Fp 8600

Extinction and absorption spectra were measured by a JASCO V-770 spectrophotometer. Photoluminescence spectra were measured by a JASCO FP-6500 and FP-8600. The UC emission spectra were measured under the excitation with 532 nm CW laser. The SEM observation was performed using JEOL JSM-7500FA. TEM observation was performed using a Hitachi HF-2000 system at an acceleration voltage of 200 kV. Luminescence decay profiles were measured with a custom-built time-resolved luminescence spectrometer based on the photon counting technique. A CW-YAG laser (532 nm) equipped with an optical chopper was used as a light source, and luminescence at around 420 nm was detected with a photomultiplier (Hamamatsu, R928) through bandpass filters. The arrival time of a luminescence photon was measured with a fast oscilloscope (LeCroy, HDO4104) and analyzed with a computer. After accumulation of the arrival time signals, a decay profile could be obtained.

Transmittance spectra of the glass specimens were measured using a spectrophotometer (V670, JASCO) across a spectral range from 190 to 2700 nm with 1 nm intervals. The PL excitation/emission spectra were measured by a spectrofluorometer (FP-8600, JASCO) which equipped a Xe-lamp. The range of monitored wavelength was from 300 to 600 nm while the excitation wavelength was 260 nm. Excitation spectra was measured from 200 to 350 nm when the monitored wavelength was 440 nm. PL QYs were measured using Quantaurus-QY (C11347, Hamamatsu Photonics) at R.T. QY includes the measurement errors in ± 2%. The monitored excitation/emission wavelength ranges were 250–350 and 350–750 nm with 10 nm intervals, respectively. To determine an origin of luminescence, PL lifetime measurements were performed using Quantaurus-Tau (C11367, Hamamatsu Photonics).

The formation of ZnO nanocrystals was confirmed using thermogravimetric and differential thermal analyses (TGA/DTG, NETZSCH-STA-449F3 Jupiter). Their functional groups were obtained by a Fourier transform infrared spectrometer (FTIR) operating 4000–400 cm⁻¹ on a Bruker Vertex 70 spectrophotometer. The structural characteristics of the nanocrystals were investigated by X-ray diffraction (XRD) measurements that were performed by using an Empyrean, PANalytical X-ray diffractometer with Co-Kα radiation (λ = 1.78901 Å), in the range of 30°–90° (2θ) range; 40 kV and 40 mA; 0.01° (2θ) step size and 20 s per step. The instrument resolution was assessed using the LaB6 NIST/SRM 660b standard. Rietveld refinement was performed using the FullProf software [25 (link)]. The morphological analysis as well as electron diffraction patterns (SAED), were obtained by transmission electron microscopy (TEM) using a Tecnai G2-F20 S-TWIN microscope operating at 200 kV. The photoluminescence measurements were performed using a fluorescence spectrophotometer (Jasco, FP-8600) operating at 200–800 nm.

The structures of the four obtained types of [Eu(hfa)₃(dpdp)]_n LCPCs were characterized by powder XRD (Smart Lab, Rigaku, Japan) with nickel-filtered Cu Kα1 radiation (1.5406 Å). Simultaneous thermogravimetric and calorific value measurements were performed using an STA 449 F5 Jupiter instrument (TG-DSC, NETZSCH, Germany). The powder morphologies were observed by STEM (HD-2300c, Hitachi, Japan) with energy dispersion X-ray spectroscopy mapping and high-angle annular dark field (HAADF) measurements. The photoluminescence (PL) spectra were measured using a spectrofluorometer (FP-8600, JASCO, Japan) and were calibrated using a standard halogen lamp. PL decay was measured with a HORIBA Jobin Yvon Delta Flex spectrometer and a 375 nm pulsed LED. The 2D/3D confocal fluorescence images (1024 × 512 pixels) of LCPCs are recorded by an inverted microscope (Eclipse Ti2, Nikon, Japan) under 405 nm laser excitation. The monitoring wavelength is set to be 570–620 nm, and the Z-step for 3D imaging is 0.1 μm for each confocal panel.

The surface morphologies, microstructures, and crystallinities of different Ti₃C₂T_x MXene products were analyzed using various characterization techniques. Scanning electron microscopy (SEM) was performed using a JEOL-7800F instrument, whereas transmission electron microscopy (TEM) was performed using a JEM-ARM 200F instrument (NEOARM) equipped with a high-angle annular dark-field scanning electron microscope (HAADF-STEM) and energy-dispersive spectrometer (EDS). The thicknesses of the few-layer MXene samples were determined by atomic force microscopy (AFM, Model: NX-10, Park System). X-ray diffraction (XRD) measurements were performed using an Ultima IV instrument (Rigaku, Japan). The chemical components and bonding structures resulting from the iodine and bromine functionalization were investigated using X-ray photoelectron spectroscopy (XPS (mono) (Model: K-alpha)) and FTIR analysis (FT-IR Spectrometer, Model: Cary670). BET analysis was performed using an Autosorb IQ instrument to determine the specific surface area of each prepared sample. The optical absorbance was measured using a V-750 UV–visible spectrofluorometer equipped with a diffuse reflectance and fluorescence detector (JASCO FP-8600).

BS-631 was mixed with BPA to final concentrations of 100 μM and 1.0 mM, respectively, in 0.5% DMSO/H₂O. Excitation and emission spectra were measured at 60 min using a spectrometer (FP-8600, JASCO Corporation, Tokyo, Japan, photomultiplier voltage: 1200 V) to evaluate the maximum excitation ( ${\mathsf{\lambda }}_{\max }^{ex}$ ) and emission ( ${\mathsf{\lambda }}_{\max }^{em}$ ) wavelengths. The absorption spectrum of BS-631 (50 μM) was measured with a UV-visible spectrophotometer (V-730, JASCO) after 60 min incubation with BPA (final concentration of 0.5 mM) in 0.5% DMSO/H₂O. To examine time-dependent changes in fluorescence, the same measurements were performed at 30 min and 120 min.
To evaluate the relationship between the fluorescence intensity and BPA concentration, BS-631 was mixed to a final concentration of 100 μM with various concentrations of BPA (0–1000 μM at final concentration) in 0.5% DMSO/H₂O (n = 3). Fluorescence intensities were measured 60 min after mixing using a plate reader (EnSpire Multilabel Reader 2300, PerkinElmer Japan, Kanagawa, Japan, λex/λem: 430/630 nm). A linear regression analysis was performed to fit the data and calculate detection and quantification limits from the following equations: detection limit = 3 σ/slope and quantification limit = 10 σ/slope (where σ is the standard deviation of the fluorescence intensities of samples at 0 µM, and the slope is derived from the regression line.)