by Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), UV–Vis–NIR
spectroscopy, and transmission electron microscopy (TEM). Raman spectra
were recorded with a Renishaw Invia Raman spectrometer equipped with
a green laser (λ = 532 nm) and plotted after baseline correction
by means of the Wire 4.3 software. XPS measurements were performed
in a SPECS Sage HR 100 spectrometer with a nonmonochromatic X-ray
source of aluminum with a Kα line of 1486.6 eV energy and 300
W. Fitting of XPS data was carried out using CasaXPS software. UV–Vis–NIR
spectra were recorded with an Agilent 8453 UV–Vis spectrophotometer.
TEM images were obtained with a JEOL JEM-1400 PLUS transmission electron
microscope operating at an acceleration voltage of 120 kV, equipped
with a GATAN US1000 CCD camera. Thermogravimetric analysis (TGA) was
performed with a TA Instruments Discovery system under air.