Tecnai 20 electron microscope
The Tecnai 20 is a transmission electron microscope (TEM) manufactured by Thermo Fisher Scientific. It is designed for high-resolution imaging and analysis of materials at the nanoscale. The Tecnai 20 operates at an accelerating voltage of 200 kV and offers a range of advanced imaging modes, including bright-field, dark-field, and high-resolution electron microscopy.
Lab products found in correlation
13 protocols using tecnai 20 electron microscope
3D Ultrastructural Analysis of Artemia Ovisacs
Transmission Electron Microscopy of OMVs
Ultrastructural Changes in Ischemic Microvessels
Electron Microscopy Analysis of Viral Capsid Assembly
Characterization of Carbon Nanotubes by TEM
Images were taken using a FEI Tecnai G2 20 transmission electron microscope with a Gatan ultrascan 1000 ccd camera. Acceleration voltage was 80 kV. Sizes of CNTs were measured from the TEM images.
For energy dispersive X-ray spectroscopy (EDX), the specimens were diluted in double distilled water, sonicated, and placed on pioloform-coated nickel grids. Scanning transmission EM (STEM) micrographs were made with an FEI Tecnai 20 electron microscope at 20,000 × magnification and 120 kV acceleration voltage with a high angle annular dark field detector. EDX spectra were made with a Standard SUTW detector (EDAX) in rectangular selections within the field of view of these micrographs and each spectrum was recorded for 2 min. Data on the elemental composition were gained using Peak ID and Quantify functions of TEM imaging and analysis (TIA) software, FEI company.
Ultrastructural Analysis of Infected Dictyostelium
TEM Sample Preparation for D. discoideum
Multimodal Imaging of Particle Morphology
particle morphology
was performed with TEM, SEM, and confocal microscopy. TEM was performed
with an FEI TECNAI 20 electron microscope in which samples were prepared
by pipetting a drop of the particle dispersion in ethanol onto a Formvar/Carbon
Films 200 Mesh Copper (100) grid. SEM was performed with an FEI XL30SFEG,
FEI Phenom in which samples were prepared by pipetting a drop of the
particle dispersion onto an aluminum stub (
stub and subsequently sputter-coated with a platinum layer of approximately
4 nm. Confocal microscopy was performed with a Leica SP8 confocal
microscope (100× oil immersion lens) with excitation by a 488
nm laser line. The reflection signal was recorded at 488 nm, and the
fluorescence was in the range 500–600 nm. To prepare the samples,
the rods with fluorescent heads were dried from ethanol on a #1.5
coverslip before adding a drop of refractive index matching liquid
(glycerol/water mixture, 85:15 by mass) on top.
Structural Characterization of PI3KC3-C2:MBP-Rubicon Complex
Scanning and Transmission Electron Microscopy of Bacterial Isolates
TEM analysis was performed as described previously52 (link). Briefly, samples were incubated in 1% OsO4 and embedded in Epon resin. 70 nm ultra-thin sections were imaged with an FEI Tecnai20 electron microscope equipped with a 4 K Eagle-CCD camera. Images were processed with Adobe Photoshop. For measurements of the thickness of the cell walls, ~100 non-dividing cells each were imaged. The ImageJ software package was used for measurements. Cell cycle stages of the three isolates (DR-I1, DR-I3 and DR-I4) were assessed by counting approximately 200 cells each.
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