Escalab 250xi spectrometer

Elemental analysis was conducted by inductively coupled plasma optical emission spectroscopy. The cobalt content in CoPc/MWCNT is 0.85 wt%. The morphological information of the CoPc/MWCNT was examined with field-emission scanning electron microscopy (JSM-7800F) with an accelerating voltage of 5.0 kV. HAADF-STEM and the corresponding EDX mapping were conducted on a JEM-ARM200F STEM/TEM. XRD was acquired by a PAN Analytical Empyrean diffractometer with Cu Kα radiation at 40 kV and 40 mA. XPS measurements were carried out on a Thermofisher Escalab 250 Xi+ spectrometer using an Al Kα X-ray source with a pass energy of 30.0 eV. The 284.6 eV of the C 1 s peak was used to calibrate the binding energies. XAS, including XANES and EXAFS of Co K-edge, were carried out at the BL11B beamline at the Shanghai Synchrotron Radiation Facility, China. The energy was calibrated according to the absorption edge of pure Co foil. The acquired EXAFS data were processed according to the standard procedures using the ATHENA module of Demeter software packages. The Hanning window was utilized for the Fourier-transform of the k³-weighted χ(k) data in the k-space ranging from 3.0 to 10.6 to real (R) space.

The surface chemical components of silane-treated poplar veneers under different grafting conditions were tested using XPS (Thermo ESCALAB 250 Xi spectrometer, Waltham, MA, USA). All spectra were collected using a monochromatic Al Kα X-ray source (hv = 1486.7 eV).

GC-MS was performed on a Thermo Fisher Trace 1300s-ISQ LT instrument (Thermo Fisher, Waltham, MA, USA) with electron ionization (EI) mass spectrometry. NMR spectra were recorded at 500 MHz with Bruker Avance III HD instrument (Bruker, Billerica, MA, USA) using CDCl₃ as the solvent with tetramethylsilane (TMS) as the internal standard.
The FT-IR spectra were recorded within a 4000–500 cm⁻¹ region on a Thermo Fisher Nicolet iN10 MX & iS10 infrared spectrometer (Thermo Fisher, Waltham, MA, USA) using KBr pellets.
The UV–vis spectra was recorded within a 200–800 nm region on an Agilent Cary 60 spectrophotometer (Agilent, Palo Alto, CA, USA) with quartz cells at room temperature.
XPS measurements were performed on a Thermo Fisher ESCALAB 250Xi spectrometer (Thermo Fisher, Waltham, MA, USA).
The situ ATR-IR spectra were recorded within a 3000–600 cm⁻¹ region on a Mettler Toledo React IR15 spectrometer (Mettler Toledo, Zurich, Switzerland) equipped with a liquid-nitrogen-cooled MCT (mercury cadmium telluride) detector and a diamond probe. The typical experiments were carried out in a closed flask. The IR probe was immersed in liquid phase reaction mixture or gas phase.

The Fourier transform infrared (FTIR) spectra were monitored by employing a VERTEX 70 spectrometer (Bruker, Germany). The materials were grounded with KBr (1:100) and then compressed to form tables. The X-ray diffraction (XRD) patterns were collected with a Shimadzu XRD-7000 instrument at a scan rate of 0.02°·S⁻¹ with a 2θ range of 20°–80° and Cu Κα radiation (λ = 0.1542 nm). XPS spectra were obtained via an Escalab 250 Xi spectrometer (Thermo Fisher Scientific Inc., Waltham, MA, USA) with a monochromated source of X-rays (Al Kα, 1486.6 photo energy) as the excitation source. SEM measurements were conducted on a TESCAN MIRA LMS microscope equipped with energy-dispersive X-ray spectrometry (Xplore 30, Oxford, UK). The thermal behavior analyses were conducted in an N₂ atmosphere between room temperature and 800°C at a rate of 10 °C·min⁻¹ using a Q50 thermogravimetric analyzer (TA Instruments- Waters LLC, New Castle, DE, USA). The magnetic properties of the samples were measured using a LakeShore 7404S vibrational sample magnetometer (Lake Shore Cryotronics, Inc., Westerville, OH, USA). The thermal behavior analyses were conducted in an N₂ atmosphere between room temperature and 800°C at a rate of 10 °C·min⁻¹ using a Q50 thermogravimetric analyzer (TA Instruments- Waters LLC, New Castle, DE, USA).

The morphology of the material was viewed via scanning electron microscopy (SEM) using a Tescan MIRA LMS microscope (Brno, Czech Republic). X-ray diffraction (XRD) was performed to study the crystal structure of the adsorbent using a Rigaku SmartLab SE X-ray diffractometer (Tokyo, Japan) with a scanning angle from 5° to 80° and a scanning speed of 5° min⁻¹. The surface elements of the sample and the functional group distribution of the adsorbent were investigated via X-ray photoelectron spectroscopy (XPS) using a Thermo Fisher ESCALAB 250Xi spectrometer (Waltham, MA, USA). The vacuum of the analysis chamber was 4 × l0⁻⁹ mbar, the excitation source was Al k (hv = 1486.6 eV), the operating voltage was 14.6 kV, the filament current was 13.5 mA, and the signal was accumulated for 20 cycles. The test through-energy (Passing-Energy) was 20 eV in steps of 0.1 eV.

The X-ray Photoelectron Spectroscopy (XPS) of the materials was carried out on the Thermo Fischer Scientific Escalab 250Xi Spectrometer (Thermo Scientific, MA, USA) with nonmonochromatic Al Kα radiation (photon energy 1486.6 eV) at a research park of St. Petersburg State University Centre for Physical Methods of Surface Investigation (Russia). The total energy resolution of the experiment was about 0.2 eV. Spectra of the samples were recorded in the constant pass energy mode at 20 eV using a 650 mm diameter analysis area. Investigations were carried out at room temperature in an ultrahigh vacuum of the order of 10⁻⁹ mbar.