapping analysis was performed to visualize the distribution of different elements within the samples. X-ray diffraction (XRD) was used to study the crystallinity of prepared nanomaterials, with Cu Kα radiation (λ = 1.5406 Å) for powder XRD, using X'Pert pro Philips. Using a andelin Sonorex Digitec frequency 35 kHz mains connection 230 V Ultrasonic, the solution becomes homogenous, and also by creating strong pressure waves in a liquid environment, it causes flow in the liquid and under suitable conditions causes cavitation phenomenon. The bursting of the bubbles produces a shock wave with enough energy to break the covalent bond.
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3

Characterization of Synthesized Nanomaterials

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In this study, an FT-IR spectrometer (Equinox 55, Germany) was employed to identify the functional groups of the synthesized nanomaterial samples. The samples were mixed with KBr at the ratio of 1:20 to fabricate pellets for recording the FTIR spectra. An SEM (Vega3 Tescan, Czech Republic, 15 kV) was also used to view the structure and the quality of the samples. To prepare the samples for this analysis, they were coated with a 15-nm layer of Au. The crystal structure of the nanostructures was studied by means of an X-ray diffractometer with CuKα radiation (X'PertPro, Philips X’Pert, the Netherlands, λ = 1.5418 Å). Finally, the purity of the samples was determined with an EDX spectroscope (TESCAN XMU VEGA, Czech Republic).
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4

X-ray Diffraction Analysis of Inorganic Fillers

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XRD analysis was performed to observe the crystal structure of each reinforcement group. X-ray diffraction patterns of inorganic filler powders were determined at a voltage of 40 kV using Cu-Kα radiation (λ = 1.54 Å). Intensities were recorded in a range of 5-60°(2θ) with a scanning rate of 0.139°/s (Philips X'PertPro).
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5

Characterization of Adsorbent Composites

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Fourier transform infrared spectroscopy (FTIR) of calcined and uncalcined adsorbent composites was recorded at 4000 and 400 cm−1 wavenumber (IR Prestige-21, Japan). Scanning electron micrograph (SEM) (Hitachi S-3000N, Japan) was used to analyze the morphological structures of Fe3O4-HBC composite before and after calcination at different temperatures and environments. X-ray diffraction (XRD) analysis (X'Pert PRO analytical B.V., Netherlands) of the adsorbent composites was performed. In order to investigate the phase transformation of the adsorbent composite (Fe3O4-HBC-1000°C(N2)) in situ high temperature-X-ray diffraction (HT-XRD) (PANalytical, X'Pert PRO, Philips, Almelo, Netherlands) was performed at the heating rate of 10°C min−1 under nitrogen environment and HT-XRD data were taken after heating at 1000°C. Brunauer–Emmett–Teller (BET) surface area of the samples was measured using BET surface analyzer (ASAP 2050, Micrometrics, Beijing, China).
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6

Phase and Microstructure Analysis of Zr-Ru Alloys

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X-ray diffractometer (XRD, Philips X′Pert Pro, Holland) with a Ni filtered Cu Kα radiation was employed to analyze the phase constitution of the experimental Zr–Ru alloys.
The microstructure of these alloys was examined using an optical microscopy (OM, BX51M Olympus, Japan). The specimens were mechanically polished via a standard metallographic procedure and then etched in a solution of HF, HNO3 and H2O, with the volume ratio of 10%: 45%: 45%, respectively.
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7

Comprehensive Characterization of Nd2Se3 Nanoparticles

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The confirmation of synthesis was ascertained utilizing UV-Vis spectrophotometer from Shimadzu (UV-1601 PC). Fluorescence was performed by exciting the samples at 330 nm, and the emission spectra were logged from 400 to 700 nm using a spectrofluorometer, FLS920, Edinburgh Instruments, UK at a scan rate of 300 nm/min. X-ray diffraction (XRD) patterns were logged in the 2θ range of 20°–80° with a step size of 0.02° and 5 s per step using a Philips X’PERT PRO armed with X’celerator, a rapid solid-state detector with iron-filtered Cu Kα radiation (λ = 1.5406 Å) as the source. The Nd2Se3 NP suspension coated onto carbon coated copper grids was subjected to TEM analysis using an FEI Tecnai 30 TEM operated at 300 kV. The FTIR spectroscopy of bioengineered Nd2Se3 NP was performed in KBr pellets using a Perkin-Elmer Spectrum One instrument. The spectrometer was operated in the diffuse reflectance mode at a resolution of 2 cm−1. To obtain good signal to noise ratio, 128 scans of the film were taken in the range of 450–4000 cm−1. The dried powder of bioengineered Nd2Se3 NPs was used for thermogravimetric analysis on a Q5000V 2.4 Build 223 instrument by applying a scan rate of 10 °C min−1 [26 (link)].
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8

Nanoscale Structural Characterization of Materials

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The X-ray diffraction (XRD) patterns were recorded using a Cu Kα radiation (1.5406 Å) M/S Philips X'Pert Pro instrument in the 2θ range of 5–60°. High-resolution transmission electron microscopy (HRTEM) images were captured at an acceleration voltage of 200 kV on a JEOL, JEM-2100F electron microscope from the Inter-University Accelerator Centre (IUAC), New Delhi. The samples for HRTEM characterization were prepared by drop casting the material onto a carbon-coated copper grid followed by drying for more than 8 h at room temperature. Scanning Tunneling Microscopy (STM) images were obtained using a multi-mode probe microscopy system with Nanoscope IIIa controller from IUAC, New Delhi.
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9

Characterization of Sintered Ceramic Scaffolds

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The green samples had plate shapes (2.0 × 1.0 × 0.3 cm). The apparent density of sintered ceramic samples was determined from measurement of the dimensions and mass of the samples. The theoretical density of HAP was 3.15 g·cm−3. The phase composition of samples was analysed by X-ray diffraction analysis (XRD, Philips X PertPro). The microstructure of the scaffolds was observed using scanning electron microscopy (SEM, (JEOL FE SEM JSM-7000F). The compressive strength of the ceramic samples was measured by a LR5K Plus (Lloyd Instruments, Ltd., Bognor Regis, UK) at the loading rate of 1 mm/min−1.
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10

Characterization of Phyto-synthesized Selenium Nanoparticles

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The phase structure of the Phyto-synthesized Se-NPs was detected by XRD using a 0.5 mm glass capillary tube in the two-theta range of 10–70°. The analysis was achieved by X’ Pert Pro (Philips, Eindhoven, the Netherlands) connected with Cu, which serves as an X-ray source. The radiation (Cu Kα) was produced at λ = 1.54 Å by adjusting the operating system at 40 kV and 30 mA.
The Debye–Scherrer equation was used to calculate the average crystal size as follows [1 (link)]: La=Kλ/βcosθ
where La is the average crystal size, K is the constant and equal to 0.9, λ is the wavelength of the radiation source (λ = 1.54 Å), and β is the full width at a half maximum in 2θ value.
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