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16 protocols using uv vis nir spectrometer

1

Colorimetric Detection of H2O2 using CNDs

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Different concentrations of CNDs were reacted with different concentrations of H2O2. Ultraviolet−visible−near-infrared (UV−vis−NIR) absorption spectra of the solutions were obtained using a UV−vis−NIR spectrometer (Shimadzu, Japan). TMB was added to different solutions (CNDs, H2O2, CNDs + H2O2) and the UV−vis−NIR absorption spectra of the solutions were measured at 650 nm.
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2

Comprehensive Material Characterization Techniques

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TEM and EDS were analyzed for microstructure and composition on the JEM-2100F electron microscope operated at 200 kV. STEM and element mapping scanning were obtained on field-emission Magellan 400 microscope under the FEI Company. XRD pattern was recorded on a Rigaku D/MAX-2200 PC XRD system. XPS spectrum was recorded on ESCAlab250 (Thermal Scientific). DLS and Zeta potential were tested on Zetasizer Nanoseries (Nano ZS90, Malvern Instrument Ltd.). AFM images were collected on the Veeco DI Nanoscope Multi Mode V system. UV-vis-NIR absorption spectra were recorded on UV-3101 Shimadzu UV-vis-NIR spectrometer. FTIR pattern was recorded for the analysis of chemical bonds. The quantitative analysis of Fe element was conducted on inductively coupled plasma-optical emission spectrometry (ICP-OES, Agilent 725, Agilent Technologies). Raman spectroscopy pattern was collected on a DXR Raman microscope (Thermal Scientific, USA). ESR spectrum was measured using DMPO as the nitrogen trapping agent by Bruker EMX1598 spectrometer.
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3

Photosensitizer Characterization and ROS Detection

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DSPE‐mPEG2000 was purchased from Shanghai Yare Co. Ltd. ROS probes, TEMPO, DMPO, SOSG, and DCFH‐DA, were purchased from Adamas‐Beta. Hypoxia probe ROS‐ID was purchased from Enzo Life Sciences Co. Ltd. (USA). All other chemical agents were purchased from Shanghai Titan Scientific Co. Ltd. Nuclear Magnetic Resonance (NMR) spectra were measured utilizing JEOL ECZ‐400 spectrometer (400 MHz) and Bruker Ultra Shield Plus (400 MHz). Mass spectroscopy of photosensitizers was measured using MALDI‐TOF mass instruments. The diameter of nanoparticles was characterized by a dynamic light scattering particle size analyzer (NanoPlus, Micromeritics Instrument Co. Ltd.). UV–vis absorption was measured by a UV‐3600 Shimadzu UV–vis–NIR spectrometer. Fluorescence spectra were tested with a Thermo Fisher fluorophotometer, and the fluorescence decay was obtained on Edinburgh FLS 1000 instrument. Confocal fluorescence imaging was carried out employing Olympus IX 70 imaging systems. In vivo fluorescence images of tumor‐bearing mice were conducted by using Fluor Vivo 2000 INDEC imaging system.
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4

UV-Vis Absorption Spectra of Complexes

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Electronic absorption spectra of the complexes were collected using a UV-3600 Shimadzu UV-Vis-NIR spectrometer as methylene chloride solutions.
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5

Characterization of Organic Semiconductors

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1H and 13C NMR spectra were recorded in CDCl3 with a 400 MHz Bruker Advance III spectrometer. UV–vis–NIR absorption spectra were recorded on a UV‐1601 Shimadzu UV–vis–NIR spectrometer. The small molecular films were spin‐coated on glass substrates from chlorobenzene/chloroform = 7/3 v/v solution (3 mg mL−1) under ambient conditions. TGA was carried out on a Thermogravimetric Analyzer from Nicolet 6700 at a rate of 10 °C min−1 under a nitrogen atmosphere. DSC experiments were carried out with a Netzsch DSC‐204 F1 instrument at a heating rate of 10 °C min−1 under nitrogen. Mass spectra were recorded on an AB Sciex‐5800 MALDI‐TOF mass spectrometer and a Bruker Solarix XR mass spectrometer. CV was performed on a standard commercial electrochemical analyzer (Shanghai Chenhua Instrument co. LTD., CHI520E) with a three‐electrode system consisting of a cylindrical platinum working electrode, platinum wire counter electrode, and Ag/AgCl reference electrode. The potential of the Ag/AgCl reference electrode was internally calibrated against ferrocene. 0.1 m tetrabutylammonium hexafluorophosphate (TBAPF6) in deoxygenated dichloromethane was used as the supporting electrolyte.
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6

Characterizing Solar Cell Performance

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Current–voltage characteristics
of the solar cells and the single carrier devices are taken as previously
described.36 (link) For the UV-degradation measurement,
the cells are continuously exposed to light in an inert atmosphere
(with <0.1 ppm H2O and <0.1 ppm O2) for
2 h while being kept at ∼295 K by active cooling. In contrast,
for light intensity dependence measurement, the cells kept at ∼295
K are exposed to light calibrated with a long-pass filter to 1 sun
for 2 h, and the JV sweeps
are recorded with varying light intensity using a set of neutral density
filters coupled with the long-pass filter. The absorption measurements
are performed on the films in the wavelength range of 300–900
nm with a UV-3600 Shimadzu UV–vis–NIR spectrometer against
a glass substrate as a reference.
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7

Characterization of Organic Solar Cells

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J-V characteristics of the solar cells and the single carrier devices and UV-Vis Absorption measurements are taken as previously described32 (link). The light source for the efficiency and degradation measurement is a SolarConstant 1200 Steuernaugel metal halide lamp calibrated to 1 sun intensity and corrected for the spectral mismatch with the AM1.5 G spectrum using a Si reference cell. Blend films on glass or diluted solutions of the BDT monomers of E and ET in CDCl3 at very low concentration were prepared in an inert atmosphere in a glovebox in sealed cuvettes (0.7 ml in volume) for the absorption measurements. Additionally, diluted solutions of the BDT monomers of E and ET in CDCl3 at very low concentration are also prepared in an inert atmosphere in a glovebox, namely, two times 2.1 ml (in 95.2:4.8 v/v ratio of CDCl3:DIO) and 2 ml without DIO in air-tight/sealed NMR tubes for the NMR measurements. To complete the NMR measurements, 2.1 ml diluted solutions of DIO-only and ODT-only in CDCl3 (95.2:4.8 v/v ratio of CDCl3:DIO/ODT) are prepared under the same condition. Finally, absorption measurements were performed similarly to that of the films in a UV-3600 Shimadzu UV-Vis-NIR spectrometer against a cuvette of CDCl3 as a reference.
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8

Kaempferol Radical Scavenging Activity

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An ABTS (2,2′-azino-bis(3-ethylbenzothiazoline-6-sulphonic acid) assay was used to evaluate the radical scavenging activity of kaempferol or Cu-kaempferol complexes. A solution of the ABTS radical cation was prepared by dissolving 17.2 mg of ABTS and 3.3 mg of K2S2O8 in 5 mL of deionized water and leaving this in dark for 24 h to ensure full oxidation of the ABTS salt. A stock solution of the ABTS radical cation was prepared by diluting 1 mL of the oxidized solution with 60 mL of deionized water. 1 mM solutions of both kaempferol and CuCl2 were prepared in DMSO. The time decay of the ABTS•+ signal at 734 nm in the presence of kaempferol or its Cu complexes (Cu–kaempferol = 1:1 and 1:2) was monitored during 900 s, using a UV Vis NIR spectrometer (Shimadzu), until a steady state level of the absorbance signal was achieved [55 (link)].
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9

Surface Characterization of Functional Thin Films

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An optical contact angle (CA) meter (JGW‐360A, China) was used to measure the CA of the surface. A scanning electron microscope (SEM, Hitachi SU8010, Japan) and an energy dispersive spectrometer (EDS, Hitachi SU8010, Japan) were used to study the micro structures of the etched surface and the chemical composition of the prepared samples, respectively. The thickness of the functional thin film of these samples was measured by the coating thickness gauge (Fisher MPO, Bad Salzuflen, Germany). The solar and IR reflectivity R(λ) were measured using the UV–Vis–NIR Spectrometer (SHIMADZU, Kyoto, Japan) and Fourier transform infrared spectrometer (FT‐IR, Frontier, PerkinElmer LLC), respectively. The thermal images were taken by an infrared thermal imaging camera (FLIR A615).
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10

Characterization of Nanomaterial Morphology

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A field-emission scanning electron microscope (FE-SEM), model JSM-7000F, manufactured by Jeol Ltd. (Akishima, Japan), was used for morphological analysis of the particles. UV/Vis absorption spectra were recorded using a Shimadzu (Kyoto, Japan) UV/Vis/NIR spectrometer with an integrated sphere (model UV-3600). The crystal structure of the samples was determined at room temperature using X-ray diffraction (XRD) on an Italstructures X-ray powder diffractometer (APD 2000, Cu-Kα radiation, graphite monochromator, scintillation detector).
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