Bruker ICON Atomic Force Microscope was applied to probe the sample surface in air. Infrared (IR) spectra of PG molecule were obtained using Fourier transform infrared spectromter Nicolet 6700 (Thermo Fisher). The IR transmission spectrum was obtained by Nicolet iN10 MX, Thermo Fisher company, and the scanning times was set at 256, while other parameters were set as default.
Icon atomic force microscope
Manufactured by Bruker
Sourced in United Kingdom
The Icon atomic force microscope is a high-resolution imaging and measurement instrument designed for surface analysis. It uses a sharp-tipped probe to scan the sample surface, providing detailed topographical information at the nanoscale level.
Automatically generated - may contain errors
Lab products found in correlation
Nicolet 6700, by Thermo Fisher Scientific (3 mentions)
Nicolet in10 mx, by Thermo Fisher Scientific (1 mentions)
Evolution 260 bio uv vis spectrophotometer, by Thermo Fisher Scientific (1 mentions)
Scanasyst air silicon tip on nitride lever, by Bruker (1 mentions)
Multimode microplate reader, by Tecan (1 mentions)
Mrd diffractometer, by Malvern Panalytical (1 mentions)
Stellaris 8, by Leica (1 mentions)
Cary 60 uv vis, by Agilent Technologies (1 mentions)
Confocal raman microscope, by WITec (1 mentions)
Zetasizer nano z, by Malvern Panalytical (1 mentions)
X pert3 mrd, by Malvern Panalytical (1 mentions)
Labram hr800 spectrometer, by Horiba (1 mentions)
Keithley 4200, by Tektronix (1 mentions)
Jsm 7500f scanning electron microscope, by JEOL (1 mentions)
9 protocols using icon atomic force microscope
1
Characterizing PG Molecule Surface
2
Nanotopography Characterization by AFM
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Sample nanotopography was verified using atomic force microscopy (ICON Atomic Force Microscope, Bruker, Coventry, UK). We measured the surface profile over a sampling area of 1 × 1 μm2, in a dynamic tapping mode in air. All measurements were performed at room temperature. During image acquisition, the scan rate was fixed as 0.5 Hz, while images were discretized in 1024 × 1024 points. We used Ultra-sharp Si probes (ACLA-SS, AppNano, Mountain View, CA, USA) with a nominal tip radius less than 5 nm to assure high resolution. Multiple measurements were done in different scan directions to avoid artefacts. At least four images were recorded per sample to reduce uncertainty. After acquisition, images were analyzed using the methods developed in [17 (link)] to determine the average surface roughness (Ra) and fractal dimension (Df) for each sample.
3
Topography and Thickness Analysis of Polymer Coatings
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The topography analysis of the pDA- and AMP-conjugated pDA coatings was performed with a Bruker Icon Atomic Force Microscope (Bruker UK Ltd., Coventry, UK). A silicone probe was passed over the surface of the coatings and its displacement was recorded. This generated a three-dimensional plot of the surface topography. In this research, images were recorded in static mode over a 20 μm × 20 μm area. Ellipsometry was performed on a Jobin-Yvon UVISEL ellipsometer (HORIBA UK Ltd., Northampton, UK) with a xenon light source. First, the light reflection of the uncoated surface of the sample was measured to set the measurement baseline, then the height of the coated surface was measured relative to the baseline.
4
Characterization of Quantum Dot Assemblies
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TEM characterization was carried out using a Thermo Fisher FEI Tecnai Spirit Transmission Electron Microscopy operating at 120 kV. For QDs with organic ligands, 10 μl of QDs (50 μg/ml) was drop casted on 400-mesh carbon film square grids (Thermo Fisher Scientific, catalog number: 5024891). For DNA origami and QD/QR-origami assemblies, 10 μl of wireframe DNA origami objects with or without attached QDs/QRs (5 nM) was adsorbed on glow-discharged 400-mesh carbon film square grids and stained by 2% aqueous uranyl formate solution containing 25 mM NaOH.
AFM measurements were performed under air condition in either on an Icon Atomic Force Microscope (Bruker) in ScanAsyst mode using a ScanAsyst-Air silicon tip on nitride lever (tip radius = 2 nm, k = 0.4 N/m, fo = 70 kHz; Bruker) or on an Asylum Research Jupiter XR AFM (Oxford Instruments) in tapping mode using an ARROW-UHF ultrahigh-frequency probe (tip radius < 10 nm, fo = 2000 kHz; NanoWord).
Absorbance spectra were measured using an Evolution 260 Bio UV-vis spectrophotometer (Thermo Fisher Scientific), and steady-state emission spectra (λex = 450 nm) were measured using a multimode microplate reader (Tecan Spark). Quantum yields of QDs/QRs were determined using the relative quantum yield determination method with rhodamine 101 in spectroscopic-grade ethanol as standard (λex = 480 nm, Φs = 0.92) (79 (link)).
AFM measurements were performed under air condition in either on an Icon Atomic Force Microscope (Bruker) in ScanAsyst mode using a ScanAsyst-Air silicon tip on nitride lever (tip radius = 2 nm, k = 0.4 N/m, fo = 70 kHz; Bruker) or on an Asylum Research Jupiter XR AFM (Oxford Instruments) in tapping mode using an ARROW-UHF ultrahigh-frequency probe (tip radius < 10 nm, fo = 2000 kHz; NanoWord).
Absorbance spectra were measured using an Evolution 260 Bio UV-vis spectrophotometer (Thermo Fisher Scientific), and steady-state emission spectra (λex = 450 nm) were measured using a multimode microplate reader (Tecan Spark). Quantum yields of QDs/QRs were determined using the relative quantum yield determination method with rhodamine 101 in spectroscopic-grade ethanol as standard (λex = 480 nm, Φs = 0.92) (79 (link)).
5
Sulfide Film Characterization Techniques
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A Bruker Icon atomic force microscope was used to measure surface morphology and film thickness. Scanasyst AFM tips with a nominal tip radius of ≈2 nm and spring constant of 0.4 Nm−1 were used in the peak-force tapping mode for the measurements. Photoluminescence (PL) maps were acquired over a 5 × 5 μm2 area with a laser wavelength of 532 nm and 300 grooves per mm grating in a WITec apyron Confocal Raman Microscope. A PANalytical MRD diffractometer with a 5-axis cradle was used for in-plane X-ray diffraction characterization of the sulfide films70 (link). A Cu anode X-ray tube operated at 40 kV accelerating voltage and 45 mA filament current was used as the X-ray source. On the primary beam side, a mirror with ¼° slit and Ni filter were used to filter the Cu Kα line. On the diffracted beam side, an 0.27° parallel plate collimator with 0.04 rad Soller slits with PIXcell detector in open detector mode were employed. To determine the in-plane epitaxial relation of the film with respect to a substrate, sample surface was ≈2–4° away from the X-ray incidence plane.
6
Biomechanical Properties of Bioinks
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The physical properties of bioinks with different compositions were determined. Exactly 10% (w/v) polyethylene glycol diacrylate (PEGDA) and 0.25% (w/v) lithium acylphosphinate photo-initiator (LAP) were added to the tECM hydrogel obtained previously, as described above, then the PEGDA/tECM pre-gel was crosslinked for 15 s at 375 nm of UV light exposure. Isostatic compression tests of the hydrogels were conducted in a dry state at 25°C using a universal testing system (Instron 5567, United States). The weight swelling ratio, Q, was calculated using the following equation:
The coagulation time of several types of hydrogels with different tECM concentrations was tested on the print plane. The 3D microstructure of the lyophilized PEGDA/tECM hydrogels was observed using scanning electron microscopy (SEM). An Icon atomic force microscope (Dimension Icon, Bruker, Billerica, MA, United States) was used to observe the PEGDA hydrogel and scaffold.
The coagulation time of several types of hydrogels with different tECM concentrations was tested on the print plane. The 3D microstructure of the lyophilized PEGDA/tECM hydrogels was observed using scanning electron microscopy (SEM). An Icon atomic force microscope (Dimension Icon, Bruker, Billerica, MA, United States) was used to observe the PEGDA hydrogel and scaffold.
7
Characterization of Nanoparticle Properties
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A Cary 60 UV-VIS (Agilent, Inc., Santa Clara, CA, USA) spectrophotometer was used to measure the absorbance spectra of the particles. Images and fluorescence spectra of single nanoparticles were obtained using WITec confocal Raman microscope (WITec, Inc., Ulm, Germany). The size distributions of nanoparticles were measured with a dynamic light scattering (DLS) technique (Zetasizer Nano ZS by Malvern, LTD., Malvern, UK) and Icon atomic force microscope (Bruker Inc, Santa Barbara, CA, USA). Fluorescence was measured using a Cary Eclipse fluorescent spectrometer (Agilent). The fluorescence lifetime of the encapsulated dye molecules was measured using the FLIM module of a laser scanning confocal Leica microscope (STELLARIS 8, Leica Microsystems Inc., Deerfield, IL, USA).
8
Comprehensive Characterization of Crystal Structures
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Cross-polarized optical microscopy images were obtained by a Zeiss Imager A2m fluorescence-microscope from Carl Zeiss ZESISS, Oberkochen, Germany. Atomic force microscopy (AFM) measurements were performed using a Bruke Icon atomic force microscope from Bruker, Washington, America operating at room temperature and under ambient conditions. X-ray diffraction (XRD) of the crystals was performed with a Panalytical X’pert3 MRD from Malvern Panaco, UK with a Cu Kα anode operating at 40 kV and 40 mA. Unless otherwise stated, all electrical measurements were carried out with a Keithley 4200 from Tektronix, Beaverton, Oregon, America. Parameter Analyzer at room temperature and under ambient conditions. Low-temperature photoluminescence spectra were acquired using a Horiba Jobin Yvon LabRam HR 800 spectrometer from HORIBA Jobin Yvon, Paris, France with a CCD-1024 × 256-FIVS-3S9.
9
Characterizing Reduced Graphene Oxide Films
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Sheet resistance: Rs, of VC-rGO films was measured with a Loresta-AX MCP-T370 handheld low resistivity four-point probe (Nittoseiko Analytech Co., Ltd.). Profilometry was performed with a Tencor KLA P-7 Stylus Profiler (KLA Corp.; scan speed = 50 μm s−1; sampling frequency, fs = 200 Hz; stylus applied force, fappl = 2 mg) to determine VC-rGO film thickness, τ. After measuring the values of sheet resistance and average thickness, the DC conductivity of the films, σDC, was calculated using the relationship σDC = (Rs·τ)−1.
Raman: spectra were collected using an NT-MDT Ntegra Raman-NSOM system, with a 532 nm excitation laser. The effective wavelength range was limited to 180–2,580 cm−1. Raman spectra were averaged across N = 6 separate scans, and then fitted with a Lorentzian function in MATLAB to determine peak positions and intensities for the peaks specific to graphitic carbon (i.e., the D and G bands).
Imaging: a JSM-7500F scanning electron microscope (SEM; JEOL, Ltd.) with a 3 keV accelerating voltage was used for imaging VC-rGO thin films on glass substrates. A Bruker Icon atomic force microscope (AFM; Bruker Corp.) was used to characterize the flake morphology of GO + VC and VC-rGO thin films on glass substrates, and ImageJ was used to help identify individual flakes in the collected micrographs.
Raman: spectra were collected using an NT-MDT Ntegra Raman-NSOM system, with a 532 nm excitation laser. The effective wavelength range was limited to 180–2,580 cm−1. Raman spectra were averaged across N = 6 separate scans, and then fitted with a Lorentzian function in MATLAB to determine peak positions and intensities for the peaks specific to graphitic carbon (i.e., the D and G bands).
Imaging: a JSM-7500F scanning electron microscope (SEM; JEOL, Ltd.) with a 3 keV accelerating voltage was used for imaging VC-rGO thin films on glass substrates. A Bruker Icon atomic force microscope (AFM; Bruker Corp.) was used to characterize the flake morphology of GO + VC and VC-rGO thin films on glass substrates, and ImageJ was used to help identify individual flakes in the collected micrographs.
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