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Nb5000 fib sem

Manufactured by Hitachi
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The NB5000 FIB-SEM is a focused ion beam scanning electron microscope (FIB-SEM) system designed for high-resolution imaging and precise sample preparation. It combines a Ga ion beam for milling and a scanning electron beam for imaging, allowing users to visualize and modify samples at the nanoscale level.

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Lab products found in correlation

Tecnai t20 tem, by Thermo Fisher Scientific (1 mentions) Mlct d, by Bruker (1 mentions)

2 protocols using nb5000 fib sem

1

TEM Specimen Preparation by FIB-SEM and Ion-Milling

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TEM specimens less than 100 nm-thick were prepared using a Hitachi NB5000 FIB-SEM via a standard in situ lift-out method, which was followed by low-kV argon ion-milling using a Fischione 1040 Nanomill. An FEI Tecnai T20 TEM operated at 200 kV was used for BF-TEM imaging and SAD observations. STEM-EDS spectrum images were acquired using a Hitachi HF3300 TEM-STEM equipped with a Bruker X-Flash silicon drift detector EDS system and operated at 300 kV.
Poplawsky J.D., Guo W., Paudel N., Ng A., More K., Leonard D, & Yan Y. (2016). Structural and compositional dependence of the CdTexSe1−x alloy layer photoactivity in CdTe-based solar cells. Nature Communications, 7, 12537.
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2

Fabrication of Customized AFM Probes

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Standard AFM probe tips (MLCT-D, Bruker) were modified with a FIB scanning electron microscope (SEM) dual-beam system (Hitachi NB5000 FIB-SEM). Individual cantilevers were mounted on the SEM stage with the tips facing upward. The AFM pyramidal tips were then milled into a long cylindrical shape by dual-ion beams (beam 25-1-80). The milling process was monitored under SEM imaging. The process lasts approximately 10 min per probe. The resulting tips were 150 to 250 nm in diameter and 3 to 5 μm in length.
Tsatskis Y., Rosenfeld R., Pearson J.D., Boswell C., Qu Y., Kim K., Fabian L., Mohammad A., Wang X., Robson M.I., Krchma K., Wu J., Gonçalves J., Hodzic D., Wu S., Potter D., Pelletier L., Dunham W.H., Gingras A.C., Sun Y., Meng J., Godt D., Schedl T., Ciruna B., Choi K., Perry J.R., Bremner R., Schirmer E.C., Brill J.A., Jurisicova A, & McNeill H. (2020). The NEMP family supports metazoan fertility and nuclear envelope stiffness. Science Advances, 6(35), eabb4591.
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