D max 2550 5 x

Manufactured by Rigaku

The D/max 2550 V X-ray diffractometer is a versatile laboratory instrument designed for a wide range of materials characterization applications. It features a high-intensity X-ray source and precision goniometer for accurate and reliable crystallographic analysis.

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Lab products found in correlation

Jsm 6700f sem, by JEOL (1 mentions) Jem 2010f tem, by JEOL (1 mentions)

2 protocols using d max 2550 5 x

Crystal Structure Analysis by XRD

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The crystal structure of the precipitated crystals was tested by Rigaku D/max 2550 V X-ray diffractometer (XRD). The working voltage and current were 40 kV and 100 Ma, respectively, and the measurement range of 2 θ was 5–80°.

Zhao J., Luo H, & Huang X. (2020). Migration, Crystallization and Dissolution Changes of Salt Solution with Color Rendering Property in Porous Quartz Materials. Molecules, 25(23), 5708.

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Comprehensive Materials Characterization Protocol

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The functional groups were
detected by employing a Nicolet 380 Fourier transform infrared (FT-IR)
spectroscopy. The morphology and structure of the samples were observed
through a JEOL JSM-6700F SEM and a JEOL JEM-2010F TEM. The physical
phase was determined using a Rigaku D/max-2550 V X-ray powder diffractometer
with a Cu-Kα radiation source. The information about surface
chemical composition and state of the samples were given using a Renishaw
inVia Microscope Raman spectrometer and a Perkin Elmer PHI ESCA-5000C
X-ray photoelectron spectroscopy (XPS) analyzer. The pore size distribution
and specific surface area were researched using an ASAP 2010 M + C
analyzer. TGA curves were obtained using a NETZSCH STA 409 PG/P thermogravimetric
analyzer.

Zhang Y., Tang Y.C., Li X.T., Liu H., Wang Y., Xu Y, & Du F.H. (2022). Porous Amorphous Silicon Hollow Nanoboxes Coated with Reduced Graphene Oxide as Stable Anodes for Sodium-Ion Batteries. ACS Omega, 7(34), 30208-30214.

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