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Helios 660 g3 uc fib sem

Manufactured by Thermo Fisher Scientific

The Helios 660 G3 UC FIB/SEM is a focused ion beam scanning electron microscope (FIB/SEM) system. It combines a high-resolution scanning electron microscope (SEM) with a focused ion beam (FIB) for advanced sample imaging, analysis, and preparation.

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2 protocols using helios 660 g3 uc fib sem

1

STEM Examination of Macrophages with Zn2-SrBG/Ceria

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For scanning transmission electron microscopy (STEM) examination, 1 × 107 THP-1 cells were seeded in RPMI into T75 cell culture flasks. Four groups were prepared: macrophages (control, 1), macrophages with 0.5 mg ml−1 Zn2-SrBG/ceria (2), Macrophages with internalized MRSA (3), macrophages with internalized MRSA and 0.5 mg ml−1 Zn2-SrBG/ceria (4) as described above. Cells were detached from the flask using trypsin-EDTA and a cell scraper, pelleted by centrifugation (500g, 5 min, 20 °C) and resuspended in 1 ml paraformaldehyde. After fixation at 4 °C overnight, the cells were spun down at 1500g for 5 min and stained with 2% osmium tetroxide in 0.1 M sodium cacodylate buffer. After drying in an ethanol gradient series, the cells were embedded in epoxy resin (EPON 812, Sigma-Aldrich). Ultrathin sections were either imaged on an FEI Helios 660 G3 UC FIB/SEM at 25 kV or contrasted with lead citrate (Reynolds 1963) before observation by TEM. Elemental distribution maps were recorded from these ultrathin sections in scanning transmission mode on a Talos F200X TEM (Super-X EDS, 4 detector configuration, FEI, USA) at an accelerating voltage of 200 kV. Samples were mounted on a double-tilt holder and fixed using a molybdenum ring and clamp. The data were processed using the software Velox 2.9 (FEI, USA).
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2

Detailed Multimodal Microscopy Protocols

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For secondary electron imaging, paraffin embedded samples were dewaxed by immersion in pure xylene for two ten minute intervals, dehydrated through a graded ethanol series (20, 30, 40, 50, 60, 70, 80, 90, and 100% (v/v)) and air dried. The slides were then silver painted, carbon coated and secured on an SEM silver stub using conductive carbon adhesive tape. A Hitachi S‐3499N SEM was used at a voltage of 10 kV for acquisition of backscattered (BSE) and secondary (SE) electron micrographs. The density dependent colour SEM (DDC‐SEM) micrographs were produced by the superimposition of the BSE and SE images using the Adobe Photoshop CC software.[59]The focused ion beam (FIB) scanning electron micrographs on deparaffinized histology sections (coated with 10 nm C using Leica sputter coater) were acquired using FEI Helios 660 G3 UC FIB/SEM (10 kV, 0.4 nA) equipped with through‐lens (TLD) backscattering detector. The trenches of 15 µm wide and 10 µm deep were cut by operating the focused gallium ion beam at 30 kV and varying the beam currents between 47 nA to 0.79 nA. The subsequent images were acquired using a TLD detector using 10 kV acceleration voltage and 0.4 nA electron beam current.
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