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Jem 1200 ex 2 microscope

Manufactured by JEOL
Sourced in Japan

The JEM-1200 EX II is a transmission electron microscope manufactured by JEOL. It is designed to provide high-quality imaging and analysis of various samples at the nanoscale level. The JEM-1200 EX II utilizes an electron beam to interact with the specimen, enabling detailed observation and characterization of the sample's structure and composition.

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9 protocols using jem 1200 ex 2 microscope

1

Transmission Electron Microscopy Imaging

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TEM images were collected on a JEOL JEM-1200 EX II microscope operating at 100 kV (tungsten filament gun) and equipped with the TEM CCD camera Olympus Mega View G2 with 1376 × 1032 pixel format. Samples were prepared by drop-casting the solution on coated copper grids.
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2

Transmission Electron Microscopy Imaging

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Transmission electron microscopy (TEM) images were collected on a JEM 1200 EXII microscope (JEOL USA) equipped with an XR-60 digital camera (Advanced Microscopy Techniques) operating at 80 kV (NHBLI Electron Microscopy Core). Grids were prepared by depositing 5 µL of solution onto a 400-mesh copper grid with a formvar/carbon film (Electron Microscopy Sciences) and allowing it to adhere for 1 min. Excess solution was wicked away using grade 1 Whatman filter paper (GE Healthcare). Grids were then stained for 30 s using 5 µL of 2% (w/v) uranyl acetate, followed by wicking. Finally, grids were dried overnight at RT before collecting images.
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3

Nanoemulsion, NLC, and Hydrogel Morphology

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The size and morphology of nanoemulsion, nanostructured lipid carrier, and hydrogels containing EOPA were examined by transmission electron microscopy (TEM) using a JEM-1200 EXII microscope (Jeol, Tokyo, Japan), operating at an accelerating voltage of 80 kV. For the analyses, the samples were diluted with ultrapure water (1:25, v/v), distributed on formvar-coated copper grids (400 mesh), and stained with uranyl acetate aqueous solution (2%).
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4

Transmission Electron Microscopy of NCs

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Transmission electron microscopy (TEM) was performed on a JEOL JEM-1200 EX II microscope operating at 100 kV, equipped with a tungsten filament as electron source. The specimens were prepared by depositing 8 μL of NCs in HEX on an aluminum grid covered with a polymeric film and letting the solvent evaporate under ambient condition. The size distribution of the samples was calculated from TEM images using ImageJ software.
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5

Transmission Electron Microscopy of Bacteria

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Bacterial cells were examined by transmission electron microscopy using a 1 μl sample of an exponentially grown culture applied on a Formvar coated grid. Samples were negatively stained with 1% uranyl acetate and observed with a JEM-1200EXII microscope (Jeol, Tokyo, Japan).
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6

TEM Micrographs of Nanoparticles

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TEM micrographs have been obtained using a JEOL JEM 1200 EX II microscope. This instrument operates at low pressures (i.e. 10−4 to 10−8kPa). All samples have been measured at an acceleration voltage of 80 kV. For preparation, the samples (≈ 1.0 mg) have been dispersed in isopropanol (1.0 mL, 20%). Then, a drop (10 μL) has been deposited onto a copper grid with a continuous parlodon film; any excess solution has been removed, and the grid has been dried. Studies on size distribution have been also performed (counting approximately 200 nanoparticles).
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7

XRD and TEM Characterization Protocol

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XRD was carried out on a Philips X’PERT-PRO diffractometer, (λ = 1.5406 Ǻ for Cu K α radiation). TEM images were recorded by a JEOL JEM-1200EXII microscope (Tokyo, Japan).
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8

Mesoporous Titania Characterization Methods

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Transmission electron microscopy was used to investigate the mesoporous titania. Microscopy specimens were prepared by scraping off mesoporous titania coated glass slides, mortaring and dispersing in ethanol. A drop of the ethanol dispersion was placed on a holey carbon coated copper grid and left to dry before analysis, in a JEOL JEM 1200EX II microscope operated at 120 kV. Surface morphology was examined with scanning electron microscopy using a Leo Ultra 55 FEG SEM operated at 4 kV. Before analysis, the samples were sputtered with gold for 30 s. X-ray photoelectron spectroscopy (XPS) analyses were performed on a Quantum 2000 scanning microprobe from Physical Electronics with an Al Kα (1,486.6 eV) X-ray source. The information depth is approximately 4-5 nm. Contact angle measurements were performed on an optical tensiometer Attension Theta instrument.
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9

Deprotection of Orthogonally Protected Compound

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Chemicals were purchased from Sigma-Aldrich and used without further purification.
Cyclen was purchased from Chematech, France. Analytical grade solvents were used TEM experiments were performed with a JEOL JEM1200EXII microscope at Bath University, UK. Mass spectrometry was performed at CACTI -Vigo, Spain. Orthogonally protected compound 6 was synthesized as described before by us. 27 A solution of compound 6 (85 mg; 1.12 mmol) in a mixture DCM/TFA (24 ml, 3:1, v/v) was stirred at room overnight. The solvent was removed under reduced pressure, the residue was re-dissolved in DCM and the solvent was evaporated. This procedure was repeated several times.
The resulting oil was dried under vacuum to afford a white foam. 1 H NMR (CDCl 3 ) revealed the disappearance of the signals assigned to the Boc groups on compound 6.
Quantitative deprotection was assumed. The residue (1.12 mmol, assuming quantitative deprotection) was dissolved in DCM (20 ml) and the solution was adjusted to pH 9-10 deprotected compound as a light yellow solid (L 1 ) (0.685 g, 35%). 1
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