Axis supra x ray photoelectron spectrometer

Manufactured by Shimadzu

Sourced in United Kingdom

The AXIS Supra X-ray photoelectron spectrometer is a high-performance surface analysis instrument. It uses X-ray photoelectron spectroscopy (XPS) to provide information about the chemical composition and electronic structure of solid surfaces and thin films.

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Lab products found in correlation

Jem 2100, by JEOL (2 mentions) Charge neutralizer system, by Shimadzu (2 mentions) Smartlab theta theta diffractometer, by Rigaku (2 mentions) Uv 1600pc, by Avantor (2 mentions) Flir ets320, by Teledyne (2 mentions) S 4700, by Hitachi (2 mentions) Flouromax 4fluorescence spectrometer, by Horiba (1 mentions) Element xr, by Thermo Fisher Scientific (1 mentions) Axio observer z1 microscope, by Zeiss (1 mentions) Nmr spectrometer, by Bruker (1 mentions) Uv 2700, by Shimadzu (1 mentions) Su5000, by Hitachi (1 mentions) X pert powder, by Malvern Panalytical (1 mentions) Tg 209 f3, by Netzsch (1 mentions) Uv 1900, by Shimadzu (1 mentions) Alpha 300 confocal raman microscopy, by WITec (1 mentions) Palladium acetate, by Merck Group (1 mentions) Talos f200x g2, by Thermo Fisher Scientific (1 mentions) 400 mhz spectrometer, by JEOL (1 mentions) Gcms qp2010 se, by Shimadzu (1 mentions)

Close spelling variants of this product

AXIS Supra photoelectron spectrometer X-ray photoelectron spectrometer Axis Supra spectrometer Axis Supra Spectrometers

14 protocols using axis supra x ray photoelectron spectrometer

Characterization of Metal Complexes

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All of the metal salts used in
this work were as their perchlorates, and these were procured from
Sigma-Aldrich. Reagent-grade CHCl₃ and CH₃CN
were used for all of the studies reported. NMR spectra were measured
on a Bruker NMR spectrometer (500 or 400 MHz), and ESI-MS images on
a maXis Impact high-resolution mass spectrometer (Bruker). Absorption
and emission spectra (solid and solution) were measured on a Varian
Cary UV 100 Bio UV–vis spectrophotometer and a Horiba Flouromax-4
fluorescence spectrometer, respectively. DRS spectra were measured
on Shimadzu (Japan) UV-NIR-3600. Transmission electron microscopy
(TEM) images were recorded on a JEOL 2100F FEG-TEM microscope, and
scanning electron microscopy (SEM) images were recorded on an FEG-SEM-JSM-7600F
microscope. XPS spectra were recorded on an AXIS Supra X-ray photoelectron
spectrometer, Kratos Analytical, UK (Al Kα source, 225 W; pass
energy, 160 eV; take-off angle, 90°), and confocal microscopy
images on a Zeiss Axio-Observer Z1 microscope (inverted). ICP-MS spectra
were measured on Element XR (Model: Thermo Fisher Scientific, Germany),
and the fluorescence-activated cell sorting (FACS) was carried out
on FACS Aria Special Order System.

Nag R., Polepalli S., Althaf Hussain M, & Rao C.P. (2019). Ratiometric Cu2+ Binding, Cell Imaging, Mitochondrial Targeting, and Anticancer Activity with Nanomolar IC50 by Spiro-Indoline-Conjugated Calix[4]arene. ACS Omega, 4(8), 13231-13240.

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Characterization of Composite Aerogels

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To analyze the chemical composition of composite aerogels, the materials were characterized by infrared spectroscopy (FTIR) using Nicolet Nexus-670 (Nicolet Instrument Technologies, USA) over a scan range of 400–4000 cm⁻¹. The X-ray diffraction (XRD) patterns were recorded in the 2θ range of 10–90° by X-ray diffractometer (X'Pert Powder, Panalytical, Netherlands) with a Cu-Kα radiation. The scanning electron microscope (SEM) images and energy dispersive spectroscopy (EDS) mappings were collected by the field emission scanning electron microscope (SU5000, Hitachi High-Tech, Japan) equipped with energy dispersive X-ray spectroscopy. Transmission electron microscopy (TEM) images were obtained using a JEOL JEM 2100 (Jeol, Japan). The X-ray photoelectron spectroscopy spectrums were detected by Axis Supra+ X-ray photoelectron spectrometer (Kratos Analytical, UK). The thermogravimetric analyses (TGA) were performed on a thermogravimetric analyzer (TG209F3, NETZSCH, Germany) at a heating rate of 10 °C min⁻¹ from 40 to 800 °C under flowing nitrogen atmosphere. UV-vis absorption of the solutions was measured with UV-vis spectrophotometer (UV-1900, Shimadzu, Japan). UV-vis diffuse reflectance spectra (DRS) were obtained using a UV-vis spectrophotometer (UV-2700, Shimadzu, Japan) equipped with an integration sphere.

Jing J., Feng Y., Wu S., Ye Z., Yang L., Li J., Chen Y, & Yang F. (2023). β-FeOOH/TiO2/cellulose nanocomposite aerogel as a novel heterogeneous photocatalyst for highly efficient photo-Fenton degradation. RSC Advances, 13(21), 14190-14197.

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X-ray Photoelectron Spectroscopy Analysis

Cited 1 time

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The XPS spectra of the materials were acquired with the AXIS Supra X-ray photoelectron spectrometer (Kratos Analytical, Manchester, UK). The emission current was set to 15 mA. All the values of the recorded graphs were calibrated according to the

C - C

binding reference value (

284.8

eV). The plotted spectra already represent a fitting of the measured data [33 (link)].

Černohorský P., Pisarenko T., Papež N., Sobola D., Ţălu Ş., Částková K., Kaštyl J., Macků R., Škarvada P, & Sedlák P. (2021). Structure Tuning and Electrical Properties of Mixed PVDF and Nylon Nanofibers. Materials, 14(20), 6096.

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XPS Analysis of Doped MoS2 for HER

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The XPS analyses were carried out with a Kratos AXIS Supra X-ray photoelectron spectrometer using a monochromatic Al K(alpha) source (15 mA, 15 kV). XPS can detect all elements except hydrogen and helium, probes the surface of the sample to a depth of 7–10 nm, and has detection limits ranging from 0.1–0.5 at% depending on the element. The instrument work function was calibrated to give a binding energy (BE) of 83.96 eV for the Au 4f_7/2 line for metallic gold and the spectrometer dispersion was adjusted to give a BE of 932.62 eV for the Cu 2p_3/2 line of metallic copper. The Kratos charge neutralizer system was used on all specimens. Survey scan analyses were carried out with an analysis area of 300 × 700 μm² and a pass energy of 160 eV. High resolution analyses were carried out with an analysis area of 300 × 700 μm² and a pass energy of 20 eV. Spectra have been charging corrected to the main line of the carbon 1s spectrum (adventitious carbon) set to 284.8 eV. Spectra were analysed using CasaXPS software. Survey scans and high-resolution spectra of C 1s, O 1s, S 2p and Mo 3d were recorded and analyzed of all doped conductive MoS₂ and 2H–MoS₂ including hydrogen evolution reaction. 2H–MoS₂ was used as a reference for comparison.

Saha D., Patel V., Selvaganapathy P.R, & Kruse P. (2021). Facile fabrication of conductive MoS2 thin films by sonication in hot water and evaluation of their electrocatalytic performance in the hydrogen evolution reaction. Nanoscale Advances, 4(1), 125-137.

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Raman and XPS Characterization of Graphene

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A Renishaw inVia Raman spectrometer was used to characterize the defect level of the graphene film. A Renishaw 633 nm HeNe laser with 17 mW power output was focused through the 50× objective lens with a spot size of about 1.5 μm. The laser power used for few-layer graphene analysis was 50% to minimize the noise and 5% power for graphene oxide to avoid film damage. The range of the Raman region was from 500 to 3500 cm⁻¹ with a spectral resolution of 2 cm⁻¹. Spectra were recorded in at least two different spots for each sample to ensure reproducibility.
The XPS analyses were carried out with a Kratos AXIS Supra X-ray photoelectron spectrometer using a monochromatic Al K(alpha) source (15 mA, 15 kV). A charge neutralizer was used on all specimens. Survey scans were collected from an area of 300

\times

700 µm² using a pass energy of 160 eV. High-resolution scans used a pass energy of 20 eV. All spectra were charge corrected to the mainline of C 1s (graphitic carbon, 284.5 eV). Spectra were analyzed using CasaXPS software (version 2.3.14).

Angizi S., Huang X., Hong L., Akbar M.A., Selvaganapathy P.R, & Kruse P. (2022). Defect Density-Dependent pH Response of Graphene Derivatives: Towards the Development of pH-Sensitive Graphene Oxide Devices. Nanomaterials, 12(11), 1801.

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X-ray Photoelectron Spectroscopy Analysis

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An AXIS Supra X-ray photoelectron
spectrometer (Kratos Analytical Ltd, UK) was used to acquire XPS data
by Al Kα radiation (1486.6 eV, probe area is 0.7 × 0.3
mm², resolution is 0.45 eV, measured on the Ag 3d_5/2 line width). A survey scan was obtained for each sample. High-resolution
scans of the C 1s, O 1s, N 1s, Ga 3d, Al 2p, and P 2p regions were
performed for each sample. The data were calibrated to the C 1s peak
at 284.8 eV and analyzed using CasaXPS (version 2.3.19PR1.0) to determine
atomic percentages and fit peaks to determine the percentage of specific
chemical species.

Gleco S., Romanyuk O., Gordeev I., Kuldová K., Paskova T, & Ivanisevic A. (2019). Modification of the Surface Properties of AlxGa1–xN Substrates with Gradient Aluminum Composition Using Wet Chemical Treatments. ACS Omega, 4(7), 11760-11769.

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Comprehensive Characterization of Nanostructured Materials

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HRTEM images were obtained on a Talos F200S-type field emission transmission electron microscope (Hillsboro, OR, USA) at 200 KV. XRD images (λ = 1.540 Å, 40 kV, 40 mA, angular reproducibility 0.0001°) were recorded on a D8-ADVANCEX type X-ray diffractometer (Bruker, Karlsruhe, Germany), using a Cu target, and the range of the diffraction angle (2θ) was 10–60°, and the test samples were prepared by dropping a concentrated solution of the NWs on a clean silicon substrate. The Fourier-transform infrared (FTIR) spectra of the samples were recorded using a Nicolet 6700 FTIR spectrometer (Waltham, USA), and the test samples were prepared by dropping a concentrated solution of the NWs on a clean glass sheet. The full and elemental high-resolution spectra of the XPS were obtained using an AXIS SUPRA X-ray photoelectron spectrometer (Kratos, Manchester, UK), and the data were processed using Avantage (5.99), combined with an internal reference of the energy scale C1s peak (binding energy of C–C = 284.8 eV).

He J., Li H., Liu C., Wang X., Zhang Q., Liu J., Wang M, & Liu Y. (2024). Hot-Injection Synthesis of Cesium Lead Halide Perovskite Nanowires with Tunable Optical Properties. Materials, 17(10), 2173.

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Comprehensive Characterization of MWCNTs

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Raman
spectroscopic analysis of MWCNTs was performed using an HR 800 micro-Raman
spectrometer (HORIBA Jobin Yovon, France) with an incident laser excitation
wavelength of 532 nm. TEM investigation was performed using a JEOL
JEM-2100 F (Japan) field emission electron microscope for MWCNTs.
SEM analysis was performed using FEG-SEM (JSM-7600F, Japan) at 10
kV accelerating voltage. XPS was carried out using an AXIS Supra X-ray
photoelectron spectrometer (Kratos Analytical, UK). Monochromatic
Al Kα (1486.6 eV), 600 W X-ray source was used for XPS measurements.
The energy resolution was ∼0.5 eV, and the XPS-imaging spatial
resolution was ∼1 μm. Deconvolution of C 1s and O 1s
XPS spectra was done by using XPSPeak 4.1 software.

Bhagavathi Kandy S., Simon G.P., Cheng W., Zank J., Joshi K., Gala D, & Bhattacharyya A.R. (2018). Effect of Incorporation of Multiwalled Carbon Nanotubes on the Microstructure and Flow Behavior of Highly Concentrated Emulsions. ACS Omega, 3(10), 13584-13597.

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Multimodal Characterization of Nanomaterials

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The atomic force microscopy (AFM) characterization (Cypher S Asylum Research Oxford Instruments) was carried out using non-contact mode. XPS measurements were conducted on a Kratos AXIS Supra X-ray photoelectron spectrometer.
The SHG measurement utilized a mode-locked Ti:sapphire laser (output wavelength: 800 nm and repetition rate: 76 MHz) to generate tunable wavelength light ranging from 500 to 1600 nm filtered through OPO, then circularly polarized by the quarter-wave plate, attenuated and focused on a sample by microscope objective lens (100 × , NA = 0.95). The SHG signal was collected by the same lens using a dichroic mirror and filtered by a short pass filter before entering a spectrometer.
The Raman scattering measurements (WITec alpha 300 confocal Raman microscopy) were carried out under a laser light of 532 nm, laser power of 0.1 mW and beam diameter of 400 nm with a 100 × objective lens.

Cai W., Wang J., He Y., Liu S., Xiong Q., Liu Z, & Zhang Q. (2021). Strain-Modulated Photoelectric Responses from a Flexible α-In2Se3/3R MoS2 Heterojunction. Nano-Micro Letters, 13, 74.

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Comprehensive Characterization of Functional Nanocomposites

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The SEM images were taken by the field emission scanning electron microscope (Hitachi S-4700 with EDS). The XPS spectra were obtained by Kratos Axis Supra x-ray photoelectron spectrometer, allowing to determine the elemental composition of the top ~ 10 nm of the sample surface. The XRD patterns of functional nanocomposites were obtained using the Rigaku SmartLab theta-theta diffractometer. The FTIR spectra were recorded using Hyperion 1000 with Tensor 27 spectrometer. The thermal images were taken with an infrared (IR) camera (FLIR ETS320). The performance of the drug-release patch was characterized with a Ultraviolet-visible (UV-vis) spectrometer (VWR UV-1600PC).

Bai W., Zhang L., Xing S., Yin H., Weisbecker H., Tran H.T., Guo Z., Han T., Wang Y., Liu Y., Wu Y., Xie W., Huang C., Luo W., Demaesschalck M., McKinney C., Hankley S., Huang A., Brusseau B., Messenger J, & Zou Y. (2023). Skin-inspired, sensory robots for electronic implants. Research Square.

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