The crystallographic structure characteristics of the undoped and (Co, Mn) co-doped ZnO samples were performed employing an X-ray diffractometer equipment type Philips PW 1729, equipped with a monochromatic radiation source (Cukα, λ = 1.54056 Å, Philips PW 1729 system, Cambridge, MA, USA). The X-ray photoelectron spectroscopy (XPS) analyses were carried out using a Thermo-VG Scientific MultiLab, ESCA Probe with Al Kα 1486.7 eV (Fisher Scientific, Waltham, MA, USA) as an exciting source in order to identify the chemical elements and their oxidation states.
In addition, the surface morphology of the thin films has been explored by electronic scanning microscopy (class EDAX XL 30 (S.E), EDAX, Mahwah, NJ, USA). The optical properties of all the ZnO samples, in terms of the transmission (T%) and optical band gap energy (Eg), were analyzed in the 250–2500 nm range with a spectrophotometer device (type Perkin Elmer Lambda 950). The magnetic properties studies were accomplished using a vibrating sample magnetometer (VSM, Microsense EV9, DMG MORI Manufacturing USA, Inc., Davis, CA, USA). The magnetization (M) measurements were conducted at room temperature in the field range from −20 kOe to 20 kOe.
In addition, the surface morphology of the thin films has been explored by electronic scanning microscopy (class EDAX XL 30 (S.E), EDAX, Mahwah, NJ, USA). The optical properties of all the ZnO samples, in terms of the transmission (T%) and optical band gap energy (Eg), were analyzed in the 250–2500 nm range with a spectrophotometer device (type Perkin Elmer Lambda 950). The magnetic properties studies were accomplished using a vibrating sample magnetometer (VSM, Microsense EV9, DMG MORI Manufacturing USA, Inc., Davis, CA, USA). The magnetization (M) measurements were conducted at room temperature in the field range from −20 kOe to 20 kOe.