Powder X‐ray diffraction analysis of the samples were carried out with a PANalytical X'pert3 powder diffractometer (40 kV, 40 mA) using Cu Kα radiation. The patterns were recorded in the range of 10°–80° with a step size of 0.013°. Scanning electron microscope and energy dispersion spectrum (EDS) were obtained on a Zeiss Gemini300 scanning electron microscope. TEM and HR‐TEM images were obtained with a JOEL JEM 2100 microscope. HAADF‐STEM images were acquired on a Titan Cubed Themis G2 300. XPS measurements were analyzed using a Thermo ESCALAB 250 X‐ray photoelectron spectrometer, and the binding energies were determined utilizing C 1s spectrum as reference at 284.8 eV. DRIFTS measurements were carried out on a BRUKER VERTEX‐70 FTIR. H2‐TPR was conducted on a Builder PCSA‐1000 instrument.
X pert3 powder diffractometer
Manufactured by Malvern Panalytical
Sourced in Netherlands
The X'Pert3 powder diffractometer is a laboratory instrument designed for X-ray powder diffraction analysis. It is used to determine the crystallographic structure and composition of powdered or finely divided solid materials. The instrument generates X-rays, which interact with the sample, and the resulting diffraction pattern is recorded and analyzed to provide information about the sample's properties.
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Lab products found in correlation
Empyrean x ray tube, by Malvern Panalytical (3 mentions)
Xrk 900, by Anton Paar (2 mentions)
Tga 50 analyzer, by Shimadzu (2 mentions)
240c elemental analyzer, by PerkinElmer (2 mentions)
Nicolet 5700 ftir instrument, by Thermo Fisher Scientific (2 mentions)
Highscore plus software, by Malvern Panalytical (2 mentions)
Sigma 300, by Zeiss (2 mentions)
Gemini 300, by Zeiss (1 mentions)
Escalab 250x, by Thermo Fisher Scientific (1 mentions)
100 ftir, by PerkinElmer (1 mentions)
Lambda 35, by PerkinElmer (1 mentions)
Spectrum two ft ir spectrophotometer, by PerkinElmer (1 mentions)
Ls45 spectrometer, by PerkinElmer (1 mentions)
Tga sdta 851e, by Mettler Toledo (1 mentions)
Su 70, by Hitachi (1 mentions)
Tga sdta851e lf 1600, by Mettler Toledo (1 mentions)
X pert highscore plus software, by Malvern Panalytical (1 mentions)
Zetasizer nano zs instrument, by Malvern Panalytical (1 mentions)
Uv 3600 plus, by Shimadzu (1 mentions)
Tensor 27, by Bruker (1 mentions)
23 protocols using x pert3 powder diffractometer
1
Comprehensive Characterization of Material Samples
2
Comprehensive Characterization of a Novel Fumarate Complex
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PEC (>99%) was provided by Sichuan Kelun Pharmaceutical Research Institute Co., Ltd. Fumaric acid (99%) were purchased from Chron Chemicals Corporation. Methanol and acetonitrile of high-performance liquid chromatography (HPLC) grade were purchased from Merck. All the other reagents were analytical grade and commercially available with out further purification. Elemental analyses were characterized by an Perkin Elmer 2400 II elemental analyzer. The infrared spectra were recorded in the 4000–400 cm−1 region using KBr pellets and a Perkin Elmer 100FT-IR. Thermogravimetric analyses (TGA) was recorded on a TGA (METTLER TOLEDO) instrument with a heating rate of 10 °C min−1. Differential scanning calorimetry (DSC) was recorded on a DSC1 (METTLER TOLEDO) instrument with a heating rate of 10 °C min−1. Powder X-ray diffraction (PXRD) patterns were obtained on a PANalytical XPert3 Powder Diffractometer with Cu Kα radiation (45 kV, 40 mA).
3
In situ and ex situ XRD Analysis
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Both ex situ and in situ modes were carried out on a PANalytical X’pert3 powder diffractometer (40 kV, 40 mA) using Cu Kα radiation (λ = 0.15406 nm). The powder samples were placed inside a quartz holder and the diffraction angles (2θ) ranged from 10 to 90°. For the in situ XRD experiments, 100 mg catalysts were loaded into an Anton Paar XRK900 in situ chamber. The XRD data was measured from 25 to 450 °C in 5% H2/Ar mixture (30 mL min−1) or 2% CO/Ar mixture (30 mL min−1).
4
Comprehensive Characterization of Ag-ZnO Nanoparticles
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Phase identification of Ag-ZnO was carried out by employing X-ray diffractometer PANALYTICAL model X’Pert3 powder diffractometer with CuKα radiation (λ = 1.5406 Å). Diffraction studies were conducted in the 2θ scale between 30° and 80°. Fourier transform infrared (FTIR) spectra were collected using Perkin Elmer spectrum two FTIR spectrophotometer in the range of 4000–400 cm−1 to identify the functional groups present in the synthesized nanocatalyst. Morphology as well as particle size of the as-prepared photocatalyst was examined using SIGMA HV-CARL ZEISS field emission scanning electron microscope (FESEM) at an accelerating voltage of 10 kV and energy dispersive X-ray (EDX). In addition, the Brunauer-Emmett-Teller (BET) surface area characteristics were measured by surface area analyzer (BELSORP mini II). The ultraviolet-visible absorption studies of the photocatalyst were conducted on an UV-Vis spectrophotometer (PerkinElmer Lambda 35) which is having continuous scan mode of scan range 200–700 nm and scan speed of 480 nm with slit width of 1nm. Room temperature photoluminescence spectra of the photocatalyst were collected from Perkin-Elmer LS45 spectrometer using xenon flash lamp laser as the excitation source within the range of 300 to 500 nm and excitation wavelength of 325 nm.
5
Mineral Identification in X-Ray Diffraction
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Three parallel PVC filters were removed from the monitor cassettes and stacked in the XRD sample holder on a Si crystal zero-diffraction plate. The samples were analysed in a PANalytical X’Pert3 powder diffractometer, equipped with a PANalytical Empyrean X-ray tube (Malvern Panalytical, Malvern, Great Britain). In-house reference materials of magnetite and hematite were also analysed. The resulting diffractograms were examined in HighScore Plus software (Malvern Panalytical, Malvern, UK) which determined the background. The search-and-match function of the software was used to identify mineral candidates in the ICSD database. Element information from SEM and ICP-MS was used in the restriction settings to limit the number of candidates.
6
Synthesis and Characterization of FJU-23
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All reagents and solvents were used as received from commercial suppliers without further purification. Thermogravimetric analysis (TGA) was performed on a Mettler Toledo TGA/SDTA851e analyzer in air with a heating rate of 5 K/min from 30 to 600°C. Elemental analysis was collected on vario EL elemental analyzer. Powder x-ray diffraction (PXRD) was carried out with a PANalytical X’Pert3 powder diffractometer equipped with a Cu sealed tube (λ = 1.54178 Å) at 40 kV and 40 mA over the 2θ range of 5° to 30°. The I-V characteristics of FJU-23-H2O and FJU-23-D2O were measured on a Lakeshore probe station equipped with a precision semiconductor parameter analyzer (Keithley 4200) in dc sweep or pulse mode. The ligand H2L and its precursor N,N-dimethylformamide azine dihydrochloride were synthesized according to the literature methods (44 , 45 ).
7
Comprehensive Characterization of Fly Ash
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The proximate analysis and ultimate analysis of ES and PC were determined by TGA2000 according to GB/T212-2008 and Vario EL cube according to ASTM D5373-08 and GB/T214-2007, respectively. The calorific values were measured by HKRL-4000B according to GB/T213-2008. The concentrations of Cl− and SO42− were measured using Ion chromatography (Dionex Aquion, USA), the concentrations of HCO3− and CO32− were measured with double-indicator neutralization titration method. The morphology characteristics of the fly ash samples were measured using a scanning electron microscopy (SEM, ZEISS, Sigma 300) at the typical accelerating voltage of 5 kV. The content of each element in fly ash was determined with a Schottky Field Emission SEM-Energy Dispersive Spectrometer (EDX, Hitachi, SU-70). X-ray diffraction (XRD) was carried out with a PANalytical XPERT-3 Powder diffractometer with copper Kα radiation operating at 40 kV and 40 mA in the 3°–80° scan range of 2θ°.
8
Catalyst Characterization by XRD and TGA
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X-ray diffraction (XRD) was carried out on the catalysts using a PANalytical X'Pert3 Powder diffractometer with Cu-Kα radiation at room temperature and 2θ angle between 10 and 90° at 40 kV and 30 mA. The pattern obtained from each sample was further processed using X'PertHighscore Plus software and plotted in Origin 2018b.
Thermogravimetric analysis (TGA) was carried out on the spent catalysts in a TGA/SDTA851e/LF/1600 instrument (Mettler Toledo) connected to a mass spectrometer (TGA-MS). Samples were exposed to air from room temperature to 900°C at 5°C min−1.
Characterization and further analyses on the calcined and reduced sample of the catalyst can be found in our previous patented work (Ketabchi et al., 2019 ).
Thermogravimetric analysis (TGA) was carried out on the spent catalysts in a TGA/SDTA851e/LF/1600 instrument (Mettler Toledo) connected to a mass spectrometer (TGA-MS). Samples were exposed to air from room temperature to 900°C at 5°C min−1.
Characterization and further analyses on the calcined and reduced sample of the catalyst can be found in our previous patented work (Ketabchi et al., 2019 ).
9
X-ray Diffraction Analysis of Samples
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PXRD data of all samples was collected using a PANalytical X'Pert3 Powder diffractometer equipped with a diffracted beam monochromator and a Cu target X‐ray source. Samples were evenly dispersed on a zero‐background Si plate and sealed within an air‐free domed sample holder using Kapton film in the glovebox. Diffraction patterns were collected in the range of scattering angles, 2θ, of 10°–70°.
10
In Situ XRD Analysis of Catalysts
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The ex-situ XRD patterns were obtained by a PANalytical X’pert3 powder diffractometer (40 kV, 40 mA, λCu-Kα = 0.15418 nm) with an acquisition time of 8.5 min in the range of 10−90°. The in situ XRD patterns were obtained from the same machine with an Anton Paar XRK-900 reaction chamber. Samples were loaded in a ceramic sample holder (diameter of 10 mm; depth of 1 mm) and then treated with various conditions. The in situ reaction camber was heated from room temperature to 600 °C (interval: 100 °C) with a ramping rate of 30 °C/min under 5%H2/Ar (30 mL/min). Two rounds of measurements lasting for 20 min were carried out for each selected temperature. The second measurement round was collected and used to determine the structure of the catalysts.
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