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Leo 1550 gemini

Manufactured by Zeiss
Sourced in Germany

The LEO 1550 Gemini is a high-performance scanning electron microscope (SEM) designed for a wide range of applications. It features a field emission gun (FEG) source, which provides high-resolution imaging capabilities. The microscope is equipped with advanced electron optics and a large specimen chamber, enabling the observation and analysis of a variety of sample types.

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11 protocols using leo 1550 gemini

1

Microstructural Evaluation of Iron Nanopowder Compacts

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High-resolution scanning electron microscopy (SEM) was performed using an LEO Gemini 1550 electron microscope (Carl Zeiss-LEO, equipped with a field emission gun: FEG-SEM) to evaluate the change in microstructure between the sintered compacts containing iron nanopowder and those containing carbon-coated iron nanopowder.
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2

Microscopic Analysis of Surface Morphology

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The morphology at the surface was investigated by SEM by using a Zeiss Leo Gemini 1550 microscope, and the atomic distribution of C, O, and N was mapped by using energy‐dispersive X‐ray spectroscopy (EDX, X‐Max, Oxford instruments).
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3

Janus Particle Characterization Techniques

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Janus particles and complex
emulsion shapes and sizes were monitored using an optical microscope
(Leica DVM digital microscope) and an inverted microscope (Bresser
IVM 401) with the emulsions and particles dispersed in an Invitrogen
Attofluor Cell Chamber (Thermo Fisher Scientific). Horizontal imaging
was performed using a customized side-view microscopy setup with variable
zoom, composed of two tube 200 mm tube lenses, a HIKVision area scan
CCD camera, and an Olympus planar optical microscopy lenses, utilizing
100 and 200 μm cuvettes (Hellma Analytics), as well as generic
cavity slides. For particle interfacial contact angle and Janus ratio
determination, particles were dispersed in a 1 wt % solution of Pluronic
F-127 prior to imaging on the side-view optical microscope. Scanning
electron microscopy (SEM, 3 kV) was undertaken on a Zeiss Leo Gemini
1550 instrument. Confocal microscopy was performed on a Leica (Leica
SP8). Average particle diameters of small (∼1 μm) particles
were determined using dynamic light scattering (DLS; Malvern Panalytica
Zetasizer Nano).
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4

Characterization of Hemoglobin Microparticles

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For the SEM analysis, one drop of the sample was applied to a glass slide, dried overnight, and sputtered with gold. A Gemini Leo 1550 (Carl Zeiss AG, Oberkochen, Germany) instrument was utilized for the measurements at an operation voltage of 10 kV.
The particle size was measured by DLS applying a Zetasizer Nano ZS instrument (Malvern Panalytical Ltd., Malvern, U.K.). Additionally, CLSM images were taken with a LSM 510 Meta (Carl Zeiss AG, Oberkochen, Germany) confocal microscope and the size was measured from the images. The microscope was used with a 100× oil-immersion objective (numerical aperture 1.3) while utilizing an excitation wavelength of 488 nm and a 505 nm long-pass emission filter.
The zeta potential of HbMP in 0.9% NaCl (pH 7.4, conductivity 17.2 ± 0.9 mS/cm) was measured using the Zetasizer Nano ZS instrument.
For the determination of the concentration of free hemoglobin in the HbMP suspension, aliquots of three batches of HbMP, produced with 0.02% GA were stored at 2–8 °C for up to six months. Every month an aliquot was taken and centrifuged at 20 000g for 30 min (Hettich Mikro 22R, Hettich GmbH & Co. KG, Tuttlingen, Germany). The hemoglobin released in the supernatant was measured with a standard alkaline haematin detergent (AHD) [66 (link)].
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5

Multimodal Microscopy of Biogenic Carbonates

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A Philips XL30 and a Zeiss Gemini LEO 1550 were used on coated samples. Secondary electron images are indicated as SE-SEM in the legends. A FEI FESEM Quanta F600 and a Phenom Pro X were used for images in back scattered electron mode (BSE-SEM). In this technique, imaging contrast depends on the atomic number of the atoms composing the substrate material: the organic structures appear in black, in contrast to the mineral units with heavier chemical elements (Ca, Sr). The sample does not need to be covered by a conductive layer, so that the same sample can be used for SEM and AFM observations. Fractured shells and polished samples were observed. Samples embedded in resin were polished using various grades of diamond paste down to a final 0.25 mm grade. The polished surfaces were then cleaned with a detergent mixed with hot water for 1 min under ultrasonication to remove any oil residue from the pastes and rinsed with water. Then, according to the technique subsequently employed, additional preparative procedures were undertaken, the details of which are given in the figure captions.
Figure S1 displays the used terminology for the orientation of the sections.
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6

Multimodal Microscopy and Characterization of Particle Clusters

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Assembled, printed, harvested, and dried particle clusters were imaged by bright-field, dark-field, and fluorescence optical microscopy (Zeiss Axioscope) at various magnifications and by SEM (Leo 1550 Gemini, Carl Zeiss AG). ImageJ (W. S. Rasband, National Institutes of Health, Bethesda, MD) was used to compose merged fluorescence images and overlays of fluorescence and bright-field images by combining different channels. EDX characterization was performed using X-max (Oxford Instruments) in a scanning electron microscope (SU8000, Hitachi). The images in Fig. 7D and the corresponding supplementary movies were acquired in Millipore water on an inverted optical microscope (Zeiss Axioscope 2) with a 63× long working distance air objective. Images were grabbed at a frame rate of 10 fps using an Andor Zyla camera mixing the transmission and fluorescence channels. All other supplementary movies were acquired at varying frame rates, as specified in the Supplementary Materials.
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7

Characterizing Coating Morphology and Deposition

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Cross-sectional SEM (LEO 1550 Gemini, Zeiss, Jena, Germany) was performed on coatings deposited on Si(001) in order to assess the morphology as well as coating thickness and thus the deposition rate.
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8

Microstructure Characterization by SEM and AFM

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Microstructure observation was done by using a scanning electron microscope (SEM, LEO 1550 Gemini, Carl Zeiss AG, Oberkochen, Germany) with an accelerating voltage of 5 kV and a commercial atomic force microscope (AFM, BRUKER Dimension FastScan). A standard cantilever with spring constant of 40 N m−1 and tip curvature < 10 nm was used as the probe.
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9

Morphological Analysis of Porcine Cornea and BPCDX

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Morphology of BPCDX and the native porcine cornea was investigated using a Zeiss SEM (LEO 1550 Gemini). PBS-equilibrated samples were washed in water, frozen overnight at −80°C and lyophilized for 12 h. Samples were cut and attached onto metal holders using conductive double-sided tape, and sputter coated with a gold layer for 60 s at 0.1 bar vacuum pressure (Cressington Sputter Coater, 108) before SEM examination. SEM micrographs were taken at various magnifications at 25 kV and 5 kV for porcine cornea and BPCDX samples, respectively.
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10

Structural and Electrochemical Analysis of ZnO Nanorods

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An X-ray diffractometer (Philips PW 1729) with CuKα1 radiation (λ = 1.5406 Å) was used to analyze the crystal structure of ZnO nanorods grown on Ni-foam substrate. Field-emission scanning electron microscopy (FESEM; Zeiss LEO 1550 Gemini) was employed to observe the surface morphology of samples. Elemental analysis was carried out with an energy-dispersive X-ray spectrometer (EDS) attached to the FESEM system. Electrochemical performances of ZnO-NR-based Ni-foam electrodes/substrates were investigated via a three-electrode electrochemical workstation (CHI potentiostat, USA). ZnO-NRs@Ni-foam, platinum plate and Ag/AgCl were used as working electrode, counter electrode, and reference electrode, respectively.
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