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Nanoscope analysis software

Manufactured by Digital Instruments
Sourced in United States

NanoScope Analysis software is a core tool for data processing and visualization of atomic force microscopy (AFM) measurements. It provides a comprehensive set of functions for analyzing and interpreting AFM data, including image processing, spectroscopy analysis, and advanced visualization options.

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2 protocols using nanoscope analysis software

1

Comprehensive Characterization of AWCs Materials

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The morphologies and structures of the AWCs materials were characterized by CuKa radiation (k = 1.5418). It was used for X-ray diffraction (XRD), which was carried out using a Rigaku D/Max-2400 diffractometer. Transmission electron microscopy (TEM, Japan), and scanning electron microscopy (FE-SEM, Germany). Raman spectra were obtained by a Via Raman spectrometer using an argon ion laser (Renishaw). X-ray photoelectron spectroscopy (XPS, Escalab 210 system, Germany). Atomic force microscope (AFM, NanoScope Analysis software, Digital instruments, United States). The Brunauer -Emmett-Teller (BET) surface area, before measuring nitrogen adsorption, all materials were degassed at 200°C., and the carbon samples’ pore structure was analyzed using nitrogen adsorption ASAP 2020 technology using Micromeritics’ (United States).
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2

Atomic Force Microscopy of Organic Photocatalyst

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OP solution (100 µg/mL) was prepared with pure water, heated and oscillated at 40℃. After dissolving fully, 10 µL of OP solution was dropped on the surface of the freshly peeled mica sheet, and dried naturally overnight at room temperature. Next, the mica sheet was fixed on a round iron sheet with a diameter of 15 mm with double-side adhesive, and the iron sheet was fixed on the sample platform. A Multimode8 Nanoscope AFM (Bruker Nano Surfaces Division, Santa Barbara, CA) was used in the semiautomatic tapping mode, and the probe was scanasyst-air (K = 0.4 N/m, tip length = 2 nm). The experiment was performed at room temperature of 20–22 °C and a relative humidity of 26–30%. The scanning area was set at 2 μm × 2 μm on the XY plane, and the scanning resolution was 512 × 512 points [24] . AFM images were analyzed offline by using NanoScope Analysis software (Digital Instruments, Santa Barbara, CA, USA).
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