Fourier transform infrared (FT-IR) spectra were acquired on a TENSOR27 FTIR spectrometer (Bruker, Germany) in the wavenumber range from 4000 cm−1 to 400 cm−1. The ultraviolet-visible (UV-vis) spectrogram was conducted on a UV-2550 spectrophotometer (Shimadzu, Japan). The fluorescence spectra were obtained by G9800A Cary Eclipse fluorescence spectrophotometer (Agilent, USA). X-ray photoelectron spectroscopy (XPS) characterization was performed with PHI5000 VersaProbe-II with monochromatized Al Kα radiation (ULVAC-PHI, Japan). The size and the morphology of carbon dots were analyzed under a TecnaiG2 F30 S-Twin (FEI, USA) transmission electron microscope. The pH was adjusted with HCl or NaOH solutions and monitored by employing a digital pH-meter (PHS-3, Shanghai, China).
G9800a cary eclipse fluorescence spectrophotometer
Manufactured by Agilent Technologies
Sourced in United States
The G9800A Cary Eclipse fluorescence spectrophotometer is a high-performance analytical instrument designed for the measurement of fluorescence and phosphorescence in a wide range of sample types. It features a high-intensity xenon flash lamp, dual monochromators, and a photomultiplier tube detector, enabling precise and sensitive fluorescence measurements.
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2 protocols using g9800a cary eclipse fluorescence spectrophotometer
1
Comprehensive Characterization of Carbon Dots
2
Characterization of Carbon Dots
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A quartz cell (1 cm × 1 cm)-equipped Agilent G9800A Cary Eclipse fluorescence spectrophotometer (USA) was applied to record the fluorescence spectrum. The emission and excitation monochromatic slit widths were both fixed at 10 nm. A TENSOR-27 FTIR spectrometer was used to record the FT-IR spectrum (Bruker, Bremen, Germany). Utilizing a UV-2550 spectrophotometer, the ultraviolet-visible (UV-vis) spectrum was recorded (Shimadzu, Kyoto, Japan). PHI5000 Versa Probeqy-II with monochromatized Al K light was used to characterize X-ray photoelectron spectroscopy (XPS) (ULVAC-PHI, Kanagawa, Japan). X-ray diffraction (XRD) patterns were recorded by a PANalytical X’pert3 powder diffractometer using Ni-filtered Cu Ka radiation. Using a transmission electron microscope, TecnaiG2 F30 S-Twin (FEI, Hillsboro, OR, USA) was applied to analyze the size and appearance of carbon dots. Carbon dots were synthesized using the Analytik-Jena TOPwave microwave-assisted digesting system (Jena, Germany). Using a Leici PHS-3 digital pH meter, the pH was controlled (Shanghai, China).
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