Jms 6700f
The JMS-6700F is a field emission scanning electron microscope (FE-SEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analysis of a wide range of materials. The instrument utilizes a field emission electron source to generate a fine electron beam, enabling high-resolution imaging and detailed topographical analysis.
5 protocols using jms 6700f
Characterization of CO₂-Responsive Organogel
Morphological Analysis of Drug Compounds
SEM Analysis of SGP-1-1 Polysaccharide
Characterization of Au NRs@TiO2 SERS Substrate
Auricularia cornea Microstructural Analysis
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