Xl30feg scanning electron microscope
The XL30FEG is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of samples. It features a field emission gun (FEG) source, providing high-brightness electron beam for improved spatial resolution and reduced charging effects on samples. The core function of the XL30FEG SEM is to generate and control an electron beam to scan the surface of a sample, allowing for the acquisition of detailed images and compositional information.
Lab products found in correlation
4 protocols using xl30feg scanning electron microscope
Cell Fixation and Scanning Electron Microscopy
Characterization of FA-Coated Surfaces
Scanning Electron Microscopy of Porous Polymer Films
using a FEI XL30 FEG scanning electron microscope (FEI, Eindhoven,
Netherlands). MCL-PHA film samples were mounted on conducting aluminum
stubs and were coated with gold–platinum using an Polaron E5000
Sputter Coater (Quorum Technologies Ltd, Newhaven, East Sussex, UK)
for approximately 2 min before they were imaged using the SEM. The
images were acquired using an acceleration voltage of 10 kV at a 10
cm working distance at the Eastman Dental Institute, University College,
London.
Scanning Electron Microscopy of Cells
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