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Hr vis high resolution confocal raman microscope

Manufactured by Horiba

The HR VIS high-resolution confocal Raman microscope is an analytical instrument designed to perform Raman spectroscopy. It provides high-resolution spatial imaging and chemical analysis of samples at the microscopic level.

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2 protocols using hr vis high resolution confocal raman microscope

1

Comprehensive Characterization of Boron-Phosphorus Nanosheets

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The morphology and size of BPNS were characterized by TEM (HITACHI, HT7700, 100 kV, Japan) and AFM (Bruker, USA). The hydrodynamic size distribution of BPNS was acquired using a Malvern Zetasizer Nano-ZS instrument (ZEN3600, Malvern Instruments, UK) equipped with a temperature controller. A Horiba Jobin – Yvon Lab Ram HR VIS high-resolution confocal Raman microscope was used to obtain the confocal Raman scattering spectra (excitation wavelength: 633 nm). The XPS spectrum was recorded on an X-ray photoelectron spectroscopy (ESCALAB 250, Thermo Fisher, USA). A UV-Vis spectrophotometer (The Agilent Cary 8454 UV-Visible spectrophotometer, CA, USA) was used to measure the optical absorbance of BPNS species. The infrared thermographic and changes in temperatures of the tumor were recorded by a FLIR E6 infrared camera (Arlington, VA). The EPR data was acquired in a Bruker EMXPlus-10/12 system (MA, USA).
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2

Comprehensive Nanomaterial Characterization Protocol

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SEM was carried out on the ZEISS SUPRA 55 (Carl Zeiss, Germany) field‐emission scanning electron microscope and the EDS data were acquired at an accelerating voltage of 5.0 kV. TEM and high‐resolution transmission electron microscopy (HR‐TEM) were performed on the FEI Tecnai G2 F30 transmission electron microscope at an acceleration voltage of 200 kV. AFM was conducted on the drop‐cast flakes on the SiO2 substrate using the Bruker Dimension Icon atomic force microscope (Bruker, USA). Fourier‐transfer infrared (FTIR) spectroscopy was carried out on the PerkinElmer Frontier with the ATR accessory and XPS was performed on the Thermo Fisher ESCALAB 250Xi. The absorption spectra were obtained on the Lambda25 UV–vis–NIR spectrophotometer and DRS data were acquired on the Shimazu UV‐2450 spectrophotometer. Raman scattering was conducted on the Horiba Jobin Yvon LabRam HR‐VIS high‐resolution confocal Raman microscope equipped with a 633 nm laser. The DSC curves were obtained on the TA Instruments Q20 differential scanning calorimeter at a scanning rate of 5 °C min−1 from 0 to 60 °C under nitrogen at a flow rate of 50 mL min−1. To evaluate the photothermal properties, the temperature change was monitored by an infrared thermal imaging camera (Fluke Ti27, USA).
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