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Vega 3 sb

Manufactured by Tescan Orsay Holding
Sourced in United States

The Vega 3 SB is a scanning electron microscope (SEM) manufactured by Tescan Orsay Holding. It is designed to provide high-resolution imaging and analysis of various samples. The Vega 3 SB utilizes an electron beam to interact with the sample, allowing for the acquisition of topographical, compositional, and other information about the specimen.

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2 protocols using vega 3 sb

1

Scanning Electron Microscopy Analysis of Smear Layer Removal

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The teeth were examined under a scanned electronic microscope (Vega 3 SB, Tescan Orsay Holding, Kohoutovice, Czech Republic). Samples were dried and coated with platinum using a sputter coater (AJA ORION 8, AJA International INC, California, USA), and the samples were scanned by SEM at a magnification of 10,000x, 25,000x, and 100,000x for each (coronal, middle, and apical) third of the root canal. The evaluation of SEM micrographs was carried out by two examiners in a single-blind assessment. The evaluation of smear layer removal was recorded according to Hülsmann et al. [15 (link)] as the following scores:

Score 1: absence of the smear layer and open dentinal tubules

Score 2: a small amount of the smear layer covering the root canal and many dentinal tubules are open

Score 3: a smeared layer covering the walls of the root canal; some dentinal tubules are opened

Score 4: the surface of the root canal is completely covered with a smear layer; the dentinal tubules are not opened

Score 5: a heavy smeared layer and debris cover the surface of the root canal

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2

Nanolayering Analysis of Resin-Dentin Interfaces

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The selected bonded sticks were immersed in ammoniacal silver nitrate solution in darkness for 24 h, rinsed thoroughly in distilled water, and immersed in photo-developing solution for 8 h under a fluorescent light to reduce silver ions into metallic silver grains within voids along the bonded interface (Tay et al., 2002) . Sticks were polished with a wet 600-, 1000-, 1200-, 1500-, 2000-and 2500-grit SiC paper and 1 and 0.25 µm diamond paste (Buehler, Lake Bluff, USA) using a polishing cloth. The specimens were then ultrasonically cleaned, air dried, mounted on stubs, and coated with carbon (MED 010, Balzers Union, Balzers, Liechtenstein). The resin-dentin interfaces were analyzed using a field-emission scanning electron microscope operated in the backscattered mode (VEGA3 SB, TESCAN ORSAY HOLDING, Warrendale, PA, USA).
Three images were captured from each resin-dentin bonded stick. The relative percentage of NL within the adhesive and hybrid layers in each specimen was measured in all images using the public domain Image J software, a Java-based image processing software package developed at the National Institutes of Health (NIH) (Schneider et al. , 2012) by a blinded researcher (Reis et al., 2007) . The mean NL of all sticks from the same tooth was averaged for statistical purposes.
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