S 3400n scanning microscope
The S-3400N is a scanning electron microscope (SEM) produced by Hitachi. It is designed to provide high-resolution imaging and analysis of a wide range of materials and samples. The S-3400N utilizes an electron beam to scan the surface of a sample, generating detailed images that reveal the microstructure and surface features of the specimen.
Lab products found in correlation
3 protocols using s 3400n scanning microscope
Cassava Starch Granule Morphology
Vascular Patch Surface Coating
Quantitative Microstructural Analysis of Porous Samples
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