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Xl30 field emission sem

Manufactured by Philips

The XL30 Field Emission SEM is a scanning electron microscope designed for high-resolution imaging and analysis of a wide range of materials. It utilizes a field emission electron source to provide a stable, high-brightness electron beam for superior image quality and resolution.

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9 protocols using xl30 field emission sem

1

Optimized SEM Imaging of Blood Clots

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For SEM imaging, blood clot samples were fixed in 2% glutaraldehyde in 1X phosphate buffer saline (PBS) (E.M. Sciences,Inc.), post-fixed for 1 h in 1% osmium tetroxide in PBS buffer, rinsed in buffer, dehydrated through a graded series of ethanols, and dried after three changes of Hexamethyldisilazane (HMDS) (E.M.Sciences,Inc.). Samples were then coated with a 20 nm layer of palladium (Pd) in a plasma sputter coater, and imaged in a Philips XL-30 Field Emission SEM.
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2

Evaluating SEM Printing Resolution

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Scanning electron microscopy (SEM) (Philips XL30 field emission SEM, Amsterdam, The Netherlands) was used to evaluate the printing resolution and the scaffold morphology. Before the analysis, the samples were coated with 95% gold and 5% palladium (Polaron E5000 Sputter Coater, Quorum Technologies, Laughton, UK). The printing resolution was observed by measuring the layer thickness. The printing resolution was set to 0.1 mm.
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3

Characterizing GelMA Hydrogel Microstructures

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To characterise the internal microstructures of the GelMA hydrogels, the crosslinked hydrogel samples were frozen at −80 °C and then lyophilised. The dried samples were frozen at −20 °C and cross-sectioned, then coated with 95% gold and 5% palladium by Polaron E5000 Sputter Coater (Quorum Technologies, Lewes, UK), and images were taken by using a Philips XL30 field emission SEM (Amsterdam, The Netherlands). ImageJ software was used to measure pore size based on scanning electron microscopy (SEM) images.
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4

Scaffold Visualization using SEM

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Scaffolds were washed in deionised water to remove excess salts and mounted on stubs followed by sputter-coating with a carbon coater. All images were obtained using a secondary electron detector in a Philips XL 30 Field Emission SEM, operated at 5 kV with an average working distance of 10 mm.
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5

SEM Imaging of Dehydrated Specimens

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Specimens were fixed in 3% glutaraldehyde and 0.1M cacodylate buffer and stored at 4˚C overnight. Serial ethyl alcohol dehydration was carried out the next day for 10 min at each concentration and the discs were subsequently dried in hexamethyldisilazane and left in the hood for 1 hour. Specimens were then coated with 95% gold and 5% palladium (Polaron E5000 Sputter Coater, Quoram Technologies, Laughton, UK) and SEM (Philips XL30 Field Emission SEM, Amsterdam, Netherlands) was used to visualise the surface of the specimen discs.
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6

SEM Visualization of Cell-Material Interaction

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Visualisation of the cellular morphology and cell interaction with the material surface was observed via SEM microscopy (Philips XL30 Field Emission SEM, Amsterdam, Netherlands). The discs were initially fixed in 3% glutaraldehyde and 0.1 M cacodylate buffer and stored at 4˚C overnight. This was followed by a series of ethyl alcohol dehydration for 10 min with subsequent drying in hexamethyldisilazane. The specimen discs were finally coated with 95% gold and 5% palladium (Polaron E5000 Sputter Coater, Quorum Technologies, Laughton, UK) for visualisation under the SEM microscope.
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7

Qualitative Visualization of Composite Discs

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Qualitative visualisation of the composite discs was carried out with the aid of scanning electron microscopy. To image the composite discs, they were coated with 95% gold and 5% palladium (Polaron E5000 Sputter Coater, Quoram Technologies, Laughton, UK) and SEM (Philips XL30 Field Emission SEM, Amsterdam, Netherlands) was used to visualise the surface of the specimen discs.
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8

Characterization of ECS Nanowires

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The ECS nanowires were evaluated by scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDS), transmission electron microscopy (TEM), respectively. SEM and in-situ EDS measurements were performed utilizing a Philips XL-30 field-emission SEM equipped with an energy-dispersive X-ray detector. To acquire the elemental composition at each point on the sample, the substrate with the sample was fixed on an encoded xy translation stage for locating the position accurately. The high-resolution TEM images were obtained by JEM-2100F TEM with an accelerating voltage of 200 kV. Samples were transferred to a 200-mesh copper grid using optical fiber probes under microscope observation. The samples on the substrate were placed onto the sample holder while a beam focusing on regions of nanowires was 0.5–1.0 mm.
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9

Preparing Samples for SEM Imaging

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Samples for scanning electron microscopy were prepared according to a standard routine protocol, mounted on stubs and sputter-coated with gold -palladium. All images were obtained using a secondary electron detector in a Philips XL 30 Field Emission SEM, operated at 5 kV and average working distance was 10 mm.
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