Auriga fib sem
The Auriga FIB/SEM is a focused ion beam (FIB) and scanning electron microscope (SEM) system developed by Zeiss. It combines high-resolution imaging capabilities and advanced nanoscale fabrication and analysis tools in a single integrated platform. The Auriga FIB/SEM is designed to provide comprehensive solutions for research, development, and failure analysis across various scientific and industrial applications.
Lab products found in correlation
21 protocols using auriga fib sem
Morphology of RIT-SM Solid Dispersions
Comprehensive Characterization of PAAS Photonic Film
Microscopic Structural Analysis of TMD Composites
3D Cell Culture Histological Analysis
Atom-Probe Analysis of Oxygen-Rich Clusters
Characterization of CuO@MnO2 Composites
Characterization of Plasmonic AuNFs
Microstructural Analysis of Tissue-Engineered Scaffolds
Comprehensive Characterization of Prepared Materials
Structural and Compositional Analysis of NiMgAl LDHs
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