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Miniflex 2 desktop powder x ray diffractometer

Manufactured by Rigaku
Sourced in United Kingdom

The MiniFlex II Desktop Powder X-ray Diffractometer is a compact and versatile X-ray diffraction (XRD) instrument designed for phase identification and quantitative analysis of polycrystalline materials. It utilizes a 600 W X-ray source to generate high-quality diffraction patterns, enabling the determination of crystal structures and phase compositions of a wide range of samples.

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Lab products found in correlation

2 protocols using miniflex 2 desktop powder x ray diffractometer

1

Powder X-ray Diffraction Analysis of Extrudates

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Prior to PXRD analysis, pelletized extrudates were milled in a ball-milling chamber for two 145 intermittent (rest period of 20 seconds) 30s periods with a frequency of 1/25s -1 . Powdered samples were immediately analysed at room temperature using a MiniFlex II Desktop Powder X-ray Diffractometer (Rigaku Corporation, Kent, England) equipped with Cu Kβ radiation, at a voltage of 30 kV and a current of 15 mA. The powders were gently consolidated on a glass top-loading sample holder with 0.2mm depression. All samples were scanned within the 150 angular range of 3-45° 2θ in continuous mode with a sample width of 0.03° and a scan speed of 2.0°/min. Formulations components were individually analysed prior to extrusion using similar conditions.
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2

Powder X-ray Diffraction Analysis

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Samples were analysed at room temperature using a MiniFlex II Desktop Powder X-ray Diffractometer (Rigaku Corporation, Kent, England) equipped with Cu Kβ radiation, at a voltage of 30 kV and a current of 15 mA. The powdered samples were gently consolidated on a glass top-loading sample holder with 0.2mm depression. All samples were scanned within the angular range of 1.5-40° 2Θ in continuous mode with a sampling width of 0.03° and a scan speed of 2.0°/min.
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