Uv vis nir spectrometer
The UV–vis–NIR spectrometer is a laboratory instrument designed to measure the absorption, transmission, or reflectance of light in the ultraviolet, visible, and near-infrared regions of the electromagnetic spectrum. It provides quantitative analysis of samples by determining the concentration of specific compounds within a solution or the identity of unknown substances.
Lab products found in correlation
16 protocols using uv vis nir spectrometer
Colorimetric Detection of H2O2 using CNDs
Comprehensive Material Characterization Techniques
Photosensitizer Characterization and ROS Detection
UV-Vis Absorption Spectra of Complexes
Characterization of Organic Semiconductors
1H and 13C NMR spectra were recorded in CDCl3 with a 400 MHz Bruker Advance III spectrometer. UV–vis–NIR absorption spectra were recorded on a UV‐1601 Shimadzu UV–vis–NIR spectrometer. The small molecular films were spin‐coated on glass substrates from chlorobenzene/chloroform = 7/3 v/v solution (3 mg mL−1) under ambient conditions. TGA was carried out on a Thermogravimetric Analyzer from Nicolet 6700 at a rate of 10 °C min−1 under a nitrogen atmosphere. DSC experiments were carried out with a Netzsch DSC‐204 F1 instrument at a heating rate of 10 °C min−1 under nitrogen. Mass spectra were recorded on an AB Sciex‐5800 MALDI‐TOF mass spectrometer and a Bruker Solarix XR mass spectrometer. CV was performed on a standard commercial electrochemical analyzer (Shanghai Chenhua Instrument co. LTD., CHI520E) with a three‐electrode system consisting of a cylindrical platinum working electrode, platinum wire counter electrode, and Ag/AgCl reference electrode. The potential of the Ag/AgCl reference electrode was internally calibrated against ferrocene. 0.1
Characterizing Solar Cell Performance
of the solar cells and the single carrier devices are taken as previously
described.36 (link) For the UV-degradation measurement,
the cells are continuously exposed to light in an inert atmosphere
(with <0.1 ppm H2O and <0.1 ppm O2) for
2 h while being kept at ∼295 K by active cooling. In contrast,
for light intensity dependence measurement, the cells kept at ∼295
K are exposed to light calibrated with a long-pass filter to 1 sun
for 2 h, and the J–V sweeps
are recorded with varying light intensity using a set of neutral density
filters coupled with the long-pass filter. The absorption measurements
are performed on the films in the wavelength range of 300–900
nm with a UV-3600 Shimadzu UV–vis–NIR spectrometer against
a glass substrate as a reference.
Characterization of Organic Solar Cells
Kaempferol Radical Scavenging Activity
Surface Characterization of Functional Thin Films
Characterization of Nanomaterial Morphology
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