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Escalab xi x ray photoelectron spectrometer

Manufactured by Thermo Fisher Scientific
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The ESCALAB Xi+ X-ray photoelectron spectrometer is a versatile analytical instrument used for surface analysis. It utilizes X-ray photoelectron spectroscopy (XPS) to provide detailed information about the chemical composition and electronic structure of a material's surface.

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10 protocols using escalab xi x ray photoelectron spectrometer

1

Comprehensive Characterization of Carbon Quantum Dots

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All fluorescence spectra were acquired using a Shimatzu RF-5301PC fluorescence spectrophotometer (Kyoto, Japan). Transmission electron microscopy (TEM) and high-resolution transmission electron microscopy (HRTEM) images were performed on a JEOL 2100F field emission transmission electron microscope (Tokyo, Japan). The thickness of CQDs was characterized using a Dimension Icon Scan Asyst atomic force microscope (AFM, Bruker Co., Karlsruhe, Germany). Elemental and functional group analyses were performed using an ESCALAB Xi+ X-ray photoelectron spectrometer (XPS, Thermo Fisher Scientific Inc., Waltham, MA, USA) and a Nicolet iS5 Fourier Transform Infrared spectrometer (FTIR, Thermo Fisher Scientific Inc., Waltham, MA, USA). The Raman spectrum obtained on the Ag substrate (excited by a 532 nm laser) was recorded with a DXR 2xi Raman microscope (Thermo Fisher Scientific Inc., Waltham, MA, USA). The C9920-02G fluorescence spectrophotometer (Hamamatsu Photonics KK, Tokyo, Japan) was used to measure the fluorescence lifetime. Zeta potentials of CQDs were obtained with a Zetasizer Nano ZS90 System (Malvern, UK). The concentration of bacteria was determined by measuring the optical density at 600 nm (OD600) via UV–vis spectroscopy. The morphology of bacteria was observed under a Hitachi S-3400N scanning electron microscope (SEM, Tokyo, Japan).
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2

Multi-Technique Characterization of Materials

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TEM images were acquired using a FEI Tecnai F30 transmission electron microscope with a field emission gun operated at 200 kV. SEM images and EDS elemental mapping were acquired using a ZEISS Ultra-55 FEG scanning electron microscope. XRD pattern was collected using a PANalytical Empyrean diffractometer with a 1.8 KW copper X-ray tube. XPS data were acquired by a Thermo Scientific ESCALAB XI+ X-ray Photoelectron Spectrometer with an Al Kα X-ray source (1486.67 eV). Operando XAS was performed at Beamline 2-2 of the Stanford Synchrotron Radiation Lightsource at the SLAC National Accelerator Laboratory using a modified two-compartment H-cell and a Lytle fluorescence detector (Supplementary Fig. 3). The XAS data were processed using the ATHENA software59 (link). Contact angle measurements were carried out using an L2004A1 Ossila Contact Angle Goniometer (Ossila Ltd, UK).
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3

Characterization of Hydration Reaction Products

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Mechanical properties were tested with a WDW-20 electronic universal testing machine. The mineral facies were analyzed with a ZSX100e X-ray fluorescence spectrometer made by Nippon Corporation Science, and thermal analyses of the hydration reaction were performed with a TA-Q600 synchronous thermal analysis instrument. The morphologies of the hydration products were observed with a Quanta 250-field emission environmental scanning electron microscope. The infrared spectra of the hydration products were observed with a Nicolet 5700 Fourier transform infrared spectrometer. The specific activity of radioactivity was determined by using an HD-2001 low background multichannel gamma spectrometer. The Na1s, As3d, and Cr2p binding energies were determined with a Thermo Scientific ESCALAB Xi+ X-ray photoelectron spectrometer. The heavy metal elements in the RMC extract were tested with an Agilent 7500CE inductively coupled plasma–mass spectrometer (ICP-MS7500CE).
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4

Comprehensive Characterization of P-doped Carbon Quantum Dots

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A RF-5301PC fluorescence spectrophotometer was used to collect all fluorescence spectra (Shimatzu Corp., Kyoto, Japan). Transmission electron microscopy (TEM) and hgh-resolution transmission electron microscopy (HRTEM) images were collected using a JEOL-2100F transmission electron microscope (Tokyo, Japan). The thickness of P-doped CQDs was carried out by a Dimension Icon Scan Asyst atomic force microscope (AFM, Bruker Co.). Structural analysis was characterized by D8 ADVANCE X-ray diffraction (XRD, Bruker Co.) using Cu Kα radiation (λ = 0.15406 nm). Elemental and functional group analyses were measured using an ESCALAB Xi+ X-ray photoelectron spectrometer (XPS, Thermo Fisher Scientific Inc.) and a Nicolet iS5 Fourier Transform Infrared spectrometer (FTIR, Thermo Fisher Scientific Inc.). Zeta potentials of P-doped CQDs were recorded using a Zetasizer Nano ZS90 System (Malvern, UK). The concentration of bacteria was determined by measuring the optical density at 600 nm (OD600) via UV-vis spectroscopy. The images of bacteria morphology were obtained under a S-3400N scanning electron microscope (SEM, Hitachi, Japan).
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5

Comprehensive Characterization of Ni(OH)x/Cu Catalyst

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The morphology was analyzed by field emission SEM (TESCAN MAIA3LMH) and TEM (Talos F200X). XRD patterns were recorded on a Shimadzu XRD-6100 with Cu Kα radiation. XPS spectra were collected on a Thermo Fisher ESCALAB Xi+ X-ray photoelectron spectrometer. All the XPS data were calibrated by shifting the C 1s peaks to 284.8 eV. The Raman spectra were measured on a Renishaw inVia Qontor Ramna microscope using laser excitation wavelength of 633 nm for copper and copper oxide detection and 532 nm for Ni(OH)x species detection. The concentration of nitrate in the electrolyte was quantified on a Thermo Scientific Dionex Integrion. The EPR measurements were performed on a JEOL JES-FA200 spectrometer. The 1H NMR spectra were measured on a AVANCE III HD 600 MHz NMR spectrometer. The mass spectra were collected on a GCMS-QP2020NX Shimadzu instrument. The contents of Ni and Cu elements in the Ni(OH)x/Cu samples were measured on a NexION 350D inductively coupled plasma mass spectrometer (ICP-MS).
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6

Comprehensive Characterization of N,S-CDs

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The morphology and size of N,S-CDs were analyzed by transmission electron microscope (HT-7700, Japan) operated at 100 kV. Fourier transform infrared (FT-IR) spectra were obtained on a Thermo Scientific Nicolet iS5 IR spectrometer (USA) ranging from 400 to 4000 cm−1 using attenuated total reflection (ATR) accessory. XPS analysis was measured by Thermo Scientific ESCALAB Xi+ X-ray photoelectron spectrometer (USA) using Al Kα as the excitation source (1486.6 eV).
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7

X-ray Photoelectron Spectroscopy of Platinum

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An Escalab Xi+ X-ray photoelectron spectrometer (Thermo Fisher Scientific, USA) was used for the X-ray photoelectron spectroscopy (XPS) analysis using an Al X-ray source ( = 1486.6 eV, total energy resolution E = 1 eV). The XPS experiments were performed in an ultrahigh vacuum (UHV) experimental chamber operating at base pressures of <8 × 10−10 mbar. Computer spectral simulations were performed with software ‘Advantage’ for the Pt 4f (Pt0, Pt(ii), Pt(iv)) XPS spectral signals.
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8

X-ray Photoelectron Spectroscopy of Nontronite

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XPS measurements were performed
in an ESCALAB Xi+ X-ray photoelectron
spectrometer (ThermoScientific) employing a monochromated Al Kα
Xray source (hν = 1486.6 eV). High-resolution spectra were collected
using an analysis area of 650 × 650 μm2 and
a 20 eV pass energy. The C(1s) level (284.8 eV) was taken as the reference
binding energy. The sample was prepared by suspending an aliquot of
the nontronite sample in ∼1 mL bidistilled water inside the
glovebox, agitated by hand, and then pipetting an aliquot of 0.5 mL
of the suspension onto a carbon sample holder. The suspension was
then dried at 35 °C in an oven in the glovebox. The dried sample
was sealed in an airtight jar, itself sealed in an airtight aluminum
bag. It was then taken out of the glovebox and opened just before
being positioned in the measurement apparatus, where it was immediately
subjected to vacuum conditions. A charge neutralizer was used for
data collection, being monitored using the C(1s) signal corresponding
to adventitious carbon.54 (link),55 (link) C(1s), Fe(2p), O(1s),
Si(2p) spectra were collected and fitted using the Avantage software
(ThermoScientific) via a Lorentzian–Gaussian peak with a default
value of 30% Lorentzian contribution, and a smart background removal
was used for all spectra.
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9

Multimodal Characterization of Nanomaterials

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A JEOL 2200FS HRTEM operated at 200 kV, was used to obtain the STEM images. A Cary 50 UV-Vis Spectrophotometer from Agilent Technologies and a JASCO J-815 CD spectropolarimeter were used for UV-Vis spectrum and CD spectrum characterizations, respectively. The XRD data were measured with a Bruker D8 with IµS-XR Source. The zeta potential and titration were conducted with a Malvern Zetasizer Nano ZSP equipped with an Autotitrator. FTIR spectra were measured with a Cary 630 FTIR Spectrometer from Agilent. XPS data were measured by ESCALAB Xi+ X-ray Photoelectron Spectrometer from ThermoFisher Scientific. Solid-state NMR spectra were recorded by a JNM-ECZ600R from JEOL.
UV-titration was conducted by coupling the titration experiments with an Ocean optics USB2000 fiber optic spectrometer. Titration experiments were performed using a commercial, computer-controlled system from Metrohm (Filderstadt, Germany), operated with the custom-designed software Tiamo (v2.2). The setup consists of a titration device (Titrando 809) that regulates two dosing units (Dosino 807) capable of dispensing titrant solution in steps as small as 0.2 µL.
CD titration was conducted by manual addition of concentrated KOH solutions into the cuvettes followed by the measurement of the CD spectrum. The pH was recorded by a Mettler Toledo pH meter. All the pH electrodes were calibrated before use.
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10

X-ray Photoelectron Spectroscopy Analysis

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Chemical composition was evaluated using a Thermo Scientific ESCALAB Xi+ X-ray photoelectron spectrometer. An Al anode was used as an x-ray source. Survey spectra were recorded in a 1-eV step size with a pass energy of 200 eV. Detailed scans were recorded in 0.1-eV step sizes with a pass energy of 50 eV.
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