The optical properties of the CQD/SAE coating films were analyzed using the methods listed above. To explore the structure of the CQD/SAE coating films, Fourier transform infrared spectroscopy (FT-IR) was performed on a German Bruker Vertex 80V spectrophotometer, which scanned from 4000 to 1000 cm−1. The X-ray diffraction (XRD) results were obtained by a Rigaku Ultima Ⅳ X-ray diffractometer at a scan rate of 10°/min. Scanning electron microscopy (SEM, Quanta 200, FEI company, Hillsborough, USA) was conducted to study the surface morphology of the CQD/SAE coating films. The distribution of the CQDs in the styrene acrylic emulsion matrix was also tested via confocal laser scanning microscopy (CLSM, LSM710, Oberkochen, Germany). The contact angle was examined by an automatic single fiber contact angle measuring instrument (OCA40, Feldstadt, Germany) to investigate the surface wettability of the coating films. The water absorption was explored by immersing the coating films for various times to estimate their water resistance.
Ultima 4 x ray diffractometer
Manufactured by Rigaku
Sourced in Japan, United States
The Ultima IV X-ray diffractometer is a versatile instrument used for the analysis of crystalline materials. It utilizes X-ray diffraction techniques to provide detailed information about the structure and composition of a wide range of samples. The core function of the Ultima IV is to collect and analyze diffraction patterns generated by the interaction of X-rays with the atoms in a crystalline material.
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Lab products found in correlation
S 4800, by Hitachi (6 mentions)
Phi 5000 versa probe 2, by Physical Electronics (5 mentions)
Jsm 6610lv scanning electron microscope, by JEOL (5 mentions)
Jem 2100f, by JEOL (3 mentions)
Vertex 80v spectrophotometer, by Bruker (2 mentions)
Pdxl software, by Rigaku (2 mentions)
S 4800 field emission scanning electron microscopy, by Hitachi (2 mentions)
Ft ir 4200, by Jasco (2 mentions)
Jsm 7600f, by JEOL (2 mentions)
Sirion 200, by Thermo Fisher Scientific (2 mentions)
Escalab 250, by Thermo Fisher Scientific (2 mentions)
16f pc ftir, by PerkinElmer (2 mentions)
Jnm la 500 mhz, by JEOL (2 mentions)
Jem 2010, by JEOL (2 mentions)
V 670 spectrophotometer, by Jasco (2 mentions)
Jem 2100, by JEOL (2 mentions)
Quanta 200, by Thermo Fisher Scientific (1 mentions)
Tm3000, by Hitachi (1 mentions)
Axio scope al, by Zeiss (1 mentions)
Gsm 6510lv, by JEOL (1 mentions)
128 protocols using ultima 4 x ray diffractometer
1
Optical and Structural Characterization of CQD/SAE Coating Films
2
Microscopic Analysis of RMLS Mechanism
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Scanning electron microscope (SEM) of TM 3000 (produced by Hitachi Limited, Tokyo, Japan) and X-ray diffraction (XRD) tests of Ultima Ⅳ X-ray diffractometer (produced by Rigaku, Tokyo, Japan) (Figure 7 ) were carried out to study micro effect mechanism of RMLS. In SEM test, the air-dry samples were scanned with a 2θ ranging from 10° to 90°. The micro morphology of soil particles and hydrate could be clearly observed at 500 times using Axio-Scope-Al (produced by Zeiss, Jena, Germany). Formation of new phase could be judged through XRD test.
3
Characterization of Organic Molecules
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The 1H NMR spectrum was recorded on a
Bruker AVANCE III 400 spectrometer.
The chemical shift values (δ) were expressed in parts per million
by referring to the residual protons in CDCl3 solvent (δH = 7.26 ppm). High-resolution mass spectral data (HRMS) were
collected on a Bruker APEX II FT-MS mass spectrometer. The cyclic
voltammetry measurements were run on a CHI660C electrochemistry station
(CHI) at room temperature using three conventional electrodes, a platinum
working electrode, a saturated Ag/AgNO3 electrode as the
reference electrode, and a Pt wire as the counter electrode. Tetrabutylammonium
phosphorus hexafluoride (Bu4NPF6, 0.1 M) in
CHCl3 solution was used as the supporting electrolyte,
and the scan rate was set at 100 mV s–1. TGA measurements
were performed on a STA PT1600 instrument (Linseis company) at a heating
rate of 10 K min–1 under a nitrogen flow. The UV–visible
diffuse reflectance spectrum of DPPRD was recorded on a PerkinElmer
LAMBDA 35 UV/vis spectrometer using polytetrafluoroethylene as a reference
while that of the MO aqueous solution was recorded on a SPECORD-S600
spectrometer (Jena. Germany) equipped with 1.0 cm quartz cells. The
X-ray diffraction (XRD) pattern was collected on a Rigaku Ultima IV
X-ray diffractometer using Cu Kα radiation (λ = 1.5418
Å). FT-IR spectra were recorded on a Bruker VERTEX 80 FT-IR spectrometer
using the KBr pellets.
Bruker AVANCE III 400 spectrometer.
The chemical shift values (δ) were expressed in parts per million
by referring to the residual protons in CDCl3 solvent (δH = 7.26 ppm). High-resolution mass spectral data (HRMS) were
collected on a Bruker APEX II FT-MS mass spectrometer. The cyclic
voltammetry measurements were run on a CHI660C electrochemistry station
(CHI) at room temperature using three conventional electrodes, a platinum
working electrode, a saturated Ag/AgNO3 electrode as the
reference electrode, and a Pt wire as the counter electrode. Tetrabutylammonium
phosphorus hexafluoride (Bu4NPF6, 0.1 M) in
CHCl3 solution was used as the supporting electrolyte,
and the scan rate was set at 100 mV s–1. TGA measurements
were performed on a STA PT1600 instrument (Linseis company) at a heating
rate of 10 K min–1 under a nitrogen flow. The UV–visible
diffuse reflectance spectrum of DPPRD was recorded on a PerkinElmer
LAMBDA 35 UV/vis spectrometer using polytetrafluoroethylene as a reference
while that of the MO aqueous solution was recorded on a SPECORD-S600
spectrometer (Jena. Germany) equipped with 1.0 cm quartz cells. The
X-ray diffraction (XRD) pattern was collected on a Rigaku Ultima IV
X-ray diffractometer using Cu Kα radiation (λ = 1.5418
Å). FT-IR spectra were recorded on a Bruker VERTEX 80 FT-IR spectrometer
using the KBr pellets.
4
Characterization of Bionanocomposite Material
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The type of functional groups and bonding in the material were analyzed using Fourier Transform Infrared spectroscopy, in particular, the PerkinElmer (PE1600, USA). A Rigaku Ultima IV X-ray diffractometer was utilized for the assessment of the solid structure of the bionanocomposite material. The surface morphological structure of the material was examined using scanning electron microscopy (SEM; JEOL GSM 6510LV, Japan). The samples wrapped in a gold film were prepared before their introduction to the SEM imaging cell. The molecule size and dissemination of nanoparticles in the polymer framework of the blended bionanocomposite were determined by utilizing a JEM 2100 (Japan) transmission electron microscope. The MB concentration in the supernatant was estimated using a UV-vis spectrophotometer (UV-1900, Shimadzu). The alteration of the arrangement pH was determined using an Elico Li 120 pH meter. INTEGRA (NT-MDT-INTEGRA) was used for the Atomic Force Microscopy (AFM) analysis. The thermal stability was determined by thermogravimetric analysis (TGA, PerkinElmer model, STA 6000) and thermal derivative analysis (DTG, PerkinElmer Pyris 6). The TGA thermograms were recorded for 20 mg of powder sample at a heating rate of 10 °C min−1 in the temperature range of 30–800 °C under the nitrogen atmosphere.
5
PXRD Analysis of Pharmaceutical Formulations
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To determine physical states of physical mixtures, milled extrudates of Formulation A, Formulation B, Formulation C, and precipitates of dissolution testing, the PXRD of the samples were studied using an Ultima IV X-ray diffractometer (Rigaku, Tokyo, Japan) with CuKα radiation (1.5418 Å) at room temperature. For the preparation of samples for analysis, the scraped powder was placed on glass sample holders and then pressed to ensure a smooth and uniform surface. The diffraction pattern was measured with a tube voltage of 40 kV and a current of 40 mA. The divergence slit and anti-scattering slit were set to 0.5° for illumination of a 10 mm sample size. Scanning was performed in a 2θ range between 3° and 40° with a step size of 0.02° and a counting time of 0.1 s per step.
6
Comprehensive Characterization of Photoluminescent Quantum Dots
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Dynamic light scattering
(DLS) measurements were carried out on a Malvern particle size analyzer
(Zetasizer nano series, Nano-ZS) at room temperature. Absorption spectra
of the samples were recorded on a Shimadzu UV-3600 plus. XRD measurements
were performed on a Rigaku Ultima IV X-ray Diffractometer with Cu
Kα radiation (λ = 1.54 A°). The 2Θ range was
from 10 to 60° in a step of 0.02°. FTIR spectra were measured
within the range of 4000–500 cm–1 using a
JASCO FT/IR-4200 Fourier transform infrared spectrometer. X-ray photoelectron
spectroscopy (XPS) measurements were performed on a Thermo Fisher
Scientific ESCALAB Xi+. High-resolution transmission electron microscopy
(HRTEM) experiments for the PPQ-CDs were performed on a Technai T20
200 keV, FEI. Fluorescence data were recorded on a Hitachi F-7000
fluorescence spectrofluorometer. Fluorescence lifetime measurements
were performed with a Horiba Deltaflex modular fluorescence lifetime
system using the following instrumental settings: 340 nm NanoLED,
peak preset of 10,000 counts, and emission wavelength of 450 nm; quartz
cuvettes were used for the measurement procedures. 1H NMR
spectra were measured on a Bruker AVANCENEO (400 MHz) with a magnet
system: ASCEND 400 MHz/ 54 mm-long hold-time magnet operation, field
at 9.4 Tesla with an autosampler.
(DLS) measurements were carried out on a Malvern particle size analyzer
(Zetasizer nano series, Nano-ZS) at room temperature. Absorption spectra
of the samples were recorded on a Shimadzu UV-3600 plus. XRD measurements
were performed on a Rigaku Ultima IV X-ray Diffractometer with Cu
Kα radiation (λ = 1.54 A°). The 2Θ range was
from 10 to 60° in a step of 0.02°. FTIR spectra were measured
within the range of 4000–500 cm–1 using a
JASCO FT/IR-4200 Fourier transform infrared spectrometer. X-ray photoelectron
spectroscopy (XPS) measurements were performed on a Thermo Fisher
Scientific ESCALAB Xi+. High-resolution transmission electron microscopy
(HRTEM) experiments for the PPQ-CDs were performed on a Technai T20
200 keV, FEI. Fluorescence data were recorded on a Hitachi F-7000
fluorescence spectrofluorometer. Fluorescence lifetime measurements
were performed with a Horiba Deltaflex modular fluorescence lifetime
system using the following instrumental settings: 340 nm NanoLED,
peak preset of 10,000 counts, and emission wavelength of 450 nm; quartz
cuvettes were used for the measurement procedures. 1H NMR
spectra were measured on a Bruker AVANCENEO (400 MHz) with a magnet
system: ASCEND 400 MHz/ 54 mm-long hold-time magnet operation, field
at 9.4 Tesla with an autosampler.
7
Characterization of Li-Rich Cathode Powders
8
Microscopic and Spectroscopic Analysis of Soil Specimens
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The microstructures of all soil specimens (gold-coated) were examined under a S4800 (Hitachi, Japan) electron microscope operating at 200 kV, equipped with an energy dispersive X-ray (EDX) detector that detailed surface composition. FTIR spectra of soil specimens were recorded on a Thermo Nicolet Nexus 600 spectrophotometer (Thermo Nicolet, USA) at a wave band from 4000 to 400 cm−1 and presented from 4000 to 500 cm−1 using KBr pellets technique.
XRD was used to identify bio/minerals and other compounds of expansive soil specimens including those with specified amount of fly ash or fly ash and biocement using Ultima IV X-ray diffractometer (Rigaku, Japan) with CuKα radiation. Measurements were taken from 4 to 80°(2θ) during one hour. Crystalline phases of all specimens were identified using the database of the International Center for Diffraction Data.
XRD was used to identify bio/minerals and other compounds of expansive soil specimens including those with specified amount of fly ash or fly ash and biocement using Ultima IV X-ray diffractometer (Rigaku, Japan) with CuKα radiation. Measurements were taken from 4 to 80°(2θ) during one hour. Crystalline phases of all specimens were identified using the database of the International Center for Diffraction Data.
9
Comprehensive Characterization of CoMoS Catalysts
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Example 3
Characterization of the Activated CoMoS Catalysts
Textural properties of the catalysts were evaluated via N2 adsorption-desorption isotherm analysis at 77 k using a Micromeretics ASAP 2020. The catalysts (approximately 0.1 g each) were initially degassed under flowing argon at 523 k for 2.5 h. The BET method was used to calculate the surface area, whereas absorption branch of BJH method was applied to calculate the pore size and pore volume of the catalysts.
FTIR spectra of the catalysts were recorded on a Nicolet 6700 FTIR spectrometer with a wavelength range of 400-4000 cm−1. The FTIR sample pellets were prepared using a mixture of the respective catalyst and KBr at a weight ratio of 1:100.
Catalyst crystallinity and the distribution of CoMo on the silica support were determined by scanning the catalysts' X-ray diffraction pattern between 20 to 80° 2θ at 40 kV and 40 mA using a Rigaku Ultima IV X-ray diffractometer.
Surface morphology of the catalysts was imaged using a JEOL JSM-6610LV scanning electron microscope. Element mapping with the corresponding EDX spectrum were recorded using an energy dispersive X-ray spectrometer.
The degree of Mo sulfidation of the catalysts due to different activation conditions were determined by X-ray photoelectron spectroscopy (XPS) using a PHI 5000 Versa Probe II, ULVAC-PHI Inc. spectroscope.
10
X-ray Diffraction Analysis of Amoxicillin Formulations
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Crushed samples of SNA 15 base, AS, AMT, and the drug loaded core of AS HTS and AMT HTS (amoxicillin in SNA 15 base) were compared using XRD (Ultima IV X-ray diffractometer, Rigaku Corporation, Tokyo, Japan). The samples were analysed using Cu Kα radiation (1.54056 Å), with a scattering angle of 5° < 2θ < 45° in a continuous rotation scan mode, with a step size of 0.02θ every 20 s. The diffractometer was operated at a generator tension of 40 KV and current of 30 mA. Diffraction line intensity versus 2θ was plotted and analysed for changes in drug peaks in the presence of SNA 15 base.
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