Cell counting was performed manually in ImageJ by using the cell counter function and only enumerating cells that were either clearly rod-shaped or round. Ten images at 6000x magnification were randomly selected for each sample and the detection rate was calculated as the proportion of cells with signal under the BSE mode compared to the total cells (i.e. SE mode).
S 3400 sem
The S-3400 SEM is a Scanning Electron Microscope (SEM) manufactured by Hitachi. It is a versatile instrument that provides high-resolution imaging and analysis of a wide range of materials and samples. The S-3400 SEM utilizes a thermionic electron source and can operate in both high and low vacuum modes, allowing it to accommodate a variety of sample types.
Lab products found in correlation
13 protocols using s 3400 sem
Electron Microscopy Imaging of Bacterial Cells
Cell counting was performed manually in ImageJ by using the cell counter function and only enumerating cells that were either clearly rod-shaped or round. Ten images at 6000x magnification were randomly selected for each sample and the detection rate was calculated as the proportion of cells with signal under the BSE mode compared to the total cells (i.e. SE mode).
Exosome Visualization Using SEM
Leaf Micromorphology Analysis Protocol
SEM Characterization of Skin Biomimics
Scanning Electron Microscopy of C. avium in Chickens
Preparation of C. difficile for SEM
Ultrastructural Analysis of Fungal Hyphae
For SEM analysis, hyphae were cultured on PDA medium at 37 °C for 48 hr, and agar blocks containing fungal cells were fixed as described for the transmission electron microscopy analysis. The blocks were then dehydrated by passage through a graded series of ethanol solutions, replaced with isoamyl acetate, and dried using the critical‐point method (EM CPD030; Leica, Germany). After sputter coating with platinum‐palladium (using an E102 Ion sputter; Hitachi, Japan), samples were visualised using an S‐3400 SEM (Hitachi, Japan). The proportion of spike area to the total surface area of each conidium was measured using Image J. For field emission‐scanning electron microscopy analysis, dehydrated samples were visualised on poly‐L‐lysine coated silicon wafers under CrossBeam 550 (Zeiss).
Comprehensive Characterization of Synthesized Compounds
Microstructural Analysis of Fermented Soybean Gels
SEM Analysis of Pollen Morphology
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