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Gemini field emission gun sem300

Manufactured by Zeiss
Sourced in United States

The ZEISS Gemini field emission gun SEM300 is a scanning electron microscope that utilizes a field emission gun as its electron source. It is designed to provide high-resolution imaging of samples at the nanoscale level.

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3 protocols using gemini field emission gun sem300

1

Serial Block Face Scanning Electron Microscopy

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SBF-SEM was performed with a ZEISS Gemini field emission gun SEM300 (Zeiss, Marly-le-Roi, France), equipped with a 3View2XP in situ ultramicrotome (Gatan Inc., Pleasanton, CA, USA). Serial section thickness was set to 30 nm. The block-face was imaged with the accelerating voltage set to 1.2 kV and backscattered electrons were detected with an OnPoint Detector (Gatan Inc.) and a pixel dwell time of 6 µs. Images were acquired in high vacuum mode with magnifications and image sizes adjusted to a final pixel size of 10 nm at specimen level.
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2

Transmission Electron Microscopy Imaging

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The sample on the pin was placed into the carrier that fits into the3View ultramicrotome (3viewXP2- Gatan Inc., Pleasanton, CA, USA) on a ZEISS Gemini field emission gun SEM300 (Zeiss - Marly-le-Roi - France). The block face was imaged with an accelerating voltage at 1.2 kV using the Back scattered electron with a specific BSE Detector (On point - Gatan Inc., Pleasanton, CA, USA).
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3

3View Ultramicrotome SEM Imaging

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The sample on the pin was placed into the carrier that fits into the3View ultramicrotome (3viewXP2-Gatan Inc., Pleasanton, CA, USA) on a ZEISS Gemini field emission gun SEM300 (Zeiss -Marly-le-Roi -France). The block face was imaged with an accelerating voltage at 1.2kV using the Back scattered electron with a specific BSE Detector (On point -Gatan Inc., Pleasanton, CA, USA).
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