ZEM-3M8 ULVAC (commercially available) Seebeck Coefficient Measurement System (ADVANCED RIKO, Inc) was used to measure the thermoelectric properties such as Seebeck coefficient, electrical conductivity and power factor, which has a special sample-attachment to measure the thin film or wire specimen. Measurement was performed in the helium environment. Transmission electron microscopy (TEM) (JEOL, JEM-2100F) was used to analyze the number of walls of CNTs and the presence of amorphous carbon surrounding CNTs. Tensile strength was measured with Autograph, AGS-X, 5 N (Shimadzu). Analytical scanning electron microscope (SEM, JEOL, JSM-6060LA) was used to measure the diameter of CNT yarns as well as to analyze the surface condition of the CNT yarn. Raman spectroscopy (JASCO, NRS4500 NMDS) was performed using 532 nm excitation (green) lasers to characterize short/long-range order/disorder in CNT yarns. The presence of carbonaceous entities before and after Joule-annealing was quantitatively estimated by thermal gravimetric analysis (TGA‒DTG-60, SHIMADZU). TGA was performed at 10 °C/min from 25 to 1000 °C under air flow rate of 300 ml/min. Modified alternative current (AC) calorimetry (Laser PIT, Ulvac) was used to measure the thermal diffusivity of the CNT yarn and measurement procedure are the same as in Hada et al.39 (link).
Jsm 6060la
Manufactured by JEOL
Sourced in Japan
The JSM-6060LA is a scanning electron microscope (SEM) manufactured by JEOL. It is designed for high-resolution imaging of a wide range of samples. The JSM-6060LA provides a maximum magnification of 300,000X and a resolution of 3.0 nanometers.
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9 protocols using jsm 6060la
1
Characterization of Thermoelectric CNT Yarns
2
Characterization of Samples via SEM
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The samples were placed on a sample holder using double-sided adhesive tape. Upon adhesion, the samples were coated with platinum in a high-vacuum evaporator (JFC-1600, JEOL Ltd., Tokyo, Japan) and imaged via scanning electron microscopy (SEM, JSM-6060LA; JEOL Ltd., Tokyo, Japan).
3
Microscopic Analysis of Optimized Microspheres
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The sample of optimized microspheres was suspended in aqueous solvent. A drop of sample was poured on the aluminum sample stage which was dried in vacuum desiccator for 24 h. The dried sample was sputtered with gold film in the ion-sputtering device (JFC-1100, JEOL Ltd.). Then, the topography of gold coated sample (microspheres) was observed by the electron microscope (SEM, JSM-6060LA, and JEOL Ltd.)
4
Comprehensive Characterization of Exfoliated Graphene
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Scanning Electron Microscopy (SEM, JSM 6060 LA, JEOL, Tokyo, Japan) was used to characterize the morphology of the exfoliated samples. The number of graphene layers was determined by atomic force microscopy (AFM, Bruker, Multimode 8, Karlsruhe, Germany) in tapping mode. Raman spectroscopy analysis was also conducted to investigate the bond quality and confirm the number of graphene layers. The SiO2 (100 nm)/Si substrates were used for all of the above-mentioned characterizations. The substrates were cleaned with acetone in an ultrasonic bath and subsequently rinsed with isopropanol and blown dry using a nitrogen gun. X-ray photoelectron spectroscopy (XPS, JEOL JPS 9030, Tokyo, Japan) analysis was performed to observe the functional groups and oxygen content of the exfoliated samples. Dynamic light scattering and zeta potential measurements (Zetasizer Nano ZS, Malvern, UK) were used to measure the size distribution and the dispersibility of the exfoliated samples.
5
Microstructure Analysis of Lyophilized Cake
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The microstructure of the lyophilized cake was observed by scanning electron microscopy (SEM, JSM-6060LA, JEOL, Tokyo, Japan) at 15 kV. The samples were sputtered with platinum under vacuum using sputtering equipment (JFC-1600, JEOL).
6
Powder Sample Imaging by SEM
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The powder samples were mounted on a sample holder stage using double-sided adhesive tape. After adhesion, the samples were imaged using a JSM-6060LA scanning electron microscope (SEM) (JEOL Co., Tokyo, Japan) at 20 kV without coating the crystal surface.
7
Hydrogel Characterization by SEM
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The prepared
hydrogels were imaged using scanning electron microscopy (SEM). The
gel precursor solution (30 mL) was dispensed into plastic Petri dishes
(90 mm diameter) and left for 24 h at approximately 23 °C. The
hydrogel disks were then removed using a 16 mm-diameter cork borer,
and the disks were lyophilized. After that, hydrogel cross sections
were prepared using a razor blade. Finally, the cross sections of
the hydrogels were sputter-coated with platinum or gold and imaged
using SEM (JSM-6490LA or JSM-6060LA, JEOL, Ltd., Tokyo, Japan) at
an accelerated voltage of 5 and 10 kV.
hydrogels were imaged using scanning electron microscopy (SEM). The
gel precursor solution (30 mL) was dispensed into plastic Petri dishes
(90 mm diameter) and left for 24 h at approximately 23 °C. The
hydrogel disks were then removed using a 16 mm-diameter cork borer,
and the disks were lyophilized. After that, hydrogel cross sections
were prepared using a razor blade. Finally, the cross sections of
the hydrogels were sputter-coated with platinum or gold and imaged
using SEM (JSM-6490LA or JSM-6060LA, JEOL, Ltd., Tokyo, Japan) at
an accelerated voltage of 5 and 10 kV.
8
Particle Size Analysis of Chitosan Microspheres
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Particle size was measured by the technique of light scattering using Malvern mastersizer 2000 analyzer. In this technique, a single narrow mode was used within the range of 0.020–2000 µm at high sensitivity.
The sample of optimized chitosan microspheres were suspended in aqueous solvent. A drop of sample was poured on the aluminum sample stage which was dried in an vacuum desiccator for 24 h. The dried sample was sputtered with gold film in the ion-sputtering device (JFC-1100, JEOL Ltd.). Then, the gold coated sample was observed by scanning electron microscope (SEM, JSM-6060LA, and JEOL Ltd.).
The sample of optimized chitosan microspheres were suspended in aqueous solvent. A drop of sample was poured on the aluminum sample stage which was dried in an vacuum desiccator for 24 h. The dried sample was sputtered with gold film in the ion-sputtering device (JFC-1100, JEOL Ltd.). Then, the gold coated sample was observed by scanning electron microscope (SEM, JSM-6060LA, and JEOL Ltd.).
9
Fungal Specimens from Ukrainian Polissya
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Infected plants with lesions were collected in the north of Ukraine, on the territory of Prypyat'-Stokhid National Nature Park near Buchyn, Liubyaz', Selisok and Svalovychy villages (Volyn Region, Liubeshiv District) in August 2018. This protected area is a part of the Ukrainian Polissya (Western Polissya) and stretches along the Prypyat' River and a part of its tributary, the Stokhid River.
The fungal specimens were examined under a dissecting microscope (DM) and by standard light microscopy (LM), finely cut and mounted in water or 5% aqueous lactic acid solution and 1% cotton blue in lactophenol, respectively. Samples for scanning electron microscopy (SEM) were coated with a thin layer of gold and palladium by ion beam sputtering coater JFC-1100. Images were obtained under the scanning electron microscope JEOL JSM-6060 LA.
Analyses of the general distribution of the studied fungi were based on the data from various bibliographic sources and publications, as well as databases available through the Internet: USDA Fungal Database (Farr, Rossman, 2019) and Mycology Collections Portal (MyCoPortal, 2019) .
The specimens are deposited in the Mycological Collection of the M.G. Kholodny Institute of Botany, National Academy of Sciences of Ukraine (KW-M).
The fungal specimens were examined under a dissecting microscope (DM) and by standard light microscopy (LM), finely cut and mounted in water or 5% aqueous lactic acid solution and 1% cotton blue in lactophenol, respectively. Samples for scanning electron microscopy (SEM) were coated with a thin layer of gold and palladium by ion beam sputtering coater JFC-1100. Images were obtained under the scanning electron microscope JEOL JSM-6060 LA.
Analyses of the general distribution of the studied fungi were based on the data from various bibliographic sources and publications, as well as databases available through the Internet: USDA Fungal Database (Farr, Rossman, 2019) and Mycology Collections Portal (MyCoPortal, 2019) .
The specimens are deposited in the Mycological Collection of the M.G. Kholodny Institute of Botany, National Academy of Sciences of Ukraine (KW-M).
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