A CHI 1040 C electrochemical workstation (Shanghai CH Instrument, Shanghai, China) was employed for all the electrochemical experiments using a conventional three-electrode system, including the laboratory self-made Nafion/HRP/SWCNTs-BP/CILE as the working electrode, saturated calomel electrode (SCE) as the reference electrode, and a platinum wire electrode as the counter electrode. XPS was performed on an AXIS HIS 165 spectrophotometer (Kratos Analytical, Manchester, UK). Raman spectra were analyzed on a Lab RAM HR system using 532 nm lasers (Horiba, Longjumeau, France). SEM images were obtained on a JSM-7600F instruments (JEOL, Kobe, Japan), with TEM images obtained using a JEM-2010F device (JEOL, Kobe, Japan).
Axis his 165 spectrophotometer
Manufactured by Shimadzu
Sourced in United Kingdom
The AXIS HIS 165 is a spectrophotometer designed for laboratory use. It measures the absorbance or transmittance of light through samples across a range of wavelengths. The instrument is capable of performing various spectroscopic analyses to support a variety of laboratory applications.
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Lab products found in correlation
Labram hr system, by Horiba (2 mentions)
Jem 2010f device, by JEOL (1 mentions)
D max 2500v x ray diffractometer, by Rigaku (1 mentions)
Tensor 27 ft ir spectrophotometer, by Bruker (1 mentions)
Jsm 7600f, by JEOL (1 mentions)
Jem 2010f, by JEOL (1 mentions)
Chi604e electrochemical workstation, by Chenhua (1 mentions)
2 protocols using axis his 165 spectrophotometer
1
Electrochemical Biosensor Fabrication and Characterization
2
Electrochemical Characterization of Advanced Materials
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Electrochemical measurements were performed using a CHI 604E electrochemical workstation (Shanghai Chenhua Instrument Co., China). A conventional three-electrode system was used, including a modified electrode as the working electrode, a platinum wire electrode as the auxiliary electrode and a saturated calomel electrode (SCE) as the reference electrode. Ultraviolet-visible (UV-vis) absorption spectra and Fourier transform infrared (FT-IR) spectra were recorded on a UV 5 ultraviolet-visible spectrophotometer (Mettler Toledo, America) and Tensor 27 FT-IR spectrophotometer (Bruker, Germany), respectively. Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) were obtained on a JSM-7600F (JEOL, Japan) scanning electron microscope and JEM-2010F (JEOL, Japan) transmission electron microscope, respectively. X-ray diffraction (XRD) experiments were performed on a D/Max-2500 V X-ray diffractometer (Rigaku, Japan) with Cu-Kα radiation. Raman spectra were obtained on a LabRAM HR system using 532 nm lasers (Horiba, France). X-ray photoelectron spectroscopy (XPS) was carried on an AXIS HIS 165 spectrophotometer (Kratos Analytical, UK).
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