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Jsm it200 la

Manufactured by JEOL
Sourced in Japan

The JSM-IT200(LA) is a low-acceleration scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of samples. It features a LaB6 electron source, providing stable and reliable performance. The JSM-IT200(LA) is capable of magnifications up to 300,000x and can operate at low accelerating voltages, making it suitable for the observation of delicate and non-conductive specimens.

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2 protocols using jsm it200 la

1

Scanning Electron Microscopy of Fibers

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The specimens were coated (Quotrum Q150T ES, UK) with 3–5 nm thickness of gold and observed using an SEM (JSM-IT200(LA), JEOL, Tokyo, Japan). Fiber diameters were measured using ImageJ (National Institute of Health, Bethesda, MD, USA) software.
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2

SEM Observation of Bacterial Presence in Cut Tree Peony

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The presence of bacteria in the xylem vessel at the stems end of the cut tree peony ‘Luoyang Hong’ flowers was observed by SEM (JSM-IT200(LA), JEOL, Tokyo, Japan) as described by Li et al. (2017) (link) and Thakur et al. (2022) (link), with some modifications. In brief, Cross-sections of stems (~2 mm length) were excised from the base of each stem using fresh surgical blades every other day. The stem segments were immediately immersed in 0.1 M phosphate buffer (pH 7.2, PBS), and then transferred to 2.5% glutaraldehyde for fixation 6 h at room temperature. After fixation, the stem segments were washed three times with PBS followed by dehydration using graded ethanol series (30%, 50%, 70%, 90% and 100%) of 15 min for each ethanol concentration. The stem segments were eventually dried in a critical point dryer (K850, Quorum Technologies, UK) with liquid CO2. Then, the stem segments were mounted with double-sided carbon tape on SEM stub and coated with platinum using a sputter-coater (JFC-1600, JEOL Japan) for 30 s. The images of sample surfaces were observed at 20 kV accelerating voltage for capturing the digital micrographs.
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