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Xl30feg scanning electron microscope

Manufactured by Thermo Fisher Scientific
Sourced in United States, Netherlands

The XL30FEG is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of samples. It features a field emission gun (FEG) source, providing high-brightness electron beam for improved spatial resolution and reduced charging effects on samples. The core function of the XL30FEG SEM is to generate and control an electron beam to scan the surface of a sample, allowing for the acquisition of detailed images and compositional information.

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4 protocols using xl30feg scanning electron microscope

1

Cell Fixation and Scanning Electron Microscopy

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Culture samples (5 mL volumes) were fixed in 4% formaldehyde for at least 16 hours. Fixed cells were immobilised by allowing them to settle onto a poly-l-lysine coated 10 mm glass cover slip overnight in a moist chamber. Immobilised cells were further fixed in 1% v/v osmium tetroxide for 1–2 hours at room temperature. Samples were dehydrated at room temperature through a graded ethanol series from 25% ethanol (v/v) to 100% ethanol (v/v) in steps of 25%. Each dehydration step was performed for 15 minutes. Cover slips were then washed twice in hexamethyldilsilazane (HMDS) for 15 minutes and air dried. The cover slip was mounted onto an SEM stub and a conductive gold coating was applied using an Atom Tech ion beam Z705 ultra fine grain coating unit (approx 10 nm thickness). Specimens were examined using a FEI XL30FEG scanning electron microscope at an accelerating voltage of 4 kV and a working distance of 10 mm.
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2

Characterization of FA-Coated Surfaces

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Characterization of FA coated surfaces was performed to observe apatite structure and ordered crystal arrangement using scanning electron microscopy (SEM). SEM analysis was conducted on a Phillips XL30FEG Scanning Electron Microscope (FEI company, OR, United States) operated at 10kV (Resolution: 2.0 nm at 30 kV, 5.0 nm at 1kV). Samples were coated with Au/Pd film to prevent specimen charging.
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3

Scanning Electron Microscopy of Porous Polymer Films

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Surface properties of the porous and the nonporous films were studied
using a FEI XL30 FEG scanning electron microscope (FEI, Eindhoven,
Netherlands). MCL-PHA film samples were mounted on conducting aluminum
stubs and were coated with gold–platinum using an Polaron E5000
Sputter Coater (Quorum Technologies Ltd, Newhaven, East Sussex, UK)
for approximately 2 min before they were imaged using the SEM. The
images were acquired using an acceleration voltage of 10 kV at a 10
cm working distance at the Eastman Dental Institute, University College,
London.
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4

Scanning Electron Microscopy of Cells

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Samples were incubated for 30 min on poly-l-lysine-coated coverslips and allowed to dry. Twenty nanometres of gold was applied to the sample for coating using a Denton Desk II Sputtering System (Denton Vacuum). Coverslips were transferred to a FEI XL-30FEG scanning electron microscope (FEI). Working distance was set to 5 mm and high-resolution mode was used to image the cells. Images were taken at 15.0 kV at designated magnifications. After acquiring the images, the image files were opened in FIJI (http://fiji.sc/Welcome). Scale bars were calibrated and cell length was determined using the multi-measure function.
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