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Jms 6700f

Manufactured by JEOL
Sourced in Japan

The JMS-6700F is a field emission scanning electron microscope (FE-SEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analysis of a wide range of materials. The instrument utilizes a field emission electron source to generate a fine electron beam, enabling high-resolution imaging and detailed topographical analysis.

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5 protocols using jms 6700f

1

Characterization of CO₂-Responsive Organogel

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The SEM images were determined from a field emission scanning electron microscope (JMS-6700F, JEOL) operated at 5.0 or 10.0 keV. The SEM samples were prepared by spreading the gel (consisting of NAP-chol 1 at 4 mg/ml in DMSO) on a glass sheet and drying at room temperature under vacuum for 24 h. The resulting xerogel was sputter-coated with 5 nm platinum in a Cressington 328 coating unit, at 40 mA. Transmission electron microscopy (TEM) images were obtained on a JEM-2100F TEM instrument operating at an acceleration voltage of 200 kV. TEM samples were prepared by depositing several drops of the diluted gel mixture onto standard carbon-coated copper grid, followed by drying under vacuum at ambient temperature for 24 h. For the CO2-induced reformed gel, the solvent was volatilized at ambient temperature under atmospheric pressure for 1 week.
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2

Morphological Analysis of Drug Compounds

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The morphology of pure CLT, POX, SLS, PM, and SDs was examined using FE-SEM (JEOL, JMS 6700F, Tokyo, Japan), at an accelerating voltage of 5 kV. Samples were mounted onto a double-sided adhesive tape and sputter-coated with platinum, using an ion sputter.
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3

SEM Analysis of SGP-1-1 Polysaccharide

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The morphology of SGP-1-1 was analyzed by SEM. The dried-polysaccharide fraction was sputtered with gold powder, and its surface features and microstructure were investigated by SEM (JMS6700 F, JEOL Co., Tokyo, Japan) at an accelerating voltage of 8 kV.
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4

Characterization of Au NRs@TiO2 SERS Substrate

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The ultraviolet−visible (UV−Vis) absorption spectra of Au NRs and Au NRs@TiO2 were recorded with a Multiskan spectrum microplate spectrophotometer (Thermo Fisher, Shanghai, China). The size and morphology of Au NRs and Au NRs@TiO2 were inspected using transmission electron microscopy (TEM) TecnaiG2 F20 (FEI, OR, USA). The scanning electron microscopy (SEM) images of the Au NRs@TiO2 SERS substrate were recorded by JMS-6700F (JEOL, Beijing, China). The SERS analysis was measured with an inVia micro-Raman spectrometer (Renishaw, UK). A laser power of 10 mW (output of the laser) under 633 nm was collected through a 50x objective, and the exposure time was 10 s.
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5

Auricularia cornea Microstructural Analysis

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To investigate the effect of HWE and UAE on the microstructure of materials, Scanning Electron Microscopy (SEM) was used to reveal the shape and surface characteristics of samples after extraction [16 (link)]. Dried samples (raw material, residues treated by UAE and HWE) of Auricularia cornea var. Li. were fixed on a specimen holder with the help of doubled-sided adhesive tapes and then sputtered with gold powder. Microstructure was obtained using a Scanning Electron Microscope (JMS-6700F, JEOL Co., Tokyo, Japan) at a 10 kV acceleration voltage.
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