Rtespa probe
The RTESPA probe is a lab equipment product from Bruker. It is designed for nuclear magnetic resonance (NMR) spectroscopy applications. The probe's core function is to generate and detect radio frequency (RF) signals for the purpose of NMR experiments.
Lab products found in correlation
13 protocols using rtespa probe
Dendrimer Assembly Characterization by DLS and AFM
Atomic Force Microscopy of Bdellovibrio
Atomic Force Microscopy of Exosomes
Comprehensive Characterization of Textile Composites
Fourier transformed infrared analysis (FT-IR) of the composites, as well as of the cotton textiles, was conducted on a Nicolet iS10 (Waltham, MA, USA) with an attenuated total reflectance (ATR) accessory with a diamond tip. Each sample was scanned 64 times at a wavelength of 4000–400 nm.
Tensile testing was carried out on a MTS TestSuite
The composites and cotton textiles were observed using a scanning electron microscope Nova NanoSEM200 (FEI, Hillsboro, OR, USA) at low vacuum, using a low vacuum detector (LV), and a NT-MDT NTEGRA Prima AFM at room temperature, with a RTESPA probe (Bruker, Mexico City, Mexico) of spring constant k = 40 N/m in intermittent contact mode. Images of height, deflection, and phase were obtained; 100 × 100 and 20 × 20 µm2 image sizes were captured systematically for each sample in the three different regions. They were analyzed with Nova 3.1 to obtain the average roughness and morphological aspect of the composites.
Nanoscale Characterization of Polymer Composites
The Atomic Force Microscopy (AFM) images were obtained using a Bruker Dimension Icon microscope. A thin slice of the sample was mounted onto a metallic disc glued with double-sided tape, and, for the electrical measurements, a thin layer of silver paint was used to connect the sample surface to the metallic disc and the microscope stage. Given the fact that Young’s moduli of PEDOT:PSS and PLGA are of the order of a few GPa [43 (link),44 (link)], for the nanomechanical measurements performed using the Quantitative Nanomechanics kit from Bruker, a Bruker RTESPA probe (nominal spring constant, k = 40 N/m, tip radius 8 nm) was selected since it is the one recommended for Young’s modulus ranging from 0.2 to 8.1 GPa. On the other hand, to obtain the surface potential maps by means of Kelvin Probe Force Microscopy (KPFM), a Bruker PFQNE-AL probe was used (k = 0.8 N/m, tip radius 5 nm). In this case, the work function of the tip was measured by using a gold/aluminum calibration sample (Bruker PFKPFM-SMPL) since the work function of gold can be averaged to 5.38 eV [45 ].
AFM Characterization of Tumor Exosomes
Quantitative Nanomechanical Mapping of Cancer Cells
Fungal Cell Surface Nanomechanics Analysis
Algal Cell Surface Characterization by AFM
Atomic Force Microscopy Protocol for Collagen Morphology
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