400 mr dd2 nmr spectrometer

¹H-NMR spectra were collected on an Agilent 400-MR DD2 NMR spectrometer. Chemical shifts were reported in ppm using tetramethylsilane as an internal standard. HPLC/ESI-MS analysis of the purified compound was carried out on a Thermo Electron LTQ-Orbitrap XL mass spectrometer connected to an Agilent HP 1100 HPLC system. All solvents used were of analytical grade purchased from J. T. Baker.

All reagents were purchased from commercial sources and used without further purification. PXRD data (2θ angle) were recorded using a Bruker D2 Phaser automated diffractometer at room temperature with a step size of 0.02°. ¹H NMR spectra were obtained using an Agilent 400-MR DD2 NMR spectrometer operating at 400 MHz for ¹H. Raman mapping was performed with a WITec alpha300 R Confocal Raman microscope equipped with a 532 nm laser and a 600 g/mm grating. Data analysis was conducted using WITec Project 2.10. Cold field-emission SEM (Cold FE-SEM) was performed using a Hitachi SU-8220 at an accelerating voltage of 15 kV. EDS elemental mapping images were captured using an Octane Elect EDS system (Ametek EDAX) to confirm the distribution of metallic elements. MOF crystals were epoxy-fixed at 70 °C overnight and cut with an EM UC7 ultramicrotome (Leica) prior to the SEM and EDS analyses.