3 aminopropyltriethoxysilane
3-aminopropyltriethoxysilane is a bifunctional organosilane compound. It contains both an amino group and three ethoxy groups. This molecule can be used as a coupling agent in various applications, facilitating the bonding between inorganic and organic materials.
Lab products found in correlation
297 protocols using 3 aminopropyltriethoxysilane
Synthesis and Catalytic Evaluation of Cyclic Compounds
Atomic Force Microscopy of Graphene Flakes
Example 12
Atomic Force Microscopy (AFM) Characterization of Graphene Flakes.
For graphene flake characterization, a sample of graphene/EC dispersion in ethanol was deposited onto Si/SiO2 for AFM characterization. Prior to sample deposition, Si/SiO2 wafers were immersed in 2.5 mM 3-aminopropyl triethoxysilane (Aldrich, 99%) in 2-propanol (Macron Chemicals, 99.5%) for 30 minutes, after which they were rinsed with 2-propanol and blown dry under a stream of N2. A diluted graphene dispersion was dropcast onto the wafers and left for 10 minutes, after which it was blown dry with N2 and rinsed with 2-propanol. To remove ethyl cellulose and residual 3-aminopropyl triethoxysilane, the samples were annealed at 400° C. in a tube furnace for 30 minutes. AFM images were obtained using a Bruker ICON PT AFM System in tapping mode with a Veeco Model RTESP (MPP-11100-10) cantilever. The images were collected with 2 μm×2 μm scans, and particle characteristics were determined using Nanoscope Analysis software. Flake thickness was determined from line scans, and flake area was measured automatically using the software. Flake thickness was measured for 355 flakes, and flake area was measured for 216 flakes. (See
Characterization of Graphene Flakes by AFM
Example 12
Atomic Force Microscopy (AFM) Characterization of Graphene Flakes.
For graphene flake characterization, a sample of graphene/EC dispersion in ethanol was deposited onto Si/SiO2 for AFM characterization. Prior to sample deposition, Si/SiO2 wafers were immersed in 2.5 mM 3-aminopropyl triethoxysilane (Aldrich, 99%) in 2-propanol (Macron Chemicals, 99.5%) for 30 minutes, after which they were rinsed with 2-propanol and blown dry under a stream of N2. A diluted graphene dispersion was dropcast onto the wafers and left for 10 minutes, after which it was blown dry with N2 and rinsed with 2-propanol. To remove ethyl cellulose and residual 3-aminopropyl triethoxysilane, the samples were annealed at 400° C. in a tube furnace for 30 minutes. AFM images were obtained using a Bruker ICON PT AFM System in tapping mode with a Veeco Model RTESP (MPP-11100-10) cantilever. The images were collected with 2 μm×2 μm scans, and particle characteristics were determined using Nanoscope Analysis software. Flake thickness was determined from line scans, and flake area was measured automatically using the software. Flake thickness was measured for 355 flakes, and flake area was measured for 216 flakes. (See
Synthesis of Grafted Linseed Oil Polymers
Characterization of Graphene Flakes by AFM
Example 12
Atomic Force Microscopy (AFM) Characterization of Graphene Flakes.
For graphene flake characterization, a sample of graphene/EC dispersion in ethanol was deposited onto Si/SiO2 for AFM characterization. Prior to sample deposition, Si/SiO2 wafers were immersed in 2.5 mM 3-aminopropyl triethoxysilane (Aldrich, 99%) in 2-propanol (Macron Chemicals, 99.5%) for 30 minutes, after which they were rinsed with 2-propanol and blown dry under a stream of N2. A diluted graphene dispersion was dropcast onto the wafers and left for 10 minutes, after which it was blown dry with N2 and rinsed with 2-propanol. To remove ethyl cellulose and residual 3-aminopropyl triethoxysilane, the samples were annealed at 400° C. in a tube furnace for 30 minutes. AFM images were obtained using a Bruker ICON PT AFM System in tapping mode with a Veeco Model RTESP (MPP-11100-10) cantilever. The images were collected with 2 μm×2 μm scans, and particle characteristics were determined using Nanoscope Analysis software. Flake thickness was determined from line scans, and flake area was measured automatically using the software. Flake thickness was measured for 355 flakes, and flake area was measured for 216 flakes. (See
Ibuprofen-Functionalized Cellulose Acetate
Amino Acid Quantification by UHPLC
Characterization of Graphene Flakes by AFM
Example 12
Atomic Force Microscopy (AFM) Characterization of Graphene Flakes.
For graphene flake characterization, a sample of graphene/EC dispersion in ethanol was deposited onto Si/SiO2 for AFM characterization. Prior to sample deposition, Si/SiO2 wafers were immersed in 2.5 mM 3-aminopropyl triethoxysilane (Aldrich, 99%) in 2-propanol (Macron Chemicals, 99.5%) for 30 minutes, after which they were rinsed with 2-propanol and blown dry under a stream of N2. A diluted graphene dispersion was dropcast onto the wafers and left for 10 minutes, after which it was blown dry with N2 and rinsed with 2-propanol. To remove ethyl cellulose and residual 3-aminopropyl triethoxysilane, the samples were annealed at 400° C. in a tube furnace for 30 minutes. AFM images were obtained using a Bruker ICON PT AFM System in tapping mode with a Veeco Model RTESP (MPP-11100-10) cantilever. The images were collected with 2 μm×2 μm scans, and particle characteristics were determined using Nanoscope Analysis software. Flake thickness was determined from line scans, and flake area was measured automatically using the software. Flake thickness was measured for 355 flakes, and flake area was measured for 216 flakes. (See
Fluorescent Nanomaterial Synthesis
Synthesis and Characterization of Functionalized Silica Particles
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