Panalytical xpert pro mpd diffractometer

XRD-measurements were carried out with a Panalytical Xpert pro MPD diffractometer (Malvern Panalytical GmbH, Kassel, Germany) utilizing $Cu{K}_{\alpha 1}/K_{\alpha 2}$ -radiation at 40 kV and 40 mA. Detailed analysis of the diffractograms was performed via Rietveld refinement within the software MAUD (Luca Lutterotti, version 2.7, Trento, Italy). Scanning electron microscopy (SEM) measurements were done on a FEI Quanta 400f (Thermo Fischer Scientific, Gräfelfing, Germany), transmission electron microscopy (TEM) and selected area diffraction (SAED) as well as energy-dispersive X-ray (EDX)measurements on a JEOL 2200FS (JEOL, Freising, Germany).

X-ray diffraction (XRD) analysis was used to confirm the crystal structure of ZnO and TiO₂ NPs in commercial dispersions. The diffraction patterns were collected using a PANalyticalX’Pert Pro MPD diffractometer in Bragg Brentano reflection geometry (Malvern Panalytical Ltd., Malvern, England). The diffractometer was equipped with Cu Kα radiation source (λ = 1.5418 Ĺ). Data was collected in the 2θ range of 5–90°.
Dynamic light scattering (DLS) was used to determine the size and the size distribution profile of ZnO and TiO₂ particles in dispersions. The Particle Sizing System NICOMP 380, a product of Nicomp, (Santa Barbara, CA, USA) was used. The measurements were performed at the temperature of 23 °C. Data were acquired and processed by CW388 software (version 1.55, Nicomp, Santa Barbara, CA, USA).