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Carbon support film

Manufactured by Agar Scientific
Sourced in United Kingdom

Carbon support film is a thin, transparent film made of amorphous carbon. It is designed to provide a stable and uniform substrate for the mounting and observation of samples in transmission electron microscopy (TEM). The film serves as a support for delicate specimens, enabling their examination and analysis at the nanoscale level.

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4 protocols using carbon support film

1

Biosynthesis and Characterization of Silver Nanoparticles

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UV–visible spectrophotometer (Shimadzu, Tokyo, Japan) was used to determine the formation of AgNPs. The absorbance was measured at 200–800 nm at UV-2450 double-beam.
FT-IR (Nicolet 6700 FT-IR Spectrometer, Waltham, MA, USA) analysis was performed to substantiate the capping and stabilizing of the biosynthesized AgNPs.
The FE-SEM (JEOL 7500FA JEOL, Peabody, MA, USA) analysis was used to ascertain the morphology and size of the biosynthesized AgNPs. A drop (8 μL) of AgNPs suspension was put onto grids (200 mesh) with a carbon support film (Agar Scientific, London, UK) and then the sample was dried. After that, the obtained dried sample was rinsed with EtOH and dried again, then later fixed on an appropriate SEM holder. Images were captured at an accelerating voltage of 30 kV.
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2

Revealing Nanoparticle Morphology via FE-SEM

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The FE-SEM technique (JEOL 7500FA JEOL, Peabody, MA, USA) was used to reveal information about the sample, including the external morphology materials making up the samples. A drop of nanoparticle suspensions with a volume of 8 μL was placed onto 200 mesh grids with a carbon support film (Agar Scientific, London, UK) and dried. Furthermore, the sample was rinsed with EtOH, dried and fixed on an appropriate SEM holder. Images were taken at an accelerating voltage of 30 kV. JEOL JEM-2100 (JEOL, Peabody, MA, USA).
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3

Contamination-free TEM Grid Preparation

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A sample volume of 2–4 µl was applied onto a commercial Cu TEM grid with a carbon support film (Agar scientific) or onto a graphene grid prepared as described above. Excess sample was wicked away by a filter paper. The grid with the sample was then introduced into an oven at 60°C for ∼10 min to remove hydrocarbon contaminations. STEM was performed on a probe- and aberration-corrected Thermo Fisher Themis Microscope. Images were collected at 200 kV using a high-angle annular dark field (HAADF) detector.
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4

Nanoparticle Characterization by FE-SEM

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The FE-SEM technique by JEOL JEM-2100 microscope (JEOL, Peabody, MA, USA) was used to investigate the external morphology and physical characteristics of the synthesized nanoparticles, as described previously [52 (link)]. Briefly, a drop of nanoparticle suspensions with a volume of 8 μL was placed onto 200 mesh grids with a carbon support film (Agar Scientific, London, UK), rinsed with ethanol and air-dried. Then, the sample was fixed on an appropriate SEM holder and the images were taken at an accelerating voltage of 15 kV using JEM-2100 optic system (JEOL, Peabody, MA, USA). The experiment was performed in triplicates.
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