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Cm300 fegtem high resolution transmission electron microscope

Manufactured by Philips

The CM300 FEGTEM is a high-resolution transmission electron microscope (TEM) manufactured by Philips. It is designed to provide detailed imaging and analysis of samples at the atomic scale. The CM300 FEGTEM utilizes a field emission gun (FEG) to generate a high-brightness electron beam, enabling the microscope to achieve excellent resolution and image quality.

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3 protocols using cm300 fegtem high resolution transmission electron microscope

1

Characterization of MOF Nanocrystals and Hybrid Nanofibers

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Example 5

Morphology of the MOF nanocrystals and hybrid nanofibers were observed under JEOL JSM 6700 field emission scanning electron microscope at an accelerating voltage of 5 kV. All samples were coated with a thin gold layer before SEM imaging.

TEM images were obtained with Philips CM300 FEGTEM high resolution transmission electron microscope.

Wide-angle X-ray diffraction (XRD) measurements were performed using a Bruker D8 Discover GADDS X-ray diffraction meter with Cu Kα radiation and Raman spectra were recorded on Jobin Yvon T64000 triple spectrograph micro-Raman system.

The metal content in the resultant hybrid carbon fibers was measured by inductively coupled plasma mass spectrometry (ICP-MS) analysis.

The specific surface area and pore size analysis was measured using a Micromeritics ASAP 2020 system.

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2

Characterization of MOF-based Hybrid Mats

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Example 5

Morphology of the MOF particles and hybrid fibrous mats were observed under JEOL JSM 6700 field-emission scanning electron microscope at an accelerating voltage of 5 kV. All samples were coated with a thin gold layer before SEM imaging.

TEM images were obtained with a Philips CM300 FEGTEM high resolution transmission electron microscope.

The specific surface area and pore size analysis was measured using a Micromeritics ASAP 2020 system.

Electrical resistivity of the hybrid carbon fibrous mats was measured using a multimeter.

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3

Characterization of MOF Nanocrystals and Hybrid Nanofibers

Check if the same lab product or an alternative is used in the 5 most similar protocols

Example 5

Morphology of the MOF nanocrystals and hybrid nanofibers were observed under JEOL JSM 6700 field emission scanning electron microscope at an accelerating voltage of 5 kV. All samples were coated with a thin gold layer before SEM imaging TEM images were obtained with Philips CM300 FEGTEM high resolution transmission electron microscope.

Wide-angle X-ray diffraction (XRD) measurements were performed using a Bruker D8 Discover GADDS X-ray diffraction meter with Cu Kα radiation and Raman spectra were recorded on Jobin Yvon T64000 triple spectrograph micro-Raman system.

The metal content in the resultant hybrid carbon fibers was measured by inductively coupled plasma mass spectrometry (ICP-MS) analysis.

The specific surface area and pore size analysis was measured using a Micromeritics ASAP 2020 system.

+ Open protocol
+ Expand

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