Themis 200

Structural properties of the samples were characterized using a Bruker D8 Discover X-ray diffraction (XRD) system with Cu Kα radiation. The HR-TEM were performed with an electron microscope operated at 200 kV (FEI Titan Themis 200). For the current induced magnetization switching and anomalous Hall loop shift measurements, current pulses with an 800 μs pulse width were applied. In-between two adjacent writing pulses, the magnetization state of the Ni/Co multilayer was read by current pulses with the same duration as that of the writing pulse but at a much smaller amplitude of 1 mA. The current density is calculated using the standard parallel resistor model which takes into account the shunting effect.

The morphology of SnS₂/BN/CIPS based Fe‐FET device was characterized by optical microscopy (AOSVI, L100‐HK830), The Raman spectra of nanosheets were obtained by Raman spectrometer (Horiba Labarum HR Evolution, 532 nm). The UV‐vis‐NIR absorption spectrometer (Metatest, MStarter ABS) was used to characterize the band gap of SnS₂. The STEM specimens were prepared on a FEI Helios 450S dual beam focus ion beam (FIB) workstation, and the cross‐sectional high‐resolution TEM image of SnS₂/h‐BN/CIPS heterostructure device was obtained by aberration corrected FEI Titan Themis 200. AFM (Bruker Dimension Icon) and PFM mode were used to measure the thicknesses and ferroelectric properties, respectively. The light sources of different wavelengths were provided by commercially available light‐emitting diode (LED) lamps, whose power densities were measured by FieldMate+PM150X photometer. The electronic and optoelectronic measurements were conducted on a vacuum probe station (TTPX, Lakeshore) using a Keithley 4200SCS semiconductor parameter analyzer.

Optical microscope images are obtained by 3D laser scanning confocal microscope (Keyence VK9710K). AFM images and Raman spectra are obtained by a combined AFM/Raman (532 nm) instrument (NT-MDT NTEGRA). The composition and structural analyses are carried out by XRD (Rigaku D/max2200) and X-ray photoelectron spectroscopy (XPS, Thermo Fisher 250 XI). STEM images and corresponding EDS are obtained by FEI Titan Themis 200.