Jsm 6400 sem
The JSM-6400 is a scanning electron microscope (SEM) manufactured by JEOL. It is designed to produce high-resolution images of samples by scanning them with a focused beam of electrons. The JSM-6400 SEM is capable of magnifying specimens up to 300,000 times, providing detailed information about the surface topography and composition of a wide range of materials.
Lab products found in correlation
15 protocols using jsm 6400 sem
Cuprous Oxide Morphology Characterization
SEM Visualization of Biofilm Morphology
Staphylococcal Cell Morphology under APLss
Gunshot Residue Analysis by SEM
Nanofiber Morphological Analysis via SEM
The diameters of the fibers were measured using ImageJ software (
Scanning Electron Microscopy of Fungal Inhibition
Scaffold Characterization via SEM Analysis
Collagen Gel Fixation and SEM Imaging
[17 (link)]. Briefly, samples were prefixed in 2.5% v/v glutaraldehyde at 4°C for 4 hrs and washed with 0.1 M sodium cacodylate buffer. After overnight incubation, samples were post-fixated in 1% osmium tetraoxide. Samples were then dehydrated using a graded series of ethanol followed by immersion in 100% acetone. The samples were then transferred to a Baltec CPD 030 Critical Point Dryer for critical point drying. Samples were coated with gold-palladium in a Baltec SCD 005 Sputter Coater and examined under JEOL JSM-6400 SEM.
SEM Characterization of Thermocycled Specimens
Ultrastructure Analysis of Polymicrobial Biofilms
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