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Hd 2300 dual eds cryo stem

Manufactured by Hitachi

The HD-2300 Dual EDS Cryo STEM is a high-performance electron microscope system designed for advanced materials analysis. It combines a scanning transmission electron microscope (STEM) with dual energy-dispersive X-ray spectroscopy (EDS) detectors, enabling comprehensive elemental analysis of samples at cryogenic temperatures.

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4 protocols using hd 2300 dual eds cryo stem

1

Nanoparticle Characterization by TEM and STEM

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Synthesized samples were characterized by transmission electron microscopy (TEM; Tecnai Spirit G2, 120 kV, FEI and JEM-2100 FasTEM, JEOL) and scanning transmission electron microscopy (STEM; HD-2300 Dual EDS Cryo STEM, Hitachi) for analysis of the morphologies and elemental mapping. The hydrodynamic size of the sample was measured with a Zetasizer Nano ZSP (Malvern Inc.).
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2

Transmission Electron Microscopy Sample Preparation

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Samples for transmission electron microscopy (TEM) were prepared on carbon/copper grids (Fisher Scientific, catalog no. 50-260-34). Grids were cleaned with a PELCO easiGlow by applying negative charge for 10 sec at 15 mA and 0.26 mBar. Then 10 μL of sample was applied to the grid, allowed to set for 2 min and excess liquid was wicked away with a filter paper. Grids were then washed with 30 μL of Milli-Q water and excess liquid was wicked away. Then, samples were fixed by applying 10 μL of 2% (v/v) glutaraldehyde, allowing to set for 2 min, wicking away the excess liquid, and repeating the washing method with 30 μL of Milli-Q water. Samples were stained with 10 μL of 1% uranyl acetate (w/v), allowed to set for 2 min, and excess liquid was wicked away. Images were taken with a Hitachi HD-2300 Dual EDS Cryo STEM at 200 kV.
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3

Comprehensive Characterization of Nanomaterials

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Samples were characterized with transmission electron microscopy (TEM, Tecnai Spirit G2, 120 kV, FEI and TEM, JEM-2100 FasTEM, JEOL) and scanning and transmission electron microscopy (STEM, HD-2300 Dual EDS Cryo STEM, Hitachi) for the analysis of morphologies and elemental mapping of Au, Ag, and the other elements. Hydrodynamic size of samples was measured with Zetasizer Nano ZSP (Malvern Inc.) Samples were analyzed with X-ray photoelectron spectroscopy (XPS, ESCALAB 250Xi, Thermo Scientific). The solutions of D-NP and N–NP were drop-casted on the slide glasses for the same concentrations (25 mg/mL) and left for 3 h to water got evaporated. Then, the samples were measured with XPS in 10 spots to get the photoelectron peaks of Au (scaning range = 80–90 eV) and Ag (scanning range = 560–580 eV) and averaged for the comparison. Sample surface area was measured with Brunauer-Emmett–Teller analysis (BET, 3Flex Surface Characterization Analyzer, Micromeritics).
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4

Comprehensive Nanoparticle Characterization

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The crystal structure, morphology and size of the synthesized samples were characterized using an Xray diffractometer (XRD; Scintag XDS-2000), transmission electronic microscope (TEM; FEI Tecnai Spirit G2) operating at 120 kV and scanning transmission electronic microscope (STEM; Hitachi HD-2300 Dual EDS Cryo STEM). The absorption spectra of the samples were recorded on a Lambda 1050 spectrophotometer (Perkin-Elmer, USA). The hydrodynamic size and size-distribution of the samples were investigated with dynamic light scattering (DLS) using a Zetasizer Nano-S (Malvern, Herrenberg, Germany) equipped with a 4 mW HeNe laser.
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