Scanning electrons microscopy (SEM, JEOL JSM-6500F) and AFM (Scanning Probe Microscopy 5500, Agilent Technologies) were used to investigate morphology of the as-deposited MoS2 sample. Raman spectroscopy (InVia Raman Spectrometer, with 532 nm excitation laser) and X-ray photoelectron spectroscopy (XPS, Thermo Scientific Theta Probe XPS System MC03) were utilized to characterize the vibrational modes and elemental composition of as-fabricated nanomaterial.
Theta probe xps system mc03
Manufactured by Thermo Fisher Scientific
The Theta Probe XPS System MC03 is a X-ray photoelectron spectroscopy (XPS) instrument designed for surface analysis. It provides detailed information about the chemical composition and electronic structure of a sample's surface.
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2 protocols using theta probe xps system mc03
1
Characterization of Fabricated MoS2 Nanomaterial
2
Comprehensive Characterization of WS2 Nanofilms
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Optical microscope (Nikon LV200) and AFM (Scanning Probe Microscopy 5500, Agilent Technologies) were employed to measure the surface morphology of WS2 nanofilms. Raman spectroscopy (InVia Raman Spectrometer, excited with 532 nm laser) was utilized to characterize the vibrational modes, while scanning electrons microscopy (SEM, Zeiss EVO50XVP, with EDX system of Oxford Instruments INCA 250) and X-ray photoelectron spectroscopy (XPS, Thermo Scientific Theta Probe XPS System MC03, Al K α source) were operated to analyze the elemental composition.
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