I cap pro x

TEM images, STEM images, and EDX mappings were obtained with an FEI Talos F200X (200 kV) transmission electron microscope. X‐ray absorption spectroscopy experiments were performed at the 4B9A beamline of the Beijing Synchrotron Radiation Facility (BSRF). X‐ray photoelectron spectroscopy (XPS) and X‐ray induced Auger electron spectroscopy (XAES) were obtained using a Thermo Scientific K‐Alpha Scanning ESCA Microprobe instrument (physical Electronics) equipped with an Al Kα X‐ray source (hν = 1486.6 eV) and binding energies referenced to C1s (284.8 eV). The metal content of different samples was measured by an Inductively coupled plasma optical emission spectrometer (ICP‐OES) (i CAP Pro X, Thermofisher). X‐ray diffraction (XRD) was measured on an XRD‐700 X‐ray diffractometer from Shimadzu. Raman spectra were obtained with a Raman spectrometer (Horiba LabRAM HR Evolution) equipped with a 532‐nm‐laser excitation source.

STEM images and EDX mappings were obtained in a double aberration-corrected transmission electron microscope (FEI Titan Themis G2) operated at 300 kV with a HAADF detector (collection angle range of 48–200 mrad) and Super-X EDX detector. Transmission electron microscopy (TEM) images were obtained with an FEI-Tecnai F20 (200 kV) transmission electron microscope. The XAS experiments at the Ni K-edge were performed at the Shanghai Synchrotron Radiation Facility (SSRF,11B), and the intensities of the two S_Fe-Ni samples were multiplied by five for the EXAFS spectra. The metal content of different samples was measured by an Inductively coupled plasma optical emission spectrometer (ICP-OES) (i CAP Pro X, Thermofisher) or an Inductively coupled plasma source mass spectrometer (ICP-MS) (Aurora M90, Jenoptik). The temperature-programmed reduction (TPR) results were recorded with an infrared spectrometer (ThermoFisher Nicolet iS 50) equipped with a Deuterated Triglycine Sulfate (DTGS) detector.