Loresta ax mcp t370

Transmittance properties of the Ag based transparent electrodes and the semitransparent OSC were measured by a commercially available angle-resolved reflection/transmission spectroscopy system (R1, IdeaOptics Instruments, Shanghai, China). The surface resistance of the fabricated electrodes was characterized by a four point probe system (Loresta AX MCP-T370, Mitsubishi Chemical Analytech, Kanagawa, Japan). Scanning electron microscopy (SEM) images of the surface of ultrathin Ag films were recorded using a thermally assisted field emission SEM system (LEO 1530, Carl Zeiss NTS GmbH, Oberkochen, Germany). Current density-voltage curve characteristics and External Quantum Efficiency (EQE) spectra of the device were also analyzed. The current density-voltage characteristics of OSCs under dark and AM 1.5 G solar illumination provided by a solar simulator (Sun 3000, ABET, Milford, CT, USA, calibrated using a standard silicon cell) were measured using the Source Meter of Keithley 2400 (Keithley, Solon, OH, USA). The wavelength dependent external quantum efficiencies of the OSCs were recorded using a CSC1011 (ZOLIX instruments, Beijing, China) which was equipped with a short arc xenon lamp source (UXL-553, Ushio, Cypress, CA, USA).

Surface resistance was measured with a resistivity meter (Loresta-AX MCP-T370, measurement range 10⁻² –10⁶ Ω ◻⁻¹, Mitsubishi Chemical Analytech Co. Ltd., Chigasaki, Japan). The resistance of the cc-Kapton tape with high resistance (>10⁶ Ω ◻⁻¹) were measured with a semiconductor characterization system (Keithley 4200-SCS, Tektronix, Beaverton, OR, USA) and the values were converted to sheet resistances.