The secondary electron images were collected using scanning electron microscopy (SEM, TESCAN MIRA LMS, Brno, Czech Republic) for microscopic min eral morphology. The ITZ between the TS paste and the CG particles was investigated by collecting backscattered electron images (SEM-BSE, TESCAN MIRA LMS, Brno, Czech Republic). The samples were also used for X-ray diffraction analysis (XRD, Rigaku SmartLab SE, Tokyo, Japan) according to the mixture ratios of SCFBs without the use of TS and CG. The sample was ground into a powder with a particle size of less than 0.075 mm and scanned from 5° to 60° at a speed of 10 °/min.
Mira lms
Manufactured by TESCAN
Sourced in Czechia
The MIRA LMS is a high-performance scanning electron microscope (SEM) designed for a wide range of applications. It features a large specimen chamber, high-resolution imaging, and advanced analytical capabilities.
Automatically generated - may contain errors
Lab products found in correlation
K alpha, by Thermo Fisher Scientific (10 mentions)
Nicolet is50, by Thermo Fisher Scientific (4 mentions)
Smartlab, by Rigaku (3 mentions)
D2 phaser, by Bruker (2 mentions)
Smartlab se, by Rigaku (2 mentions)
K alpha x ray photoelectron spectrometer, by Thermo Fisher Scientific (2 mentions)
D8 advance, by Bruker (2 mentions)
F 7000, by Hitachi (2 mentions)
K alpha spectrometer, by Thermo Fisher Scientific (2 mentions)
Escalab 250xi, by Thermo Fisher Scientific (2 mentions)
Thermo scientific k alpha, by Thermo Fisher Scientific (1 mentions)
Discovery tga 550, by TA Instruments (1 mentions)
Tsq quantum access max hplc ms instrument, by Thermo Fisher Scientific (1 mentions)
Nicolet is50 ftir spectrometer, by Thermo Fisher Scientific (1 mentions)
Avance 3 hd 600 mhz spectrometer, by Bruker (1 mentions)
Nicolet is5 infrared, by Thermo Fisher Scientific (1 mentions)
Zetasizer nano z, by Malvern Panalytical (1 mentions)
Asap 2460, by Micromeritics (1 mentions)
Sc7620, by TESCAN (1 mentions)
Avance model drx 500, by Bruker (1 mentions)
44 protocols using mira lms
1
Microscopic Mineral Morphology and XRD Analysis
2
Characterization of PS Microspheres
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The images of different PS microspheres were observed by scanning electron microscopy (Tescan MIRA LMS, Resolution: 0.9 nm @ 15 Kv (secondary electron image); 2.0 nm @ 30 Kv (backscattered electron image), accelerating voltage: 200 v–30 kv, probe beam current: 1 pA–100 nA, stability better than 0.2%/h, magnification: 8×–100,000×), and the average particle size and particle size distribution of the microspheres were analyzed by dynamic light scattering (DLS, Nano ZS ZEN3600). A trace sample was glued directly onto the conductive adhesive and sprayed with gold using a Quorum SC7620 sputter coater for 45 s at 10 mA, followed by a TESCAN MIRA LMS scanning electron microscope to photograph the sample morphology, which was accelerated at 3 kV. In probability theory and statistics, the coefficient of variation (CV), also known as relative standard deviation (RSD), is a standardized measure of the dispersion of a probability distribution or frequency distribution. The CV is equal to the standard deviation (SD) divided by the mean. The particle size distribution was evaluated by CV: the larger the CV, the wider the particle size distribution. For ideal monodisperse microspheres, the CV is 0. For most commercially available monodisperse microspheres, this value usually ranges from 10% to 20%. If the CV is higher than 20%, the particle size distribution is too wide.
3
Characterization of Metal Ion-Modified Ti-6Al-4V Implants
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The surface chemical composition of the metal ion-modified Ti-6Al-4V implants was analyzed by a Fourier transform infrared spectroscopy (Thermo Fisher IN10, USA) in the 400-4,000 cm-1 range (Supplementary Figure S1 ). The surface topography analysis of the metal ion-modified Ti-6Al-4V implants was achieved using a scanning electron microscope (TESCAN MIRA LMS, Czech Republic). The surface element mapping of the metal ion-modified Ti-6Al-4V implants was observed using an EDS energy spectrometer with a scanning electron microscope (TESCAN MIRA LMS, Czech Republic). Skyscan 1176 micro-CT (Bruker, Kontich, Belgium) was performed to collect data from samples at the Institute of Hydrobiology, Chinese Academy of Sciences (Wuhan, China). The compressive strength test was mainly based on a porous model (φ3 × 3). The samples were placed on the pressure table of a universal material testing machine (CMT6103, USA), and the loading speed of the indenter was set to 1 mm/min. The degradation of metal ion-modified Ti-6Al-4V implants was investigated in vitro by immersing the samples in phosphate-buffered saline (PBS), the content of metal ions was measured by inductively coupled plasma atomic emission spectrometry (Agilent 720ES, USA).
4
Comprehensive Material Characterization Protocol
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Scanning electron microscopy (SEM) is carried out using TESCAN MIRA LMS (TESCAN, Brno, The Czech Republic) to characterize the morphologies of samples. X-ray diffraction (XRD) is carried out using Ultima-IV (Origin Systems, Austin, TX, USA) to identify the phase structure of samples. Fourier transform infrared (FTIR) spectra are obtained on a Niolet iN10 spectrometer (Thermo Fisher Scientific). X-ray photoelectron spectroscopy (XPS) spectra data are obtained on Thermo Scientific K-Alpha+ (Thermo Fisher Scientific, Waltham, MA USA). Thermogravimetric analysis testing (TGA) is measured using Discovery TGA 550 (TA Instruments, New Castle, DE, USA) from room temperature to 800 °C at a heating rate of 10 °C min−1 under a nitrogen atmosphere. The uniaxial tensile tests are conducted on Inspekt Table Blue 5KN testing machine (Hegewald & Peschke, Nossen, Germany). Samples are cut into the size of 150 mm × 15 mm × 1.25 mm and tested with a crosshead speed of 30 mm min−1. The lithium metal electrodes used for SEM and XPS characterization are cleaned with DME several times and dried in an Ar-filled glove box.
5
Characterization of Organic Compounds
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The infrared spectra (KBr particle method) were recorded on the Nicolet is 50 FT-IR spectrometer (Thermo Scientific Co., Ltd, Madison, WI, USA). 1H NMR, 13C NMR spectra were recorded in CDCl3 solvent on Bruker Avance III HD 600 MHz spectrometer (Bruker Ltd, Zurich, Switzerland). The chemical shifts were expressed in ppm (δ) relative to TMS as internal standard. Other reagents were purchased from commercial suppliers and used as received. The mass spectra were recorded on a TSQ Quantum Access MAX HPLC-MS instrument (Thermo Scientific Co., Ltd, Waltham, MA, USA). Melting points were determined on a MP420 automatic melting point apparatus (Hanon Instruments Co., Ltd, Jinan, China), and were not corrected. SEM was recorded on scanning electron microscope (TESCAN MIRA LMS, Czech). Other reagents were purchased from commercial suppliers and used as received.
6
Characterization and Microwave Absorption of Fe3Al/CNTs Composite
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The morphology of the powders was characterized by scanning electron microscopy (TESCAN MIRA LMS). The crystal structure and phase composition of the powders were analyzed by a Bruker D8-Advance X-ray electron diffractometer (Cu Kα radiation with an accelerating voltage of 40 kV and a current of 35 mA). The CNT signals in the composite powders were characterized by a Thermo Scientific Nicolet iS5 infrared spectrometer. For measurement of the microwave absorption properties, the Fe3Al/CNTs composite powder was mixed in paraffin wax at the mass ratio of 4 : 1, which was then pressed into a ring specimen with an inner diameter of φ 3.04 mm and an outer diameter of φ 7.00 mm.32 For comparison, other samples were prepared with the Fe3Al-1.5%CNT composite/paraffin wax mass ratios of 3 : 2, 2 : 3, and 1 : 4, respectively. The electromagnetic parameters in the range of 2–18 GHz were determined using a vector network analyzer (N5225B) and a coaxial line test method. To collect more reliable results, three samples were prepared for each Fe3Al/CNTs composite with the same CNT content. Data would be selected only if all 3 samples showed similar results.
7
Characterization of Magnetic MIL-68(Ga) Composite
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The morphology and energy dispersive spectroscopy (EDS) mapping of magnetic MIL-68(Ga) were performed by scanning electron microscope (SEM) (TESCAN MIRA LMS, Brno, Czech). The crystallinity of the synthesized MIL-68(Ga) powder and magnetic MIL-68(Ga) composite was determined using an X-ray diffractometer (XRD) (Bruker D2 PHASER, Karlsruhe, Germany). Inductively Coupled Plasma Mass Spectrometry (ICPMS) (Agilent 7700, Palo Alto, Santa Clara, CA, USA) was used to measure the concentration of Pb2+, Ga2+ and Cu2+. Magnetic properties of the materials were characterized using a vibrating sample magnetometer (VSM) (LakeShore7404, Columbus, OH, USA). The functional groups of magnetic MIL-68(Ga) were detected by a Fourier transform infrared (FT-IR) spectrometer (Thermofisher Scientific, Nicolet iS50, Waltham, MA, USA). Zeta potential was analyzed by Nano-particle analyzer (Malvern Panalytical, Zetasizer Nano ZS, Malvern, UK). Brunauer–Emmett–Teller (BET) surface area analysis was performed by surface area and pore analyzer (Micromeritics, ASAP 2460, Norcross, GA, USA).
8
Characterization of Polymer Samples
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The functional group structures of the samples were characterized by FTIR (Nicolet iS20, Thermo, Waltham, MA, USA). The resolution was 4 cm−1, the number of scans was 32, and the range of wavenumbers tested was 600–4000 cm−1. The molecular structures of the samples were characterized by 1H NMR (AVANCE Model DRX-500, Bruker, Karlsruhe, Germany), and the 1H NMR spectra of the samples were obtained by dissolving the samples in D2O. The structures of the samples were characterized by XRD (MiniFlex 600 model, Rigaku, Tokyo, Japan) with a scanning range of 5–85° and a scanning speed of 8°/min. After the samples were sprayed with gold using a Quorum SC7620 sputter ion coater, their surface morphology was determined by SEM (MIRA LMS, TESCAN, Brno, Czech Republic). The thermal decomposition properties of the polymers were determined by a thermogravimetric analyzer(SDT-650, TA, Newcastle, DE, USA). The temperature was increased from room temperature to 700 °C at a heating rate of 10 °C/min and a nitrogen flow rate of 100 mL/min.
9
Comprehensive Material Characterization Protocol
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FT-IR analysis: Fourier transform infrared spectroscopy (FT-IR) was used on a VERTEX 70 spectrophotometer (Bruker, GRE) under a dry air condition at room temperature by the KBr pellets method. Scanning electron microscope (SEM) test was performed on TESCAN MIRA LMS. Elemental analysis was performed on Vario EL CUBE. ICP-MS test was performed on Agilent 5110(OES). X-ray photoelectron spectroscopy (XPS) was performed on Thermo Scientific K-Alpha, and the spectra were charge-corrected using a signal located at 284.5 eV. Small-angle X-ray scattering (SAXS) was performed on SAXSess mc2. UV-vis spectra were performed on Hitachi U4150. Powder XRD was performed on D8 ADVANCE A25. Raman spectra analysis were performed on Horiba LabRAM HR Evolution.
10
Morphology and Electrochemical Properties of PtNi-PANI Catalysts
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The top-view morphologies of Ni, PtNi and PtNi-PANI films were observed by a scanning electron microscope (SEM, TESCAN MIRA LMS), and the elemental mapping of the optimized PtNi-PANI was characterized. The contact angle was measured by SDC-350KS and the angle measurement method is used to Young–Laplace equation fitting. The active surface areas of PtNi and PtNi-PANI materials were determined by testing the double-layer capacitance (Cdl) at the potential window of −0.21 to −0.11 V and subsequently back to −0.21 V, employing cycle voltammetry (CV) characterizations at different scan rates of 20 mV s−1, 40 mV s−1, 60 mV s−1, 80 mV s−1 and 100 mV s−1.
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