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Lambda 950 pka

Manufactured by PerkinElmer
Sourced in United States

The Lambda 950-PKA is a high-performance UV-Vis-NIR spectrophotometer designed for a wide range of applications. It features a dual-beam optical system and a range of wavelengths from 175 to 3300 nm. The instrument provides accurate and reliable measurements for various sample types.

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6 protocols using lambda 950 pka

1

Photophysical Properties of BN Compounds

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All solvents were used as purchased from the Tokyo Chemical Industry (Tokyo, Japan) or Fuji Film-Wako Chemicals (Tokyo, Japan). All synthesis procedures for BN1-4 were provided in the previous report (Ando et al., 2019 (link)). Absorption spectra of the samples were measured using an ultraviolet–visible,-near-infrared spectrometer (Lambda 950-PKA, Perkin-Elmer, MA, United States). Fluorescence and phosphorescence spectra were measured using a spectrofluorometer (FP-8600, JASCO International, Japan). The photoluminescence quantum yield (PLQY) was measured using a PLQY measurement system (Quantaurus-QY, Hamamatsu Photonics, Hamamatsu, Japan). The transient PL decay characteristics of BN4 in toluene were recorded by a dynamic range streak camera system (C10910-01, Hamamatsu Photonics, Hamamatsu, Japan) with a third harmonic YAG laser (355 nm, 10 Hz, PL-2250, EKSPLA, Lithuania) as an excitation source. The transient PL emission and PL decay of BN1, 2, 3, and 4 doped in a DPEPO host film were recorded under vacuum with a streak camera (C4334, Hamamatsu Photonics, Hamamatsu, Japan) with a third harmonic YAG laser (266 nm, 10 Hz, LS-2132UTF, LOTIS TII, Belarus) as an excitation source.
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2

Photophysical Characterization of Thin Films

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UV-vis absorption spectra were recorded using a Perkin-Elmer Lambda 950-PKA instrument. Fluorescence and phosphorescence spectra at RT and 77 K were recorded by an FL980 spectrometer (Edinburgh Instrument) equipped with a gated photomultiplier tube. Transient PL decay profiles, time-resolved emission spectra, and temperature-dependent PL spectra were measured on a FL980 spectrometer (Edinburgh Instrument), excited with a 320 nm laser diode. The transient lifetime measurements were conducted in vacuum. For the temperature-dependence measurement, an Oxford Instruments liquid nitrogen cryostat (Optistat DN) was adopted. PLQYs of films were measured by a calibrated integrating sphere (Edinburgh Instrument) excited at 320 nm in FL980.
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3

Photophysical Characterization of Optoelectronic Materials

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UV–vis absorption spectra were recorded using the Perkin‐Elmer Lambda 950‐PKA instrument. Fluorescence and phosphorescence spectra were recorded by a FluoroMax‐4 spectrofluorometer. Transient PL decay spectra were conducted on FLS980 (Edinburgh Instrument), in which the prompt component in the nanosecond scale was measured with a TCSPC laser and the delayed component in microsecond scales was measured with a microsecond flash lamp. Their delayed spectra were measured in FLS980 utilizing a time‐gated controller. Temperature‐dependent PL spectra and transient PL decay spectra of the film samples were also measured on FLS980 equipped with Oxford Instruments nitrogen cryostat (Optistat DN) for temperature control. PLQYs of the films were measured on FLS980 utilizing an integrating sphere, while the PLQYs of the solutions were measured utilizing a QE 2000 quantum efficiency measurement system (Otsuka Electronics). The singlet and triplet energies were calculated using the onset of the emissions (Figure S21, Supporting Information).
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4

Organic Optoelectronic Device Fabrication

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All organic layers were formed by thermal evaporation under high-vacuum conditions (<10−4 Pa). Organic films with a thickness of 50 nm were grown on precleaned quartz substrates. The non-injecting devices were fabricated on clean tin-doped indium oxide (ITO) glass substrates and had an effective device area of 4 mm2. The device structure for external-electric-field-modulated luminescence measurements was ITO (100 nm)/T2T (30 nm)/EML (100 nm)/CBP (30 nm)/aluminum (Al) (100 nm), with ITO as the anode, T2T as the hole-blocking layer, CBP and TPA-DCPP co-deposited as the emissive layer, neat CBP as the electron-blocking layer, and Al as the cathode. After device fabrication, the devices were immediately encapsulated with glass lids and epoxy glue in a dry nitrogen-filled glove box. PLQY of the samples and the PL spectrum were measured using an absolute photoluminescence quantum yield measurement system (C11347-01, Hamamatsu Photonics). Absorption spectrum of the samples was recorded on ultraviolet-visible spectrometer (Lambda 950-PKA, PerkinElmer).
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5

Photophysical Characterization of Solid-State Emitters

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A spectrophotometer (LAMBDA 950-PKA, PerkinElmer) is used to measure the ground-state ultraviolet-visible (UV-vis) absorption spectra. The steady-state fluorescence at room temperature and phosphorescence at the low temperature (77 K) are recorded by spectrofluorometer (JASCO FP-8600). PLQYs are evaluated by Hamamatsu Photonics C11347-01 Quantaurus-QY. To prevent the interruption from the ambient moisture and oxygen, a 15-min nitrogen-gas bubbling is conducted for the dyes in solution, while the measurement of solid-state films is performed under argon-gas flow. Time-resolved transient photoluminescent (PL) decay profiles are recorded using a Quantaurus-Tau system (C11367-03, Hamamatsu Photonics, Japan) and a time-resolved spectroscopy setup, composed of a third harmonic wave generation, a Nd:YAG/YVO lasing source (EKSPLA PL-2250, the excitation wavelength of 355 nm, and a pulse width of 30 ps), and a streak camera (C10910-01, Hamamatsu Photonics).
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6

Characterization of Photoluminescent Materials

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PL quantum efficiency was measured under the flow of argon gas using an absolute PL quantum yield measurement system (C11347-01, Hamamatsu Photonics) with an excitation wavelength of 340 nm. Emission lifetimes were measured using a fluorescence lifetime measurement system (C11367-03 Quantaurus-Tau, Hamamatsu Photonics) and CoolSpek Cs-0296 (UNISOKU Co.). Ultraviolet-visible (UV-vis) absorption spectra and PL spectra were recorded on UV-vis (Lambda 950-PKA, PerkinElmer) and PL (FluoroMax-4, HORIBA Jobin Yvon) spectrophotometers. Phosphorescence spectra in solution at 77 K were recorded on a Hamamatsu Photonics multichannel analyzer (PMA-12).
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