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Invia raman spectrometer

Manufactured by Thermo Fisher Scientific

The InVia Raman Spectrometer is a high-performance analytical instrument designed to provide detailed molecular and structural information about samples. The core function of the InVia Raman Spectrometer is to measure the inelastic scattering of monochromatic light, known as the Raman effect, to identify and characterize the chemical composition and structure of materials.

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3 protocols using invia raman spectrometer

1

Characterization of Fabricated MoS2 Nanomaterial

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Scanning electrons microscopy (SEM, JEOL JSM-6500F) and AFM (Scanning Probe Microscopy 5500, Agilent Technologies) were used to investigate morphology of the as-deposited MoS2 sample. Raman spectroscopy (InVia Raman Spectrometer, with 532 nm excitation laser) and X-ray photoelectron spectroscopy (XPS, Thermo Scientific Theta Probe XPS System MC03) were utilized to characterize the vibrational modes and elemental composition of as-fabricated nanomaterial.
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2

Graphene Oxide-Based Electrochemical Sensing

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Luteolin, zirconium tetrachloride, terephthalic acid, hydrochloric acid, ethanol and N,N-dimethylformamide (DMF) were purchased from Shanghai Aladdin Biochem Technology Co., Ltd. (Shanghai, China). Graphene oxide was purchased from Nanjing XFNANO Materials Tech Co., Ltd. (Nanjing, China). Chrysanthemums (A), chrysanthemums (B) and hawthorns were bought at local supermarket in Xiangtan, China. Several kinds of polishing powders were bought from Shanghai Chenhua Instrument Company (Shanghai, China). Ultrapure water (18.25 MΩ cm) was obtained from a Millipore system (Millipore Corporation, Milford, MA, USA). All other chemicals were of analytical grade without further purification.
The electrochemical measurements were accomplished on a CHI660E electrochemical workstation (Shanghai Chenhua Instrument Company, Shanghai, China) using a standard three electrode system. The observations were completed by HSM 6610Lv scanning electron microscopy (JEOL, Tokyo, Japan) operated at 25 kV. A Bruker D8 advance X-ray diffractometer was used to study the crystalline structures of the powder samples. The Raman and FTIR spectra of samples were achieved using a Renishaw Invia Raman spectrometer and Thermo Scientific Nicolet iS10 spectrometer, respectively.
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3

Comprehensive Material Characterization

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The TEM images were carried out on a Titan Themis G2 60-300 (Thermo Fisher, United States). Nitrogen physisorption isotherms were measured on a TriStar II 3flex instrument. XRD patterns were obtained utilizing a D8 ADVANCE (Bruker, Germany). XPS was performed by Thermo ESCALAB 250XI (Thermo Fisher, United States) with an X-ray source (Mg Kα hυ = 1486.6 eV). Raman spectra were measured by a Renishaw inVia Raman spectrometer (Thermo Fisher DXRxi). All the UV-vis absorption spectra were performed by a microplate reader (Tecan Spark, Switzerland). The ESR spectra were obtained from an ESR spectrometer (Bruker EMX plus, Germany).
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