Jem 3010 tem microscope

Powder X-ray diffraction (XRD) data were recorded on a D/Max-2550 diffractometer (Rigaku, Tokyo, Japan) with Cu-Kα radiation (λ = 0.15418 nm). The transmission electron microscopic (TEM) images were performed on a JEM-3010 TEM microscope (JEOL, Tokyo, Japan) with an accelerating voltage of 200 kV. The sample for TEM characterization was prepared by placing a drop of colloidal solution on carbon-coated copper grid and dried at room temperature. X-ray photoelectron spectroscopy (XPS) analysis was measured on an ESCALABMK IIX-ray photoelectron spectrometer using Mg as the mexciting source. Raman spectra were obtained on a J-YT64000 Raman spectrometer with 514.5 nm wavelength incident laser light.

Powder X-ray diffraction (XRD) data were recorded on a Rigaku D/Max-2550 diffractometer with Cu-Kα radiation (λ = 0.15418 nm). The transmission electron microscopic (TEM) images were taken with a JEOL JEM-3010 TEM microscope with an accelerating voltage of 200 kV. The sample for TEM characterization was prepared by placing a drop of colloidal solution on a carbon-coated copper grid and dried at room temperature. Thermogravimetric analyses (TGA) analysis was measured on ATGAQ50 instrument from 25 °C to 800 °C. Raman spectra were obtained on Horiba-JY T64000 Raman spectromer with 514.5 nm wavelength incident laser light.