SEM images were used to analyze the surface morphology of resistant bacteria C10 after exposure to ceftazidime. At each time point of the short-term exposure experiments, the aliquots were centrifuged at 3000g for 5 min. The pellets were washed three times with 0.1 M phosphate buffer (pH 7.4), and fixed in 0.1 M phosphate buffer (pH 7.4) containing 2.5% glutaraldehyde at 4 °C for 4 h. After rinsing twice with 0.1 M phosphate buffer (pH 7.4), the pellets were dehydrated in acetone serials (30%, 50%, 70%, 80%, 90%, and 100%) and isoamyl acetate (15 min per step), and then air-dried. The images were obtained using the JSM-7800F SEM (JEOL, Japan) at 5.0 kV.
Jsm 7800f sem
Manufactured by JEOL
Sourced in Japan
The JSM-7800F is a field emission scanning electron microscope (FE-SEM) designed for high-resolution imaging and analysis of a wide range of samples. The instrument features a high-brightness field emission gun, advanced electron optics, and a variety of detection systems to provide detailed information about the surface topography, composition, and other characteristics of the sample being examined.
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Lab products found in correlation
7 protocols using jsm 7800f sem
1
SEM Analysis of Resistant Bacteria
2
Scanning Electron Microscopy Analysis of Film Surfaces
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The surfaces of the films were analyzed with scanning electron microscopy (SEM) using a JEOL JSM-7800F SEM (JEOL UK, Welwyn Garden City, UK).
3
Ultrastructure Analysis of Mature Mouse Brains
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At six months after birth, IDS-KO and wild-type mice (n = 3 per group) were perfused and fixed with a 2% glutaraldehyde (GA)–4% paraformaldehyde (PFA) mixture under general anesthesia. The brains were removed and further fixed with 4% paraformaldehyde at 4 °C overnight. Coronal slices (100 μm thick) were prepared, post-fixed in osmium, dehydrated, and embedded in epoxy resin. Ultrathin (70 nm) cortical sections were cut, mounted on pieces of silicon wafers, and contrasted with uranyl acetate and lead citrate.
Scanning electron microscopic images of the brain specimens were obtained using a backscattered electron detector (BED-C; voltage, 7 kV; PC current, 1.8 nA; work distance, 6) in a JSM-7800F SEM (JEOL, Tokyo, Japan).
Scanning electron microscopic images of the brain specimens were obtained using a backscattered electron detector (BED-C; voltage, 7 kV; PC current, 1.8 nA; work distance, 6) in a JSM-7800F SEM (JEOL, Tokyo, Japan).
4
Automated Counting of Autophagy-like Cells
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We used the automatic acquisition system of sequential EM images to count autophagy-like cells in wider fields of the brain tissues. We used JEOL’s JSM-7800F SEM, with BED-C at a voltage of 7 kV, a current of 1.8 nA, and a work distance of 6 mm.
5
Carp Scale and Skin Microstructure Analysis
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The microstructure of scale and skin of carp samples were characterized using SEM. After the sample was frozen and fixed at −80 °C, it was moved to a vacuum freeze-dryer for drying, then mounted on a metal stub, coated with Pd, and imaged by a JSM-7800F SEM (JEOL Ltd., Tokyo, Japan) which operated at 10 kV.
6
Perovskite Film Morphology Analysis
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The morphology of the perovskite films was recorded by using a JEOL JSM-7800F SEM.
7
SEM Analysis of Hybrid Nanowire Morphology
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A JEOL JSM-7800F SEM was
used to investigate the morphology of the hybrid NW. Standard operating
conditions for these samples are a 15 kV accelerating voltage and
a 10–15 mm working distance with a secondary electron detector.
Depending on the imaging requirements and investigating materials,
we also used a 30° tilted viewing angle. Further, for a detailed
surface morphology investigation of the hybrid facets we used a 2–5
kV accelerating voltage with a 5 mm working distance, which helped
us gain information about the roughness and residual metals.
used to investigate the morphology of the hybrid NW. Standard operating
conditions for these samples are a 15 kV accelerating voltage and
a 10–15 mm working distance with a secondary electron detector.
Depending on the imaging requirements and investigating materials,
we also used a 30° tilted viewing angle. Further, for a detailed
surface morphology investigation of the hybrid facets we used a 2–5
kV accelerating voltage with a 5 mm working distance, which helped
us gain information about the roughness and residual metals.
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