Jem 2100f microscope

Powder X-ray diffraction (PXRD) (Fangyuan Instrument Co., Ltd., Dandong, China) was tested on a DX2700 diffractometer with a Cu Kα radiation source (λ = 1.5406 nm), with a measurement in 2θ range: 5° to 80°. Scanning electron microscopy (SEM) (Electronics Co., Ltd., Tokyo, Japan) analysis was accomplished on a JEOL JSM-6700F microscope. Transmission electron microscopy (TEM) (Electronics Co., Ltd., Japan) and energy dispersive spectroscopy (EDS) (Electronics Co., Ltd., Japan) characterization were performed on a JEOL JEM-2100F microscope at 200 kV. X-ray photoelectron spectroscopy (XPS) (ThermoFisher, Waltham, MA, USA) analysis was performed on an EscaLab 250Xi electronic spectrometer. Raman spectra were measured using a micro-Raman spectrometer (Renishaw, Wotton-under-Edge, UK) with a laser wavelength of 532 nm at 0.2 mW. A C20001C contact angle meter (Zhongchen Digital Technology Equipment Co., Ltd., Shanghai, China) was used to characterize the surface wettability of samples. UV-vis spectra were recorded in the range of 250–550 nm on a T6-NC (Persee, Beijing, China) spectrophotometer. A JW-BK222 (jingweigaobo, Beijing, China) automated sorption system was used for nitrogen adsorption–desorption measurement. Specific surface area data were obtained by the Brunauer–Emmet–Teller (BET) method.